Sensing structure comprising a movable mass and a self-test structure

• US 6,070,464 A
• Filed: 09/05/1997
• Issued: 06/06/2000
• Est. Priority Date: 09/05/1997
• Status: Expired due to Term

• Current Assignee: North Star Innovations Inc. (Wi-LAN Inc.)
• Original Assignee: Motorola, Inc. (Motorola Solutions, Inc.)
• Inventors: Gutteridge, Ronald James, Koury, Jr., Daniel Nicolos
• Primary Examiner(s): Kwok, Helen C.
• Application Number:
  US08/926,319
• Time in Patent Office: 1,005 Days
• Field of Search: 73/514.32, 73/514.36, 73/514.18, 73/514.16, 73/1.38, 73/1.37, 73/862.626, 73/862.68, 361/280, 361/283.3
• US Class Current: 73/514.32
• CPC Class Codes: G01P 15/0802 Details
• CPC Class Codes: G01P 15/125 by capacitive pick-up
• CPC Class Codes: G01P 2015/0814 for translational movement of the mass, e.g. shuttle type
• CPC Class Codes: G01P 21/00 Testing or calibrating of apparatus or devices covered by the preceding groups

Abstract

A sensing structure (10) formed overlying a substrate (50), for example a semiconductor substrate, has a movable mass (12) substantially split into two halves with a self-test structure disposed between the two halves. The self-test structure has a plurality of single-capacitor actuators for displacing the movable mass. Each actuator is formed by a movable finger (18) connected to the movable mass and a fixed finger (44) mounted by an anchor to the substrate. Each actuator is shielded by a fixed shield finger (42) so that all actuators force the movable mass in a common direction.

Claims

1. A sensing structure comprising:

a movable mass positioned overlying a substrate and moving in a direction corresponding to a sensitive axis wherein said movable mass moves relative to said substrate and said movable mass comprises a first mass portion and a second mass portion disposed on opposite sides of a centerline of said movable mass wherein said centerline is substantially parallel to said sensitive axis;

a movable self-test finger protruding from said first mass portion;

a fixed self-test finger fixedly mounted to said substrate; and

wherein said movable self-test finger and said fixed self-test finger are disposed between said first mass portion and said second mass portion.

2. The sensing structure of claim 1 further comprising:

a movable sensing finger protruding from said first mass portion and a fixed sensing finger mounted to said substrate and disposed relative to said movable sensing finger so as to provide a sensing capacitor; and

wherein said fixed self-test finger is electrically coupled to a self-test circuit and said fixed sensing finger is electrically coupled to a sensing circuit.

3. The sensing structure of claim 2 wherein said substrate is a semiconductor substrate.

4. The sensing structure of claim 2 wherein said self-test circuit and said sensing circuit operate electrically independently.

5. The sensing structure of claim 1 wherein said movable mass moves in a plane substantially parallel to said substrate.

6. The sensing structure of claim 5 wherein said substrate comprises silicon and said movable mass comprises polysilicon.

7. The sensing structure of claim 6 wherein said substrate and said movable mass are doped.

8. A sensing structure comprising:

a movable mass disposed overlying a substrate and moving in a direction corresponding to a sensitive axis, the movable mass comprising a first mass portion and a second mass portion disposed on opposite sides of a centerline of said movable mass wherein said centerline is substantially parallel to said sensitive axis; and

a fixed self-test finger disposed between said first mass portion and said second mass portion.

9. The sensing structure of claim 8 further comprising:

a movable self-test finger protruding from said first mass portion and

said movable self-test finger and said fixed self-test finger are each disposed within said perimeter.

10. The sensing structure of claim 8 wherein said movable mass moves in a plane substantially parallel to said substrate.

11. The sensing structure of claim 9 wherein said movable self-test finger, said fixed self-test finger, and said movable mass are disposed in a substantially common plane.

18. The sensing structure of claim 8 further comprising:

a suspension connected to said movable mass; and

a suspension shield surrounding at least a portion of said movable mass wherein said suspension shield and said movable mass are maintained at substantially the same electric potential.

12. A sensing structure comprising:

a movable mass disposed overlying a substrate and comprising a first mass portion and a second mass portion; and

a fixed self-test finger disposed between said first mass portion and said second mass portion;

a movable self-test finger protruding from said first mass portion and wherein;

said movable mass moves in a direction corresponding to a sensitive axis;

said first mass portion and said second mass portion are each disposed substantially symmetrically about a centerline of said movable mass and together form at least a portion of a perimeter of said movable mass wherein said centerline is substantially parallel to said sensitive axis; and

said movable self-test finger and said fixed self-test finger are each disposed within said perimeter; and

a fixed shield finger disposed substantially parallel to said movable self-test finger and wherein said fixed self-test finger and said movable self-test finger are disposed substantially parallel to each other to provide a single-capacitor self-test actuator.

13. The sensing structure of claim 12 wherein said sensing structure forms a portion of an accelerometer.

14. The sensing structure of claim 12 wherein during a self-test operation of said sensing structure (i) said fixed shield finger and said movable self-test finger are biased to substantially the same electric potential and (ii) said fixed self-test finger is biased to an electric potential sufficiently different from said movable self-test finger so that said movable mass is displaced during said self-test operation.

15. The sensing structure of claim 12 further comprising a movable sensing finger protruding from said first mass portion in a direction substantially opposite from said movable self-test finger.

16. The sensing structure of claim 15 further comprising a first fixed sensing finger and a second fixed sensing finger disposed on opposite sides of said movable sensing finger to provide a differential sensing capacitor.

17. The sensing structure of claim 16 wherein said differential sensing capacitor is electrically coupled to a sensing circuit and said self-test actuator is electrically coupled to a self-test circuit and wherein said sensing circuit and said self-test circuit are electrically independent.

19. A sensing structure comprising:

a movable mass overlying a semiconductor substrate wherein a central portion of said movable mass comprises at least one central opening, and the movable mass moving in a direction corresponding to a sensitive axis, and comprising a first mass portion and a second mass portion disposed on opposite sides of a centerline of said movable mass wherein said centerline is substantially parallel to said sensitive axis; and

a plurality of fixed self-test fingers disposed inside said central opening.

20. The sensing structure of claim 19 wherein said fixed self-test fingers are disposed substantially parallel to a plurality of corresponding movable self-test fingers each being a part of said movable mass and protruding inward towards said central opening so as to provide a plurality of single capacitor self-test actuators.

21. The sensing structure of claim 20 wherein said sensing structure is an acceleration sensing structure and said plurality of fixed self-test fingers is disposed substantially symmetrically about a centerline of said movable mass.

22. A sensing structure comprising:

a movable mass overlying a semiconductor substrate wherein a central portion of said movable mass comprises at least one central opening;

a plurality of fixed self-test fingers disposed inside said central opening wherein said fixed self-test finders are disposed substantially parallel to a plurality of corresponding movable self-test fingers each a part of said movable mass and protruding inward towards said central opening so as to provide a plurality of single capacitor self-test actuators, and wherein said sensing structure is an acceleration sensing structure and said plurality of fixed self-test fingers is disposed substantially symmetrically about a centerline of said movable mass; and

a plurality of fixed shield fingers each disposed substantially parallel to a corresponding one of said plurality of movable self-test fingers.

23. A method of forming a sensing structure comprising:

forming a movable mass overlying a substrate wherein said movable mass moves in a direction corresponding to a sensitive axis, said movable mass moves relative to said substrate, and said movable mass comprises a first mass portion and a second mass portion disposed on opposite sides of a centerline of said movable mass wherein said centerline is substantially parallel to said sensitive axis;

forming a movable self-test finger protruding from said first mass portion and disposed between said first mass portion and said second mass portion; and

forming a fixed self-test finger fixedly mounted to said substrate and disposed between said first mass portion and said second mass portion.

24. The method of forming said sensing structure of claim 23 wherein said step of forming said movable self-test finger comprises:

forming a sacrificial layer overlying said substrate;

forming an upper layer overlying said sacrificial layer;

patterning said upper layer to provide at least said movable self-test finger; and

removing said sacrificial layer.

25. The method of forming said sensing structure of claim 24 wherein said step of forming said fixed self-test finger comprises:

forming a lower layer overlying said substrate;

patterning said lower layer to provide an anchor as part of a patterned lower layer;

forming a via in said sacrificial layer at a location overlying said anchor;

wherein said sacrificial layer is formed overlying said lower layer; and

wherein said step of patterning said upper layer provides said fixed self-test finger mounted to said anchor.