Ultrashort pulse high repetition rate laser system for biological tissue processing

• US 5,720,894 A
• Filed: 01/11/1996
• Issued: 02/24/1998
• Est. Priority Date: 01/11/1996
• Status: Expired due to Term

• Current Assignee: Lawrence Livermore National Security LLC (Government of the United States of America)
• Original Assignee: Regents of the University of California (University of California)
• Inventors: Rubenchik, Alexander M., Feit, Michael D., Perry, Michael D., Stuart, Brent C., Glinsky, Michael E., Matthews, Dennis L., Da Silva, Luiz B., Neev, Joseph
• Primary Examiner(s): POWELL, WILLIAM A
• Application Number:
  US08/584,522
• Time in Patent Office: 775 Days
• Field of Search: 156/626.1, 156/643.1, 156/345 MT, 156/345 P, 156/345 LT, 219/121.68, 219/121.69, 216/65, 216/67, 606/11, 606/12, 607/89
• US Class Current: 216/65
• CPC Class Codes: A61B 18/20 using laser
• CPC Class Codes: A61B 18/26 for producing a shock wave, e.g. laser lithotripsy
• CPC Class Codes: A61B 2018/00636 Sensing and controlling the application of energy
• CPC Class Codes: A61C 1/0046 Dental lasers surgical lasers A61B18/20; working by laser beam in general B23K26/00; lasers per se H01S3/00
• CPC Class Codes: B23K 2103/05 Stainless steel
• CPC Class Codes: B23K 2103/10 Aluminium or alloys thereof
• CPC Class Codes: B23K 2103/30 Organic material
• CPC Class Codes: B23K 2103/50 Inorganic material, e.g. metals, not provided for in B23K2103/02 – B23K2103/26
• CPC Class Codes: B23K 26/032 using optical means
• CPC Class Codes: B23K 26/0624 using ultrashort pulses, i.e. pulses of 1ns or less
• CPC Class Codes: B23K 26/0643 comprising mirrors
• CPC Class Codes: B23K 26/0648 comprising lenses
• CPC Class Codes: B23K 26/0665 by beam condensation on the workpiece, e.g. for focusing
• CPC Class Codes: B23K 26/18 using absorbing layers on the workpiece, e.g. for marking or protecting purposes
• CPC Class Codes: B23K 26/40 taking account of the properties of the material involved
• CPC Class Codes: C06B 21/0033 Shaping the mixture

Abstract

A method and apparatus is disclosed for fast, efficient, precise and damage-free biological tissue removal using an ultrashort pulse duration laser system operating at high pulse repetition rates. The duration of each laser pulse is on the order of about 1 fs to less than 50 ps such that energy deposition is localized in a small depth and occurs before significant hydrodynamic motion and thermal conduction, leading to collateral damage, can take place. The depth of material removed per pulse is on the order of about 1 micrometer, and the minimal thermal and mechanical effects associated with this ablation method allows for high repetition rate operation, in the region 10 to over 1000 Hertz, which, in turn, achieves high material removal rates. The input laser energy per ablated volume of tissue is small, and the energy density required to ablate material decreases with decreasing pulse width. The ablation threshold and ablation rate are only weakly dependent on tissue type and condition, allowing for maximum flexibility of use in various biological tissue removal applications. The use of a chirped-pulse amplified Titanium-doped sapphire laser is disclosed as the source in one embodiment.

Claims

1. A method for selective material removal processing comprising:

providing a pulsed laser;

operating said laser so as to produce a pulsed output beam, the beam comprising individual pulses each having a pulse duration in the range of from about 1 femtosecond to about 100 picoseconds;

directing said pulsed output beam onto a target material from which removal is desired, wherein each pulse interacts with a thin layer portion of said material so as to form a plasma;

allowing said formed plasma to decay, such that said material portion is removed; and

repeating said plasma formation step at a pulse repetition rate greater than 10 pulses per second until a sufficient depth of material has been removed with substantially no transfer of thermal or mechanical energy into the remaining material and substantially no collateral damage thereto.

2. The method of claim 1, the target material having a characteristic electron-phonon energy transfer time and the individual pulses each having durations less than said characteristic transfer time such that negligible thermal energy is transferred into the target material.

3. The method of claim 2, wherein said plasma is formed by ionization selected from the group consisting of collisional ionization and multiphoton ionization.

4. The method of claim 1, wherein said pulsed laser produces a pulsed output beam having, a wavelength in the range of from 200 to 2500 nanometers.

5. The method of claim 4, wherein said pulsed output beam has a wavelength in the visible portion of the electromagnetic spectrum.

6. The method of claim 4, wherein said pulsed laser produces a pulsed output beam having a wavelength in the ultraviolet portion of the electromagnetic spectrum.

7. The method of claim 4, wherein said pulsed laser produces a pulsed output beam having a wavelength in the infrared portion of the electromagnetic spectrum.

8. The method of claim 3, wherein said pulsed laser is a chirped-pulse amplified solid state laser.

9. The method of claim 3, wherein each pulse of said pulsed output beam has an energy in the range of from about 0.01 to about 50 millijoules, said pulsed beam having a diameter at the material target such that said tissue experiences an energy fluence in the range of from about 0.3 to about 15 Joules per square centimeter.

10. The method of claim 9, wherein said pulsed beam exhibits a material removal rate in the range of from about 0.01 to about 2 micrometers per pulse, said removal rate being substantially constant without regard to material chromophore, material hardness or material state.

11. A laser system adapted for selective material removal processing, the system comprising:

a laser operative so as to produce a pulsed output beam, the beam comprising individual pulses each pulse having a pulse duration in the range of from about 1 femtosecond to about 100 picoseconds, the pulses being provided by the beam at a pulse repetition rate of greater than about 10 pulses per second; and

means for directing the pulsed output beam onto a target material from which removal is desired, wherein each pulse interacts with a thin layer portion of said material so as to form a plasma, each successive pulse forming an additional plasma until a sufficient amount of material has been removed with substantially no transfer of thermal or mechanical energy into the remaining material and substantially no collateral damage thereto.

12. The laser system of claim 11, wherein said plasma is formed by ionization selected from the group consisting of collisional ionization and multiphoton ionization.

13. The laser system of claim 11, wherein each pulse of said pulsed output beam has an energy in the range of from about 0.01 to about 50 millijoules, said pulsed beam having a diameter at the material target such that said material experiences an energy fluence in the range of from about 0.3 to about 15 Joules per square centimeter.

14. The laser system of claim 13, wherein said pulsed beam exhibits a material removal rate in the range of from about 0.01 to about 2 micrometers per pulse, said removal rate being substantially constant without regard, material chromophore, material hardness or material state.

15. The laser system of claim 14, wherein said pulsed laser is a chirped-pulse amplified solid state laser.

16. The laser system of claim 14, wherein said output beam has a wavelength in the range of 200 to 2500 nanometers.

17. The laser system of claim 11, further comprising feedback means for analyzing a material characteristic in response to interaction between said laser pulses and said target material.

18. The laser system of claim 17, wherein said feedback means further comprises a spectrograph, the feedback means spectrographically evaluating said plasma formed by each pulse, said material characteristic represented by particular ones of characteristic peaks comprising the plasma spectrum, feedback means further for providing a control signal in response to a change in particular ones of said characteristic peaks.

19. The laser system of claim 18, the feedback means operatively coupled to the laser, the laser operatively responsive to said control signal such that the laser ceases operation upon receipt of the control signal.

20. The laser system of claim 17, wherein said feedback means comprises an optical tomograph, the feedback means optically evaluating the amount of target material removed by each pulse, said material characteristic represented by a depth material removed, feedback means further for providing a control signal in operative response to said depth.

21. The laser system of claim 20, the feedback means operatively coupled to the laser, the laser operatively responsive to said control signal such that the laser ceases operation upon receipt of the control signal.