Hierarchial power network simulation and analysis tool for reliability testing of deep submicron IC designs

• US 5,878,053 A
• Filed: 06/09/1997
• Issued: 03/02/1999
• Est. Priority Date: 06/09/1997
• Status: Expired due to Term

• Current Assignee: Synopsys Incorporated
• Original Assignee: Synopsys Incorporated
• Inventors: Ju, Chiping, Song, Hurley H., Tuan, Jeh-Fu, Young, Tak K., Koh, Han Young
• Primary Examiner(s): Canney, Vincent P.
• Application Number:
  US08/871,086
• Time in Patent Office: 631 Days
• Field of Search: 371/22.1, 371/22.5, 371/22.6, 371/24, 371/25.1, 371/27.5, 371/28, 365/201, 395/183.13, 395/183.16
• US Class Current: 714/724
• CPC Class Codes: G06F 30/367 Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods

Abstract

The present invention pertains to a method for analyzing a semiconductor chip design for determining potential voltage drop and electromigration problems. Initially, the semiconductor chip design is divided into a plurality of blocks. A block level verification is then performed based on the assumption that full voltage is being supplied to each of the blocks. Next, the blocks are modeled by an equivalent RC network. This RC network is then reduced into a simpler representation. The voltage drops are determined based on the reduced, equivalent model. The blocks are then reanalyzed with the supply voltage input to the blocks reduced according to the calculated voltage drops. Thereby, a more realistic simulation can be achieved.

Claims

1. A method for analyzing a semiconductor chip design, comprising the steps of:

dividing the semiconductor chip design into a plurality of blocks;

performing a block level verification based on an assumption that full voltage is being supplied to the blocks;

modeling the blocks according to a resistor and capacitor network;

simplifying the resistor and capacitor network into an equivalent circuit;

determining voltage drops corresponding to the equivalent circuit;

analyzing the blocks with the voltage being supplied to the blocks reduced according to the determined voltage drops.

2. The method of claim 1, further comprising the steps of:

identifying probe points corresponding to locations where power is supplied to the blocks;

obtaining test vectors;

driving the blocks according to the test vectors;

capturing currents flowing through the probe points.

3. The method of claim 1, further comprising the step of generating current waveforms as a function of time for one of the blocks.

4. The method of claim 1, further comprising the steps of:

extracting the resistor and capacitor network;

performing serial and parallel reductions to the resistor and capacitor network.

5. The method of claim 1, further comprising the steps of:

calculating peak voltages at a plurality of nodes and average currents flowing through a plurality of wires;

storing the peak voltages and average currents.

6. The method of claim 1 further comprising the step of performing a top level simulation by:

accessing a file corresponding to the semiconductor chip;

identifying transistors of a top level transistor netlist;

assigning voltage vectors to drive the transistors;

performing voltage drop and current density analysis;

resolving top level issues.

7. The method of claim 1 further comprising the step of determining whether the voltage drops result in any violations.

8. The method of claim 1 further comprising the step of expanding one of the blocks to a transistor level, wherein some of the blocks are analyzed at a top level and some blocks are analyzed at the transistor level.

9. A computer-readable medium having stored thereon instructions for causing a computer to implement computer-controlled reliability analysis of a semiconductor chip design, comprising the steps of:

performing a block level verification, wherein the semiconductor chip design is divided into a plurality of blocks and a full voltage supply is assumed to be input to each power connection point corresponding to the blocks;

modeling the blocks by equivalent RC networks;

performing a simulation on the modeled blocks to determine voltage drops and current values;

analyzing the blocks according to the voltage drops and current values to determine whether there are any performance problems with the chip design.

10. The computer-readable medium of claim 9, wherein the block level verification is comprised of the steps of:

identifying all blocks which are to be modeled;

arranging the blocks to be in subdirectories of a circuit directory;

for each block;

ensuring that a layout of the block matches that of a schematic representation;

obtaining vectors to drive the block;

generating a probe point for a power connection point corresponding to the block;

extracting an RC network corresponding to the block;

simulating a voltage drop for the RC network;

storing a current passing through the power connection point.

11. The computer-readable medium of claim 9, wherein the block level verification is comprised of the steps of:

calculating a peak voltage for a node of the block;

calculating an average current flowing through a branch of the block;

storing the peak voltage and the average current.

12. The computer-readable medium of claim 9, wherein the instructions include the step of reducing the RC network.

13. The computer-readable medium of claim 9, wherein the simulation is comprised of the steps of:

assigning probe points for power connection points corresponding to the blocks;

performing RC extraction;

preparing a power netlist;

performing a top level simulation, wherein a current waveform is applied to the power connection points of the blocks.

14. The computer-readable medium of claim 9, wherein the analyzing step is comprised of the steps of:

applying a recorded voltage drop to a power supply connection point;

simulating the RC network for the voltage drop;

applying a recorded current to the power supply connection point;

simulating the RC network for current density;

determining whether there are any violations, wherein the design or netlist is changed by the user in response to any violations.

15. The computer-readable medium of claim 14 further comprising the step of expanding one of the blocks to a transistor level and performing the simulation.

16. A computer system for implementing computer-controlled reliability analysis of a semiconductor chip design, comprising:

a memory for storing a netlist and a layout corresponding to a schematic of the semiconductor chip;

a processor coupled to the memory for performing a block level verification, wherein the layout is divided into a plurality of blocks and a full voltage supply is assumed to be input to each power connection point corresponding to the blocks, the processor models the blocks by equivalent RC networks and performs a simulation on the modeled blocks to determine voltage drops and current values, wherein the blocks are analyzed according to the voltage drops and current values to determine whether there are any violations with the chip design;

a display coupled to the processor for displaying the violations.

17. The computer system of claim 16, wherein the block level verification obtain vectors for driving the blocks, generates a probe point for a power connection point corresponding to the block, extracts an RC network corresponding to the block simulates a voltage drop for the RC network, and stores a current passing through the power connection point to the memory.

18. The computer system of claim 16, wherein the processor further calculates a peak voltage of a node and an average current of a branch for storage in the memory.

19. The computer system of claim 16, wherein the processor reduces the RC networks and applies a current waveform to the power connection points of the blocks.

20. The computer system of claim 16, wherein the processor applies a recorded voltage drop to a power supply connection point and simulates the RC network for the voltage drop.

21. The computer system of claim 20, wherein the processor applies a recorded current to the power supply connection point and simulates the RC network for current density to determine whether there are any violations.

22. The computer system of claim 16, wherein the processor expands one of the blocks to a transistor level before performing the simulation.