Bist architecture for measurement of integrated circuit delays

• US 5,923,676 A
• Filed: 12/20/1996
• Issued: 07/13/1999
• Est. Priority Date: 12/20/1996
• Status: Expired due to Fees

• Current Assignee: Logicvision, Inc. (Siemens AG)
• Original Assignee: Logic Visions Incorporated
• Inventors: Sunter, Stephen K., Nadeau-Dostie, Benoit
• Primary Examiner(s): CHUNG, PHUNG M
• Application Number:
  US08/771,302
• Time in Patent Office: 935 Days
• Field of Search: 371/22.5, 371/22.1, 371/25.1, 371/27, 371/28, 364/470, 365/227, 365/189.09
• US Class Current: 714/733
• CPC Class Codes: G01R 31/31858 Delay testing

Abstract

A built-in self-test (BIST) method and apparatus for digital integrated circuits (ICs) and for systems including multiple ICs, measures signal propagation delays in combinational and sequential logic, set-up and hold times, and tri-state enable/disable times, from any circuit node to any other circuit node including pin-to-pin and from one IC to another. The IC under test is provided with two test bus conductors passing near every circuit node of interest and connected thereto by switches or buffers. During test, an oscillator is created including the test bus, a constant delay, counters, and a delay path of interest or a reference path. The delay path of interest may include e.g. an analog filter. The oscillation period of the oscillator when the reference path is selected is subtracted from the oscillation period when the oscillator includes a delay path of interest. A circuit automatically accommodates inverting and non-inverting paths. A delay copier copies the delay between any two signal events, without injecting any test signal into the circuit under test (e.g. on-line test), and the delay copy can be measured by selecting it in the oscillator.

Claims

1. An integrated circuit including:

a plurality of circuit elements and interconnecting signal-carrying conductors;

a test bus including two test bus conductors;

a plurality of switches associated with each signal-carrying conductor, the switches selectably connecting the signal-carrying conductor to either or both of the two test bus conductors;

wherein at least two of the switches are enabled such that an oscillation circuit is formed including, in series;

one of the test bus conductors;

one of the switches;

one of;

(a) a selected path of interest through the circuit elements;

(b) a circuit which has a delay proportional to the delay through the selected path of interest; and

(c) a reference delay path having a known delay;

another of the switches;

another of the test bus conductors; and

a path with constant delay which is selectably connected between the two test bus conductors.

2. The integrated circuit of claim 1, further comprising means for calculating a difference between a delay of the selected path of interest and a delay of the reference delay path, by subtracting an oscillation period when the oscillation circuit contains the reference delay path from an oscillation period when the oscillation circuit contains one of the selected path of interest and the proportional delay.

3. The integrated circuit of claim 1, further comprising a counter connected to a node in the oscillation circuit.

4. The integrated circuit of claim 1, further comprising means for selecting the constant delay path to be inverting or non-inverting.

5. The integrated circuit of claim 1, wherein the reference delay path includes a tri-state buffer connected directly between the two test bus conductors.

6. The integrated circuit of claim 1, wherein the path of interest includes sequential logic elements and the output signal of the logic elements is responsive to one of a rising or falling input signal.

7. The integrated circuit of claim 1, further comprising means for generating a pulse at an output terminal of the constant delay path in response to a single input signal transition, and wherein a last edge of the pulse has a same constant delay as the edge when only an edge is generated.

8. The integrated circuit of claim 7, wherein at least two pulses are generated by the means for generating, and a last edge of the last pulse has the same constant delay as the last edge as when only a single pulse is generated.

9. The integrated circuit of claim 7, wherein the generated pulse is selectably one of a rising edge followed by a falling edge, and a falling edge followed by a rising edge.

10. The integrated circuit of claim 7, wherein the generated pulse is in response to only one of a rising or falling input signal.

11. The integrated circuit of claim 1, wherein oscillation is initiated in the oscillation circuit by generating a constant logic low or high signal at an output terminal of the constant delay path while the path of interest is enabled, thereby driving all logic gates in the path of interest to a steady-state value, and then generating a signal edge independent of an initial input signal to the constant delay path.

12. The integrated circuit of claim 1, wherein oscillation is initiated in the oscillation circuit by detecting whether the path of interest is inverting or non-inverting, and further comprising means for selecting whether the constant delay path is appropriately non-inverting or inverting respectively.

13. The integrated circuit of claim 1, wherein oscillation is initiated in the oscillation circuit for a path of interest which contains sequential logic, by generating, when the initiation is complete, a pulse having an inactive edge followed by an active edge.

14. The integrated circuit of claim 1, further comprising means for setting the proportional delay by copying a delay through the delay path of interest after detecting a single start and subsequent stop condition, or after detecting multiple start and subsequent stop conditions.

15. The integrated circuit of claim 14, wherein the start and stop conditions are rising or falling signal transitions, whereby the delay to be copied is started or stopped as selected.

16. The integrated circuit of claim 14, wherein no enabled signal path exists between signal wires at which start and stop conditions are detected.

17. The integrated circuit of claim 14, further comprising:

a delay chain of logic gates tapped at intervals by latching elements which latch their input values when the stop condition is detected, and an input signal to the delay chain is selectably the start signal or said oscillation loop signal;

logic connected to the latching elements for detecting which latch element corresponds to a distance along the delay chain that the start signal progressed; and

a common output line driven by tri-state buffers whose input terminals are taps of the delay chain and which are enabled by the logic connected to the latch elements, and by a mode signal.

18. The integrated circuit of claim 14, further comprising:

a delay chain of logic gates tapped at intervals by latching elements which latch their input values when the stop condition is detected, and the input to the delay chain is selectably the start signal or said oscillation loop signal or the other end of the delay chain;

logic connected to the latching elements for detecting which latch element corresponds to a distance along the delay chain that the start signal progressed; and

logic connected to the latching elements for detecting how many times an original input signal transition has progressed around the delay chain loop; and

a common output line driven by tri-state buffers whose input terminals are taps of the delay chain and which are enabled by the logic connected to the latch elements, and by a mode signal and by logic which detects when a number of laps traveled by a signal to be delayed is equal to a number of laps traveled by the signal that was copied.

19. The integrated circuit of claim 1, wherein a setup and hold time of the selected path of interest which includes a sequential logic circuit is estimated by finding a minimum delay through a selectably tapped delay chain of logic gates, which when added to a data signal supplied to the sequential logic circuit relative to a clock signal supplied to the sequential logic circuit, causes the sequential logic to change state, and this delay through the tapped delay line is measured by selectably including it in the oscillation circuit.

20. The integrated circuit of claim 1, wherein a setup and hold time of the selected path of interest which includes a sequential logic circuit is measured by adjusting a delay through a selectably tapped delay chain of logic gates, which is added to a data signal supplied to the sequential logic circuit relative to a clock signal of the sequential logic circuit, until the sequential logic circuit changes state.

21. The integrated circuit of claim 1, further including other circuits, not on the integrated circuit, wherein the delay path of interest includes elements in the other circuits.

22. The integrated circuit of claim 1, further including at least one other integrated circuit (IC) including two test bus conductors, connected to a common pair of off-chip test bus conductors;

wherein a delay t between pins of the integrated circuits is determined by measuring;

a delay t1 from a first test bus conductor pin on a first IC, to a selected signal input on the first IC, to a first pin of the first IC, to the second test bus conductor;

a delay t2 from the first test bus conductor pin on the first IC, into the second IC, through a buffer to the second test bus conductor on the second IC, and into the first IC on said second test bus conductor;

a delay t3 from the first test bus conductor pin on the first IC, to the selected signal input on the first IC, to the first pin of the first IC, to the receiving pin on the second IC2, through a buffer to the second test bus conductor on the second IC, and into the first IC on the second test bus conductor; and

a delay from the first pin of the first IC to the receiving pin of the second IC is calculated as t=t3-t2-t.

23. The integrated circuit of claim 1, wherein the path of interest includes an analog circuit, and the path with constant delay has a delay long enough to ensure that an output signal of the analog circuit substantially settles to its steady-state value after receiving a rising or falling signal edge at its input terminal.

24. The integrated circuit of claim 23, wherein the output signal of the analog circuit is converted to a logic 0 or 1 by comparing the output signal of the analog circuit to a constant reference voltage.

25. A method of measuring a signal delay between any two of a plurality of terminals of an integrated circuit, the integrated circuit including two conductors selectably connected to each of the plurality of terminals, comprising the steps of:

connecting each of two terminals of the integrated circuit to one of the two conductors;

measuring a frequency of oscillation of a circuit path of interest including the two terminals and the two conductors; and

comparing the measured frequency of oscillation to a measured frequency of oscillation of a reference circuit with a known delay including the two conductors and not including one of the terminals.

26. The method of claim 25, wherein the step of measuring includes providing a predetermined delay to limit the frequency of oscillation.

27. The method of claim 25, wherein the step of measuring further comprises separately measuring a delay of a falling or a rising signal at an output terminal of the circuit of interest, relative to the initiating input signal edge.

28. The method of claim 25, wherein the step of measuring includes selecting a sequential logic delay path of interest which comprises clocked logic elements and combinational logic elements connected between the two terminals.

29. The method of claim 25, wherein the step of measuring includes counting a number of pulses of the oscillation occurring in a period of time proportional to a period of a reference signal of known frequency.

30. The method of claim 25, wherein a minimum pulse width is limited by using N delay elements for the constant delay, and using an output signal from the nth delay element, where 0<

n<

N, to generate the signal transition or transitions prior to a last signal transition going to the delay path of interest.

31. The method of claim 25, wherein a circuit between the two terminals includes at least one analog circuit element.