Method and apparatus for measuring localized temperatures and voltages on integrated circuits
First Claim
1. A method for measuring an operating temperature of a region of a programmable logic device, wherein the programmable logic device is configurable using configurable elements to provide specified logic functions, the method comprising:
- configuring a set of the configurable elements in the region of the programmable logic device to include a temperature-sensing circuit and a circuit of interest, the temperature-sensing circuit having a characteristic that varies with temperature according to a known relationship;
measuring the characteristic of the temperature-sensing circuit; and
determining the temperature of the region, and therefore of the circuit of interest, based on the measured characteristic and the known relationship.
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Abstract
A method is described for measuring localized operating temperatures and voltages on an integrated circuit. The integrated circuit includes an oscillator circuit with a frequency that varies with temperature and/or applied voltage. The frequency of the oscillator is then determined, using a constant voltage, for a number of temperatures to establish a known relationship between oscillation frequency and temperature. Once the relationship is known, a similar oscillator is included within or adjacent a second circuit of the integrated circuit. The operating temperature or operating voltage of the second circuit may then be determined by monitoring the frequency of the oscillator while the second circuit is operational.
30 Citations
11 Claims
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1. A method for measuring an operating temperature of a region of a programmable logic device, wherein the programmable logic device is configurable using configurable elements to provide specified logic functions, the method comprising:
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configuring a set of the configurable elements in the region of the programmable logic device to include a temperature-sensing circuit and a circuit of interest, the temperature-sensing circuit having a characteristic that varies with temperature according to a known relationship; measuring the characteristic of the temperature-sensing circuit; and determining the temperature of the region, and therefore of the circuit of interest, based on the measured characteristic and the known relationship. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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Specification