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Method and apparatus for determining analytical data concerning the inside of a scattering matrix

  • US 5,825,488 A
  • Filed: 11/08/1996
  • Issued: 10/20/1998
  • Est. Priority Date: 11/18/1995
  • Status: Expired due to Term
First Claim
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1. A method for determining analytical data regarding a light scattering matrix, said method comprising the steps of:

  • detecting secondary light by irradiating light into the scattering matrix as primary light at an irradiation site through an interface bounding the scattering matrix, and detecting light emerging out of the scattering matrix through the interface, said emerging light being detected as secondary light at a detection site which is located at a predetermined measuring distance from the irradiation site;

    determining a measurement value of a measurable physical property of the secondary light, said measurable physical property varying due to an interaction of the primary light with the scattering matrix;

    evaluating the measurement value as a measure of the analytical data to be determined, the analytical data being determined based upon a measurement value of the measurement variable,wherein at least two of said detecting steps are carried out under different reflection conditions at the interface between the irradiation site and the detection site, and measurement values determined in said at least two detection steps are evaluated in said evaluation step to determine said analytical data.

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