Method for obtaining a high dynamic range read-out signal of a CMOS-based pixel structure and such CMOS-based pixel structure

• US 6,011,251 A
• Filed: 02/09/1998
• Issued: 01/04/2000
• Est. Priority Date: 06/04/1997
• Status: Expired due to Term

• Current Assignee: Semiconductor Components Industries LLC (ON Semiconductor Corporation)
• Original Assignee: IMEC International
• Inventors: Scheffer, Danny, Dierickx, Bart
• Primary Examiner(s): ALLEN, STEPHONE B
• Application Number:
  US09/021,011
• Time in Patent Office: 694 Days
• Field of Search: 250/214.1, 250/208.1, 250/214 R, 257/288, 257/290-292, 257/443, 257/444, 348/294, 348/297, 348/298, 348/300, 348/308, 348/311, 358/482, 358/483, 377/60-63
• US Class Current: 250/208.1
• CPC Class Codes: H01L 27/14643 Photodiode arrays; MOS imagers
• CPC Class Codes: H04N 25/575 with a response composed of multiple slopes
• CPC Class Codes: H04N 3/155 Control of the image-sensor operation, e.g. image processing within the image-sensor

Abstract

A method is disclosed for obtaining a read-out signal of a MOS-based pixel structure having at least a photosensitive element with an output node and a memory element with a first switch therebetween. The method comprises the steps of while acquiring charge carriers on said output node of said photosensitive element, said charge carriers being converted from electromagnetic radiation on the photosensitive element, after a first time period creating a first signal, and after a second time period, creating a second signal, said read-out signal being a combination of at least said first and said second signals.

According to the present invention, there is no limitation to the amount of collected charges in none of the integrated periods. The signal collected during the first period is memorized by a switch which shortly opens and closes between the period. The switch is thus in the same state in both period of time. After a second period, there are thus two charge packets, each obtained during a different time. In order to read-out, these two charge packets are then combined into one reading. This combination is known either by adding or subtracting this charge packets, e.g., by adding or subtracting them in the circuitry external to the sensor.

Claims

1. A method for obtaining a read-out signal of a MOS-based pixel structure having in a MOS technology at least a photosensitive element with an output node and a memory element with a first switch therebetween, the method comprising the steps of while acquiring charge carriers on said output node of said photosensitive element, said charge carriers being converted from radiation impinging on the photosensitive element:

after a first time period opening said first switch thereby storing a first number of charge carriers on said memory element and creating a first signal;

after a second time period, creating a second signal from a second number of said charge carriers being stored on said output node of said photosensitive element, and

combining at least said first and said second signals in order to obtain said read-out signal.

2. The method as recited in claim 1, wherein said steps are repeated for a number of time periods being larger than 2.

3. The method as recited in claim 1, further comprising the steps of:

after said second time period, creating a first intermediate signal from said first signal,

thereafter opening and closing said first switch thereby creating a second intermediate signal; and

combining at least said first and said second intermediate signals in order to obtain said read-out signal.

4. The method of claim 1, wherein all the voltages applied on said pixel structure are the same during the first and second time periods.

5. The method as recited in claim 3, wherein the read-out signal is a weighed average of at least said first and said second intermediate signals.

6. The method as recited in claim 3, wherein the read-out signal is a linear combination of said second and said first intermediate signals.

7. The method as recited in claim 3, wherein a correlated double-sampling is performed using an extra-step of closing a reset switch which is placed in series with the photosensitive element in order to have a reset of said photosensitive element and thereby creating a third signal, said read-out signal being a combination of said first, second and third signals.

8. The method as recited in claim 7, wherein the read-out signal is a combination of the subtraction of third and first signals and of the subtraction of third and second signals.

9. The method as recited in claim 7, wherein the read-out signal is a combination of the subtraction of second and first signals and of the subtraction of third and second signals.

10. The method as recited in claim 7, wherein the read-out signal is a combination of the subtraction of second and first signals and of the subtraction of third and first signals.

11. Use of the method recited in claim 1 in a camera system.

12. A MOS-based pixel structure, comprising at least:

a photosensitive element for converting radiation into charge carriers, and being connected to a voltage with a reset switch;

a memory element being connected to an amplifier; and

a first switch in-between said photosensitive element and said memory element, said first switch being opened causing a first number of said charge carriers being stored on said memory element.

13. A MOS-based pixel structure according to claim 12, wherein the memory element is an analog memory such as a capacitor or a parasitic capacitor.

14. A MOS-based pixel structure according to claim 12, wherein both switches are CMOS transistors.

15. A MOS-based pixel structure according to claim 12, wherein said amplifier is placed within the pixel structure in order to have an active pixel.

16. A MOS-based pixel structure according to claim 13, wherein said amplifier is placed within the pixel structure in order to have an active pixel.

17. A MOS-based pixel structure according to claim 14, wherein said amplifier is placed within the pixel structure in order to have an active pixel.

18. A MOS-based pixel structure according to claim 12, wherein said amplifier is placed outside of the pixel structure in order to have a passive pixel structure.

19. A MOS-based pixel structure according to claim 13, wherein said amplifier is placed outside of the pixel structure in order to have a passive pixel structure.

20. A MOS-based pixel structure according to claim 14, wherein said amplifier is placed outside of the pixel structure in order to have a passive pixel structure.

21. A MOS image sensor having a geometric configuration of pixels consisting in a structure according to claim 13.

22. A MOS image sensor having a geometric configuration of pixels consisting in a structure according to claim 14.

23. A MOS image sensor having a geometric configuration of pixels consisting in a structure according to claim 15.

24. A MOS image sensor having a geometric configuration of pixels consisting in a structure according to claim 16.

25. A MOS image sensor having a geometric configuration of pixels consisting in a structure according to claim 17.

26. A MOS image sensor having a geometric configuration of pixels consisting in a structure according to claim 18.

27. A MOS image sensor having a geometric configuration of pixels consisting in a structure according to claim 19.

28. A MOS image sensor having a geometric configuration of pixels consisting in a structure according to claim 20.

29. Use of the MOS image sensor as recited in claim 21 in a camera system.

30. Use of the MOS image sensor as recited in claim 22 in a camera system.

31. Use of the MOS image sensor as recited in claim 23 in a camera system.

32. Use of the MOS image sensor as recited in claim 24 in a camera system.

33. Use of the MOS image sensor as recited in claim 25 in a camera system.

34. Use of the MOS image sensor as recited in claim 26 in a camera system.

35. Use of the MOS image sensor as recited in claim 27 in a camera system.

36. Use of the MOS image sensor as recited in claim 28 in a camera system.