Micromechanical inertial sensor

• US 5,920,012 A
• Filed: 06/16/1998
• Issued: 07/06/1999
• Est. Priority Date: 06/16/1998
• Status: Expired due to Term

• Current Assignee: Honeywell Incorporated (Honeywell International Inc.)
• Original Assignee: Boeing North American Incorporated (The Boeing Co.)
• Inventors: Pinson, John Carver
• Primary Examiner(s): Williams, Hezron
• Assistant Examiner(s): Kwok, Helen C.
• Application Number:
  US09/097,766
• Time in Patent Office: 385 Days
• Field of Search: 73/504.02, 73/504.03, 73/504.04, 73/504.12, 73/504.14, 73/504.15, 73/514.16, 73/514.29, 73/514.24, 73/514.32 , 73/514.36, 73/514.38
• US Class Current: 73/504.12
• CPC Class Codes: G01C 19/5719 using planar vibrating masses driven in a translation vibration along an axis
• CPC Class Codes: G01R 33/0286 comprising microelectromechanical systems [MEMS] MEMS devices in general B81B

Abstract

A micromechanical inertial sensor includes a pair of proof masses suspended between a pair of fixed structures by beams attached between the ends of the proof masses and the fixed structures, such that the proof masses extend lengthwise along a first axis direction and are able to vibrate back and forth along a second axis substantially orthogonal to the first axis. Each beam attached to the proof masses has increased compliance in the first axis direction, relative to a linear beam of equivalent cross section, such that the beams have reduced resistance to stretching in the first axis direction as the proof masses vibrate in the second axis direction. In one embodiment of the invention, each beam is bowed or curved. Alternatively, compliance of the beam is increased by providing strain relief at one or both ends of the beam, or by providing an extensible portion in each beam.

Claims

1. A micromechanical inertial sensor comprising:

a substrate supporting a pair of spaced-apart fixed structures;

a proof mass disposed between the fixed structures and oriented lengthwise along a first axis which extends between the fixed structures, the proof mass being adapted to vibrate along a second axis substantially orthogonal to the first axis and being movable along a third axis substantially orthogonal to the first and second axes;

a sensor system adapted to detect position of the proof mass and provide a signal varying with movement of the proof mass along the third axis; and

a beam connected between each end of the proof mass and an adjacent one of the fixed structures, the beams suspending the proof mass above the substrate such that the proof mass is movable along the third axis, the beams being adapted to bend to permit vibration of the proof mass along the second axis, each beam being bowed over at least a portion of the length thereof so as to make the beam compliant in the direction of the first axis.

2. The micromechanical inertial sensor of claim 1 wherein each end of the proof mass is suspended from the adjacent fixed structure by a pair of beams spaced apart in the direction of the second axis, each beam being bowed.

3. The micromechanical inertial sensor of claim 2 wherein each beam is bowed in a plane which is parallel to the first axis.

4. The micromechanical inertial sensor of claim 3 wherein the beams are coplanar with the proof mass.

5. The micromechanical inertial sensor of claim 2, further comprising a second proof mass suspended between the fixed structures by a pair of bowed beams attached to each end of the second proof mass, the proof masses being spaced apart in the direction of the second axis.

6. The micromechanical inertial sensor of claim 5 wherein the fixed structures comprise a pair of cross-pieces which extend parallel to the second axis.

7. The micromechanical inertial sensor of claim 6 wherein the beams and the cross-pieces are substantially coplanar.

8. The micromechanical inertial sensor of claim 6 wherein the cross-pieces are affixed to the substrate at portions of the cross-pieces located between the beams of each pair of beams.

9. A method of reducing dependence of the apparent resonant frequency of a proof mass of a micromechanical inertial sensor on drive amplitude of the proof mass, comprising the steps of:

disposing the proof mass between a pair of spaced-apart fixed structures with a lengthwise dimension of the proof mass oriented along a first axis which extends between the fixed structures;

suspending the proof mass between the fixed structures by beams connected between each end of the proof mass and an adjacent one of the fixed structures, such that the proof mass can be forced to vibrate back-and-forth along a second axis substantially orthogonal to the first axis, and such that the proof mass is movable along a third axis which is substantially orthogonal to the first and second axes; and

configuring the beams such that at least a portion of each beam is bowed so as to make the beam compliant in a direction parallel to the first axis.

10. The method of claim 9 wherein the configuring step comprises configuring each beam such that the beam is bowed over substantially the entire length thereof.

11. The method of claim 9 wherein the suspending step comprises suspending the proof mass by a first pair of beams attached between one of the fixed structures and one end of the proof mass and a second pair of beams attached between the other fixed structure and the other end of the proof mass, and wherein the configuring step comprises configuring each beam such that the beam is bowed over substantially the entire length thereof.

12. The method of claim 11 wherein the configuring step further comprises bowing the beams of each beam pair in opposite directions.