Cell evaluating method and cell evaluating apparatus

• US 5,945,805 A
• Filed: 06/20/1997
• Issued: 08/31/1999
• Est. Priority Date: 06/24/1996
• Status: Expired due to Fees

• Current Assignee: Sony Corporation (Sony Group Corp.)
• Original Assignee: Sony Corporation (Sony Group Corp.)
• Inventors: Nagai, Tamijia, Suzuki, Kuniharu, Takei, Toshitaka
• Primary Examiner(s): Wong, Peter S.
• Assistant Examiner(s): Toatley, Jr., Gregory
• Application Number:
  US08/879,767
• Time in Patent Office: 802 Days
• Field of Search: 320/124, 320/125, 320/134, 320/136, 320/161, 320/162, 320/165, 324/434
• US Class Current: 320/124
• CPC Class Codes: G01R 19/16542 for batteries charge condition monitoring in G01R31/36
• CPC Class Codes: G01R 31/3648 comprising digital calculation means, e.g. for performing an algorithm
• CPC Class Codes: G01R 31/52 Testing for short-circuits, leakage current or ground faults
• CPC Class Codes: H02J 7/00041 in response to measured battery parameters, e.g. voltage, current or temperature profile
• CPC Class Codes: H02J 7/00047 with provisions for charging different types of batteries
• CPC Class Codes: Y02E 60/10 Energy storage using batteries

Abstract

A cell evaluating method for evaluating characteristics of a secondary cell which can be repeatedly charged and which includes a step of detecting a cell voltage after a predetermined first charge operation for the cell is started, a step of, if the detected cell voltage is smaller than a reference voltage, proceeding to a second charge operation different from the predetermined first charge operation, and a step of evaluating a state of the cell. Moreover, the cell evaluating method includes a step of carrying out a first cell voltage detection after a first predetermined period of time has passed since a halt of the charge or discharge of a cell, a step of carrying out a second cell voltage detection after a second predetermined period of time has passed, and a step of evaluating, if the difference between the results of the first and second detections is not smaller than a predetermined value, that an internal short circuit occurs in the cell.

Claims

1. A cell evaluating method for evaluating characteristics of a secondary cell which can be repeatedly charged, comprising the steps of:

detecting a cell voltage after a predetermined first charge operation for said secondary cell is started;

proceeding to a second charge operation if said detected cell voltage is lower than a reference voltage; and

determining a state of said secondary cell.

2. The cell evaluating method according to claim 1, wherein if said detected cell voltage is lower than the reference voltage after said second charge operation is carried out for a predetermined period of time, then it is determined that an internal short circuit occurs in said secondary cell.

3. The cell evaluating method according to claim 1, wherein if said detected cell voltage reaches the reference voltage after said second charge operation is carried out for a predetermined period of time, then it is determined that said second charge operation can be continued.

4. The cell evaluating method according to claim 3, wherein if it is determined that an internal short circuit occurs in said secondary cell, then a display unit indicates that said secondary cell is an abnormal cell.

5. The cell evaluating method according to claim 1, wherein said second charge operation charges said secondary cell with a current value larger than a predetermined current value.

6. A cell evaluating method for evaluating characteristics of a secondary cell which can be repeatedly charged, comprising the steps of:

detecting a first cell voltage after a first predetermined period of time has passed since either one of a charge and a discharge of said secondary cell has stopped;

detecting a second cell voltage after a second predetermined period of time has passed;

calculating a difference between said first cell voltage and said second cell voltage; and

determining that an internal short circuit occurs in said secondary cell if said difference exceeds a predetermined value.

7. The cell evaluating method according to claim 6, wherein if it is determined that said internal short circuit occurs, then a display unit indicates that said secondary cell is an abnormal cell.

8. The cell evaluating method according to claim 6, further comprising the steps of:

stopping a second charge operation when it is detected that a cell voltage becomes higher than a reference voltage approximately equal to a full charge voltage while said second charge operation is being continued; and

restarting said second charge operation when it is detected that said cell voltage becomes lower than said reference voltage approximately equal to the full charge voltage.

9. A cell evaluating apparatus for evaluating characteristics of a secondary cell which can be repeatedly charged, comprising:

means for detecting a cell voltage after a predetermined first charge operation for said secondary cell is started;

means for proceeding to a second charge operation different from said predetermined first charge operation if said detected cell voltage is lower than a reference voltage; and

means for determining a state of said secondary cell.

10. The cell evaluating apparatus according to claim 9, wherein a means is provided such that if said detected cell voltage is lower than the reference voltage after said second charge operation is carried out for a predetermined period of time, then it is determined that an internal short circuit occurs in said secondary cell.

11. The cell evaluating apparatus according to claim 9, wherein there is provided a means such that if said detected cell voltage reaches the reference voltage after said second charge operation is carried out for a predetermined period of time, then it is determined that said second charge operation is to be continued.

12. The cell evaluating apparatus according to claim 11, wherein a display means is provided such that if it is determined that an internal short circuit occurs in said secondary cell, then said display means indicates that said secondary cell is an abnormal cell.

13. The cell evaluating apparatus according to claim 9, wherein said second charge operation charges said secondary cell with a current value larger than a predetermined current value.

14. A cell evaluating apparatus for evaluating characteristics of a secondary cell which can be repeatedly charged, comprising:

means for detecting a first cell voltage after a first predetermined period of time has passed since either one of a charge and a discharge of said secondary cell;

means for detecting a second cell voltage after a second predetermined period of time has passed; and

means for calculating a difference between said first cell voltage and said second cell voltage and for determining if said difference exceeds a predetermined value indicating that an internal short circuit occurs in said secondary cell.

15. The cell evaluating apparatus according to claim 14, wherein a display means is provided such that if it is determined that said internal short circuit occurs in said secondary cell, then said display means indicates that said secondary cell is an abnormal cell.

16. The cell evaluating method according to claim 14, further comprising:

means for stopping a second charge operation when it is detected that a cell voltage becomes higher than a reference voltage approximately equal to a full charge voltage while said second charge operation is being continued; and

means for restarting said second charge operation when it is detected that said cell voltage becomes lower than said reference voltage approximately equal to the full charge voltage.