Ellipse-like curve recognition by calculation of distances of points on the curve from FOCI
First Claim
1. A pattern recognition method of recognizing an input pattern of a plane curve traced by an input device as an elliptic pattern, comprising the steps of:
- calculating coordinates of points on said input pattern as a coordinate sequence;
calculating, by using said coordinate sequence, elliptic parameters including focus coordinates of foci of an ellipse;
calculating, by using said coordinate sequence and said focus coordinates, a sum of distances between each of said points and said foci;
subjecting said sum of distances to an algebraic calculation to calculate results of said algebraic calculation; and
evaluating an irregular distribution of said results as a similarity measure which said input pattern has relative to a geometric ellipse.
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Abstract
After calculation of coordinates of points on a plane curve, a pattern recognition device calculates (S3) coordinates of foci and a major axis of a candidate ellipse and, (S4) until all points are used, (S5) a sum of distances between said point and the foci. After calculation of (S6) of the sum to the major axis, (S7) a variance of such ratios is calculated to judge (S8) whether or not the plane curve is a geometric ellipse. A mean value may be substituted for the variance. The variance may be calculated as regards sums calculated for all points. Preferably, the foci and the major axis are calculated by calculating (S1) an inscribed and subsequently (S2) a circumscribed rectangle. In this event, the candidate ellipse is inscribed in the circumscribed rectangle.
121 Citations
33 Claims
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1. A pattern recognition method of recognizing an input pattern of a plane curve traced by an input device as an elliptic pattern, comprising the steps of:
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calculating coordinates of points on said input pattern as a coordinate sequence; calculating, by using said coordinate sequence, elliptic parameters including focus coordinates of foci of an ellipse; calculating, by using said coordinate sequence and said focus coordinates, a sum of distances between each of said points and said foci; subjecting said sum of distances to an algebraic calculation to calculate results of said algebraic calculation; and evaluating an irregular distribution of said results as a similarity measure which said input pattern has relative to a geometric ellipse. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. A pattern recognition device for recognizing an input pattern of a plane curve traced by an input device as an elliptic pattern, comprising:
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means for calculating coordinates of points on said input pattern as a coordinate sequence; means for using said coordinate sequence in calculating elliptic parameters including focus coordinates of foci of an ellipse; means for using said coordinate sequence and said focus coordinates in calculating a sum of distances between each of said points and said foci; means for subjecting said sum of distances to an algebraic calculation to calculate results of said algebraic calculation; and means for evaluating an irregular distribution of said results as a similarity measure of said input pattern relative to a geometric ellipse. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32)
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33. A programmed processor configured to perform pattern recognition of a traced input pattern of a plane curve as an elliptic pattern, comprising the steps of:
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(a) calculating coordinates of points on said input pattern as a coordinate sequence; (b) calculating elliptic parameters including focus coordinates and a major axis by using said coordinate sequence; (c) calculating a sum of distances between one of said points on said traced input pattern and each of said focus coordinates by using said coordinate sequence and said focus coordinates; (c) calculating a ratio of the sum of distances to the major axis; (d) returning to step (c) until all of said points on said traced input pattern have been used as said one of said points on said traced input pattern; (e) calculating a variance of said ratios; and (f) using said variance to perform pattern recognition of said elliptic pattern.
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Specification