Electric motor analyzer

• US 5,652,526 A
• Filed: 03/15/1996
• Issued: 07/29/1997
• Est. Priority Date: 03/15/1996
• Status: Expired due to Fees

• Current Assignee: Southern California Edison Company (Edison International)
• Original Assignee: Southern California Edison Company (Edison International)
• Inventors: Baker, Tom, Sullivan, Kevin C., Cabison, Manuel R., Lopetrone, Juan P., Kerszenbaum, Isidor
• Primary Examiner(s): Nguyen, Vinh P.
• Assistant Examiner(s): BOWSER, BARRY
• Application Number:
  US08/617,470
• Time in Patent Office: 501 Days
• Field of Search: 324/772, 318/490, 328/510
• US Class Current: 324/765.01
• CPC Class Codes: G01R 31/34 Testing dynamo-electric machines

Abstract

An analyzer for performing high and low voltage tests on an electric induction machine having electric power input terminals. The analyzer comprises: (a) a high voltage testing circuit for performing high voltage tests on the induction machine; (b) a low voltage testing circuit for performing low voltage tests on the induction machine; (c) electrical terminals for electrical connection with the power input terminals of the induction machine; (d) a plurality of switches electrically connecting the high voltage testing circuit and the low voltage testing circuit to the terminals, each switch having one or more control input terminals for receiving control signals for closing and opening the switch; and (e) a controller having a first set of output terminals electrically connected to the control input terminals of the switches, the controller providing control signals to the switches to selectively open one or more of the switches and to selectively close one or more of the switches to: (i) provide electrical conduction paths between the high voltage testing circuit and the induction machine through the closed switches, while electrically isolating the low voltage testing circuit from the high voltage testing circuit through the open switches; and (ii) provide electrical conduction paths between the low voltage testing circuit and the conduction machine through the closed switches, while electrically isolating the high voltage testing circuit from the low voltage testing circuit through the open switches.

Claims

1. An analyzer for performing high and low voltage tests on an electric induction machine having electric power input terminals, the analyzer comprising:

(a) a high voltage testing circuit for performing high voltage tests on the induction machine;

(b) a low voltage testing circuit for performing low voltage tests on the induction machine;

(c) electrical terminals for electrical connection with the power input terminals of the induction machine;

(d) a plurality of switches electrically connecting the high voltage testing circuit and the low voltage testing circuit to the terminals, each switch having one or more control input terminals for receiving control signals for closing and opening the switch; and

(e) a controller having a first set of output terminals electrically connected to the control input terminals of the switches, the controller providing control signals to the switches to selectively open one or more of the switches and to selectively close one or more of the switches to;

(i) provide electrical conduction paths between the high voltage testing circuit and the induction machine through the closed switches, while electrically isolating the low voltage testing circuit from the high voltage testing circuit through the open switches; and

(ii) provide electrical conduction paths between the low voltage testing circuit and the conduction machine through the closed switches, while electrically isolating the high voltage testing circuit from the low voltage testing circuit through the open switches.

2. The analyzer of claim 1 wherein the switches comprise:

(i) one or more high voltage relay switches for providing electrical conduction paths between the high voltage testing circuit and the conduction machine, and (ii) one or more low voltage relay switches for providing electrical conduction paths between the low voltage testing circuit and the conduction machine.

3. The analyzer of claim 1 wherein the high voltage testing circuit generates a test voltage of at least about 500 volts, and the low voltage testing circuit generates a test voltage of at most about 2.5 volts.

4. The analyzer of claim 1 wherein:

(a) the high voltage testing circuit comprises an insulation resistance measurement circuit; and

(b) the low voltage testing circuit comprises a resistance measurement circuit and an impedance measurement circuit.

5. The analyzer of claim 4 wherein:

(a) the insulation resistance measurement circuit supplies a high voltage direct current to the induction machine and measures a resulting leakage current of the induction machine;

(b) the resistance measurement circuit supplies a direct current to the induction machine and measures a resulting voltage to determine the resistance of the induction machine; and

(c) the impedance measurement circuit supplies an alternating current to the induction machine and measures a resulting voltage to determine the impedance of the induction machine.

6. The analyzer of claim 1 wherein:

(a) the low voltage testing circuit includes a switch responsive to control input signals for initiating low voltage tests;

(b) the high voltage testing circuit includes a switch responsive to control input signals for initiating high voltage tests; and

(c) the controller generates;

(i) an input control signal for the low voltage testing circuit to perform low voltage testing after the controller has provided electrical conduction paths between the low voltage testing circuit and the conduction machine; and

(ii) an input control signal for the high voltage testing circuit to perform high voltage testing after the controller has provided electrical conduction paths between the high voltage testing circuit and the induction machine.

7. The analyzer of claim 6 wherein the controller sequentially signals the low and high voltage testing circuits to perform low and high voltage tests, respectively.

8. The analyzer of claim 1 wherein:

(a) the high voltage testing circuit generates test-result output signals representative of results of high voltage testing of the induction machine;

(b) the low voltage testing circuit generates test-result output signals representative of results of low voltage testing of the induction machine; and

(c) the controller includes a processor responsive to the high voltage testing circuit and responsive to the low voltage testing circuit for receiving high and low voltage test-result output signals from said testing circuits, and for processing the signals to generate a report indicative of the status of the induction machine.

9. The analyzer of claim 1 further comprising a housing, wherein the high and the low voltage testing circuits, the switches and the controller are disposed in the housing.

10. An analyzer for performing high and low voltage tests on an electric induction machine having electric power input terminals, the analyzer comprising:

(a) a high voltage testing circuit for performing high voltage tests on the induction machine, the high voltage testing circuit including an insulation resistance measurement circuit;

(b) a low voltage testing circuit for performing low voltage tests on the induction machine, the low voltage testing circuit including a resistance measurement circuit and an impedance measurement circuit;

(c) electrical terminals for electrical connection with the power input terminals of the induction machine;

(d) a plurality of switches electrically connecting the high voltage testing circuit and the low voltage testing circuit to the terminals, each switch having one or more control input terminals for receiving control signals for closing and opening the switch, wherein the switches comprise one or more high voltage relay switches for providing electrical conduction paths between the high voltage testing circuit and the conduction machine, and one or more low voltage relay switches for providing electrical conduction paths between the low voltage testing circuit and the conduction machine; and

(e) a controller having a first set of output terminals electrically connected to the control input terminals of the switches, the controller providing control signals to the switches to selectively open one or more of the switches and to selectively close one or more of the switches to;

(i) provide electrical conduction paths between the high voltage testing circuit and the induction machine through the closed switches, while electrically isolating the low voltage testing circuit from the high voltage testing circuit through the open switches; and

(ii) provide electrical conduction paths between the low voltage testing circuit and the conduction machine through the closed switches, while electrically isolating the high voltage testing circuit from the low voltage testing circuit through the open switches.

11. The analyzer of claim 10 wherein:

(a) the insulation resistance measurement circuit supplies a high voltage direct current to the induction machine and measures a resulting leakage current of the induction machine;

(b) the resistance measurement circuit supplies a direct current to the induction machine and measures a resulting voltage to determine the resistance of the induction machine; and

(c) the impedance measurement circuit supplies an alternating current to the induction machine and measures a resulting voltage to determine the impedance of the induction machine.

12. The analyzer of claim 11 wherein:

(a) the low voltage testing circuit includes a switch responsive to control input signals for initiating low voltage tests;

(b) the high voltage testing circuit includes a switch responsive to control input signals for initiating high voltage tests; and

(c) the controller generates;

(i) an input control signal for the low voltage testing circuit to perform low voltage testing after the controller has provided electrical conduction paths between the low voltage testing circuit and the conduction machine; and

(ii) an input control signal for the high voltage testing circuit to perform high voltage testing after the controller has provided electrical conduction paths between the high voltage testing circuit and the induction machine.

13. The analyzer of claim 12 wherein the controller sequentially signals the low and high voltage testing circuits to perform low and high voltage tests, respectively.

14. The analyzer of claim 13 wherein:

(a) the high voltage testing circuit generates test-result output signals representative of results of high voltage testing of the induction machine;

(b) the low voltage testing circuit generates test-result output signals representative of results of low voltage testing of the induction machine; and

(c) the controller includes a processor responsive to the high voltage testing circuit and responsive to the low voltage testing circuit for receiving high and low voltage test-result output signals from said testing circuits, and for processing the signals to generate a report indicative of the status of the induction machine.

15. The analyzer of claim 14 further comprising a housing, wherein the high and the low voltage testing circuits, the switches and the controller are disposed in the housing.

16. The analyzer of claim 15 wherein the high voltage testing circuit generates a test voltage of at least about 500 volts, and the low voltage testing circuit generates a test voltage of at most about 2.5 volts.

17. A method of performing high and low voltage tests on an electric induction machine having electric power input terminals, the method comprising the steps of:

(a) providing an analyzer comprising;

(i) a high voltage testing circuit for performing high voltage tests on the induction machine;

(ii) a low voltage testing circuit for performing low voltage tests on the induction machine;

(iii) electrical terminals for electrical connection with the power input terminals of the induction machine;

(iv) a plurality of switches electrically connecting the high voltage testing circuit and the low voltage testing circuit to the terminals, each switch having one or more control input terminals for receiving control signals for closing and opening the switch; and

(v) a controller having a first set of output terminals electrically connected to the control input terminals of the switches, the controller providing control signals to the switches to selectively open one or more of the switches and to selectively close one or more of the switches to;

(1) provide electrical conduction paths between the high voltage testing circuit and the induction machine through the closed switches, while electrically isolating the low voltage testing circuit from the high voltage testing circuit through the open switches; and

(2) provide electrical conduction paths between the low voltage testing circuit and the conduction machine through the closed switches, while electrically isolating the high voltage testing circuit from the low voltage testing circuit through the open switches;

(b) electrically connecting the terminals of the analyzer to the power input terminals of the induction machine;

(c) performing high voltage testing on the induction machine utilizing the analyzer; and

(d) performing low voltage testing on the induction machine utilizing the analyzer.

18. The method of claim 17 wherein the high voltage testing circuit generates a test voltage of at least about 500 volts, and the low voltage testing circuit generates a test voltage of at most about 2.5 volts.

19. The method of claim 18 wherein:

(a) the step of performing high voltage testing includes performing an insulation resistance measurement; and

(b) the step of performing low voltage testing includes performing a resistance measurement and an impedance measurement.