Device to enhance imaging resolution

• US 5,712,685 A
• Filed: 08/14/1995
• Issued: 01/27/1998
• Est. Priority Date: 11/14/1994
• Status: Expired due to Fees

• Current Assignee: Her Majesty The Queen As Represented By The Minister of National Defence of Her Majesty's Canadian Government
• Original Assignee: Her Majesty The Queen As Represented By The Minister of National Defence of Her Majesty's Canadian Government
• Inventors: Dumas, Jean
• Primary Examiner(s): Faile, Andrew
• Assistant Examiner(s): MOE, AUNG SOE
• Application Number:
  US08/515,069
• Time in Patent Office: 897 Days
• Field of Search: 348/241, 348/250, 348/360, 348/219, 348/294, 348/263, 358/457
• US Class Current: 348/360
• CPC Class Codes: H04N 25/48 Increasing resolution by shifting the sensor relative to the scene

Abstract

An imaging device comprising a Focal Plane Array (FPA) image sensor having a grid formed of individual detector elements, arranged in an array of columns and rows, and a mask with a checkerboard pattern of opaque and transparent areas, the mask being located in front of and adjacent to the FPA onto which an image of a scene can be focused by an optical system. The imaging device displaces the mask and FPA with respect to each other in a number of micro-steps that extend in the same direction as that in which a column and a row of the grid extends. The micro-steps in any one direction are of equal lengths which are each a fraction of the length of a detector element. Opaque areas of the mask will then progressively cover equal areas of detector elements in discrete steps for each micro-step movement in one direction at the same time as transparent areas of the mask progressively uncover equal areas of other detector elements for each discrete step. Outputs from the detector elements provide signals for sample slices of the scene for each micro-step and the device reconstructs an image of the scene form those signals. This arrangement allows an enhanced image to be obtained for the scene from the sample slices compared to the image which is obtainable directly from a FPA image sensor or previous types of microscanning arrangements.

Claims

1. An imaging device comprising a Focal Plane Array (FPA) image sensor having a grid formed of individual detector elements, arranged in an array of columns and rows, and a mask with a checkerboard pattern of opaque and transparent areas, the mask being located in front of and adjacent to the FPA onto which an image of a scene can be focused by an optical system wherein means are provided for displacing the mask and FPA with respect to each other in a number of micro-steps that extend in the same direction as that in which a column of the grid extends and means are provided for displacing the mask and the FPA with respect to each other in a number of micro-steps that extend in the same direction as that in which a row of the grid extends, the micro-steps in any one direction being of equal lengths that are smaller than the length of a detector element whereby opaque areas of the mask progressively cover equal areas of detector elements in discrete steps for each micro-step movement in one direction at the same time as transparent areas of the mask progressively uncover equal areas of other detector elements for each discrete step, outputs from the detector elements providing signals for sample slices of the scene for each micro-step with the device having means for reconstructing an image of the scene from said signals.

2. An imaging device as defined in claim 1, wherein the mask is an optically transparent substrate onto which a deposited material forms the opaque areas.

3. An imaging device as defined in claim 2, wherein the opaque and transparent areas of the mask are squares having the same size as the individual detector elements and the mask covers the entire surface of the FPA.

4. An imaging device as defined in claim 3, wherein the length of a detector element in any one direction is a multiple of the length of a micro-step in that direction.

5. An imaging device as defined in claim 4, wherein the means provided for displacing the mask and FPA with respect to each other are piezoelectric elements connected to edges of the substrate.

6. An imaging device as defined in claim 5, wherein the means provided for displacing the mask and FPA with respect to each other have means to displace the mask in a number of micro-steps in a first direction, a means to displace the mask an equal number of micro-steps in a second direction perpendicular to the first direction, a means to displace the mask an equal number of micro-steps in a direction opposite to the first direction and a means to displace the mask an equal number of micro-steps in a direction opposite to the second direction, each micro-step displacement being of equal lengths.

7. An imaging device as defined in claim 1, wherein the opaque and transparent areas of the mask are squares having the same size as the individual detector elements and the mask covers the entire surface of the FPA.

8. An imaging device as defined in claim 7, wherein the length of a detector element in any one direction is a multiple of the length of a micro-step in that direction.

9. An imaging device as defined in claim 8, wherein the mask is an optically transparent substrate onto which a deposited material forms the opaque areas.

10. An imaging device as defined in claim 9, wherein the means provided for displacing the mask and FPA with respect to each other have means to displace the mask in a number of micro-steps in a first direction, a means to displace the mask an equal number of micro-steps in a second direction perpendicular to the first direction, a means to displace the mask an equal number of micro-steps in a direction opposite to the first direction and a means to displace the mask an equal number of micro-steps in a direction opposite to the second direction, each micro-step displacement being of equal lengths.

11. An imaging device as defined in claim 10, wherein the number of micro-steps the mask is moved in any one direction has a total length equal to the length of a detector element in that direction.

12. An imaging device as defined in claim 1, wherein the means provided for displacing the mask and FPA with respect to each other have means to displace the mask in a number of micro-steps in a first direction, a means to displace the mask an equal number of micro-steps in a second direction perpendicular to the first direction, a means to displace the mask an equal number of micro-steps in a direction opposite to the first direction and a means to displace the mask an equal number of micro-steps in a direction opposite to the second direction, each micro-step displacement being of equal lengths.

13. An imaging device as defined in claim 12, wherein the length of a detector element in any one direction is a multiple of the length of a micro-step in that direction.

14. An imaging device as defined in claim 13, wherein the mask is an optically transparent substrate onto which a deposited material forms the opaque areas.

15. An imaging device as defined in claim 2, wherein the deposited material is a high energy diffusion material that readily absorbs and diffuses electromagnetic radiation.

16. An imaging device as defined in claim 9, wherein the deposited material is a high energy diffusion material that readily absorbs and diffuses electromagnetic radiation.

17. An imaging device as defined in claim 14, wherein the deposited material is a high energy diffusion material that readily absorbs and diffuses electromagnetic radiation.

18. An imaging device as defined in claim 14, wherein the number of micro-steps the mask is moved in any one direction has a total length equal to the length of a detector element in that direction.