Composite structured piezomagnetometer

• US 5,675,252 A
• Filed: 06/19/1995
• Issued: 10/07/1997
• Est. Priority Date: 06/19/1995
• Status: Expired due to Fees

• Current Assignee: SQM Technology, Inc.
• Original Assignee: SQM Technology, Inc.
• Inventors: Podney, Walter N.
• Primary Examiner(s): O'Shea, Sandra L.
• Assistant Examiner(s): Patidar, Jay M.
• Application Number:
  US08/491,392
• Time in Patent Office: 841 Days
• Field of Search: 324/244, 324/209, 324/207.11-207.14, 324/207.22-207.26, 324/244.1, 324/260, 310/323, 310/311, 310/364, 310/328, 310/321, 310/333, 73/DIG. 2, 73/862.69, 73/862.68, 73/779
• US Class Current: 324/244
• CPC Class Codes: G01R 33/02 Measuring direction or magnitude of magnetic fields or magnetic flux G01R33/20 takes precedence

Abstract

A piezomagnetometer uses a magnetoelectric composite structure, formed by alternating layers of piezoelectric and magnetostrictive material, to convert a fluctuating magnetic field directly to electric current. Strain in the magnetostrictive layers, coming from an ambient magnetic field, stresses piezoelectric layers and drives a polarization current proportional to amplitude of the ambient field. Electrically, the composite is a current source connected in parallel with a capacitor. Its simple and direct operation and solid state sensor enables constructing a small, rugged, inexpensive magnetometer that operates at an ambient temperature with high sensitivity at low power. Multiple piezomagnetometers can be incorporated into a practical detection system capable of operating at ambient temperatures and meeting the limitations presented in civilian and military operations.

Claims

1. A magnetic and electric field sensor and measurement apparatus comprising a composite structure having alternatingly secured plural piezoelectric material layers and magnetostrictive material layers, magnets positioned adjacent to the composite structure for supplying a bias field to the composite structure, and a measurement circuit connected to the piezoelectric layers for measuring output of the piezoelectric layers in the composite structure.

2. The apparatus of claim 1, further comprising signal conditioning electronics connected to the composite structure.

3. The apparatus of claim 2, wherein the signal conditioning electronics includes interconnected low pass filters, thermometers and temperature compensation circuits.

4. The apparatus of claim 1, wherein the magnetostrictive layers are of METGLAS and the piezoelectric layers are of PZT.

5. The apparatus of claim 1, wherein the magnetostrictive layers are of METGLAS and the piezoelectric layers are of quartz.

6. The apparatus of claim 1, wherein the magnetostrictive layers are of nickel and the piezoelectric layers are of PZT.

7. The apparatus of claim 1, wherein the magnetostrictive layers are of nickel and the piezoelectric layers are of quartz.

8. The apparatus of claim 1, wherein the magnetostrictive layers are of TERFENOL-D and the piezoelectric layers are of PZT.

9. The apparatus of claim 1, wherein the magnetostrictive layers are of TERFENOL-D and the piezoelectric layers are of quartz.

10. The apparatus of claim 1, wherein the magnets are made of samarium-cobalt.

11. The apparatus of claim 1, wherein the composite structure has 201 alternating layers of piezoelectric and magnetostrictive material, the structure having 100 piezoelectric layers and 101 magnetostrictive layers.

12. The apparatus of claim 11, wherein the piezoelectric material is PZT and the magnetostrictive material is TERFENOL-D.

13. The apparatus of claim 12, wherein the piezoelectric PZT layers are each 254 μ

m thick and the magnetostrictive TERFENOL-D layers are each 635 μ

m thick.

14. The apparatus of claim 11, wherein the piezoelectric material is PZT and the magnetostrictive material is METGLAS.

15. The apparatus of claim 14, wherein the piezoelectric PZT layers are each 254 μ

m thick and the magnetostrictive METGLAS layers are each 25 μ

m thick.

16. A magnetic and electric field sensor and measurement apparatus comprising multiple composite structures, each composite structure having alternatingly secured piezoelectric material layers and magnetostrictive material layers, and a measurement circuit connected to the piezoelectric layers for measuring output of the piezoelectric layers in the composite structures.

17. The apparatus of claim 16, further comprising magnets positioned adjacent to the composite structures for supplying a bias field to the composite structures.

18. The apparatus of claim 16, wherein sensor comprises four adjacently secured composite structures.

19. The apparatus of claim 18, wherein each composite structure comprises 51 alternating piezoelectric and magnetostrictive layers, 25 of which are piezoelectric layers.

20. The apparatus of claim 16, wherein the piezoelectric layer is made of a material selected from the group consisting of quartz and PZT.

21. The apparatus of claim 16, wherein the magnetostrictive layer is made of a material selected from the group consisting of nickel, TERFENOL-D and METGLAS.

22. A method for sensing and measuring magnetic and electric fields comprising the steps of straining plural magnetostrictive layers by a applying magnetic field thereby stressing and polarizing alternately placed plural piezoelectric layers for generating a current across the layers, and measuring the current by a detector.