Scanning optical apparatus

• US 6,094,286 A
• Filed: 08/27/1997
• Issued: 07/25/2000
• Est. Priority Date: 08/28/1996
• Status: Expired due to Term

• Current Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Original Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Inventors: Kato, Manabu
• Primary Examiner(s): Schuberg, Darren E.
• Application Number:
  US08/918,129
• Time in Patent Office: 1,063 Days
• Field of Search: 359/196, 359/205, 359/206, 359/207, 359/566, 359/570, 347/256, 347/258
• US Class Current: 359/206.1
• CPC Class Codes: G02B 26/125 Details of the optical system between the polygonal mirror and the image plane G02B26/123, G02B26/127 take precedence; F-Theta lenses G02B13/0005
• CPC Class Codes: G02B 27/0031 for scanning purposes

Abstract

A scanning optical apparatus includes a semiconductor laser as a light source, a deflector for deflecting a light beam emitted from the semiconductor laser, and optical element for directing the light beam emitted from the semiconductor laser to a surface to be scanned. The optical element includes a refracting porion and a diffracting portion, wherein changes in the focus in the main scanning direction, resulting from the environmental fluctuations, of the scanning optical apparatus are corrected by a characteristic of the optical element.

Claims

1. A scanning optical apparatus comprising:

a semiconductor laser;

a deflecting element for deflecting a light beam emitted from said semiconductor laser; and

a scanning optical system for directing the light beam deflected by said deflecting element onto a surface to be scanned, said scanning optical system including a refracting portion and a diffracting portion,

wherein the following condition is satisfied;

space="preserve" listing-type="equation">1.0≦

φ

L/φ

D≦

2.6

where φ

L represents the power of the refracting portion of said scanning optical system and φ

D represents the power of the diffracting portion of said scanning optical system.

2. The scanning optical apparatus according to claim 1, further comprising an anamorphic optical system for causing the light beam emitted from said semiconductor laser to be imaged in a linear shape elongated in a main scanning direction on a deflecting surface of said deflecting element.

3. The scanning optical apparatus according to claim 2, wherein said anamorphic optical system comprises a collimator lens for converting the light beam emitted from said semiconductor laser into a parallel beam and a cylindrical lens for linearly condensing the parallel beam.

4. The scanning optical apparatus according to claim 1, wherein said deflecting element comprises a polygon mirror.

5. The scanning optical apparatus according to claim 1, wherein said scanning optical system comprises a single lens, and a diffracting optical element is provided on at least one of a light incident surface and a light emergent surface of said single lens.

6. The scanning optical apparatus according to claim 5, wherein said single lens is composed of a plastic material.

7. The scanning optical apparatus according to claim 5, wherein said light incident surface and said light emergent surface of said single lens each respectively comprises an aspherical-shaped lens surface in a main scanning direction.

8. The scanning optical apparatus according to claim 5, wherein said single lens has a refractive power that differs between a main scanning direction and a sub-scanning direction.

9. The scanning optical apparatus according to claim 5, wherein said diffracting optical element comprises a binary optical element comprising a staircase-like diffraction grating.

10. The scanning optical apparatus according to claim 5, wherein said diffracting optical element comprises a Fresnel optical element comprising a sawtooth-like diffraction grating.

11. The scanning optical apparatus according to claim 1, wherein the power ratio between the refracting portion and the diffracting portion of said scanning optical system satisfies said condition within an on-axis to off-axis range.

38. A laser beam printer comprising:

the scanning optical apparatus according to any one of claims 1 to 37; and

a recording medium provided on the surface to be scanned of said scanning optical apparatus.

39. The laser beam printer according to claim 38, wherein said recording medium comprises a photosensitive drum.

12. A scanning optical apparatus comprising:

a semiconductor laser;

a deflecting element for deflecting a light beam emitted from said semiconductor laser; and

a scanning optical system for directing the light beam deflected by said deflecting element onto a surface to be scanned, said scanning optical system including a refracting portion and a diffracting portion,

wherein said scanning optical system comprises a single lens, and a diffracting optical element is provided on at least one of a light incident surface and a light emergent surface of said single lens, and a change in the focus in a main scanning direction, resulting from environmental fluctuations, of said scanning optical apparatus is corrected by a characteristic of said scanning optical system.

13. The scanning optical apparatus according to claim 12, wherein the environmental fluctuation includes a wavelength fluctuation of said semiconductor laser and a change of the refractive index due to a temperature fluctuation.

14. The scanning optical apparatus according to claim 12, wherein said single lens is composed of a plastic material.

15. The scanning optical apparatus according to claim 12, wherein the light incident surface and the light emergent surface of said single lens each respectively comprises an aspherical-shaped lens surface in the main scanning direction.

16. The scanning optical apparatus according to claim 12, wherein said diffracting optical element comprises a binary optical element comprising a staircase-like diffraction grating.

17. The scanning apparatus according to claim 12, wherein said diffracting optical element comprises a Fresnel optical element comprising a sawtooth-like diffraction grating.

18. The scanning optical apparatus according to claim 12, further comprising an anamorphic optical system for causing the light beam emitted from said semiconductor laser to be imaged in a linear shape elongated in the main scanning direction on a deflecting surface of said deflecting element.

19. The scanning optical apparatus according to claim 18, wherein said anamorphic optical system comprises a collimator lens for converting the light beam emitted from said semiconductor laser into a parallel beam and a cylindrical lens for linearly condensing the parallel beam.

20. The scanning optical apparatus according to claim 12, wherein said deflecting element comprises a polygon mirror.

21. A scanning optical apparatus comprising:

a semiconductor laser;

a deflecting element for deflecting a light beam emitted from said semiconductor laser; and

an anamorphic optical system for causing the light beam emitted from said semiconductor laser to be imaged in a linear shape elongated in a main scanning direction on a deflecting surface of said deflecting element, said anamorphic optical system having a diffracting portion; and

a scanning optical system for directing the light beam deflected by said deflecting element onto a surface to be scanned,

wherein said scanning optical system comprises a single lens which is composed of a plastic material, and a change in focus in the main scanning direction, resulting from environmental fluctuation, of said scanning optical apparatus is corrected by characteristics of said anamorphic optical system and said scanning optical system.

22. The scanning optical apparatus according to claim 21, wherein said anamorphic optical system comprises a collimator lens for converting the light beam emitted from said semiconductor laser into a parallel beam and a cylindrical lens for linearly condensing the parallel beam, and a diffracting optical element is provided on at least one of a light incident surface and a light emergent surface of said cylindrical lens.

23. The scanning optical apparatus according to claim 21, wherein the environmental fluctuation includes a wavelength fluctuation of said semiconductor laser and a change of the refractive index due to a temperature fluctuation.

24. The scanning optical apparatus according to claim 21, wherein an incident surface and an emergent surface of said single lens each respectively comprises an aspherical-shaped lens surface in the main scanning direction.

25. The scanning optical apparatus according to claim 21, wherein said single lens has a refractive power that differs between the main scanning direction and a sub-scanning direction.

26. The scanning optical apparatus according to claim 21, wherein said diffracting portion comprises a binary optical element comprising a staircase-like diffraction grating provided on said anamorphic optical system.

27. The scanning optical apparatus according to claim 21, wherein said diffracting portion comprises a Fresnel optical element comprising a sawtooth-like diffraction grating provided on said anamorphic optical system.

28. The scanning optical apparatus according to claim 21, wherein said deflecting element comprises a polygon mirror.

29. A scanning optical apparatus comprising:

a semiconductor laser;

a collimator lens for converting a light beam emitted from said semiconductor laser into a parallel beam, said collimator lens having a diffracting portion;

a deflecting optical element for deflecting the light beam transmitted through said collimator lens; and

a scanning optical system for directing the light beam deflected by said deflecting element onto a surface to be scanned, said scanning optical system having a refracting portion,

wherein a change in focus in a main scanning direction, resulting from environmental fluctuation, of said scanning optical apparatus is corrected by characteristics of said collimator lens and said scanning optical system.

30. The scanning optical apparatus according to claim 29, further comprising a cylindrical lens for causing the parallel beam transmitted through said collimator lens to be condensed in a linear shape elongated in the main scanning direction on a deflecting surface of said deflecting element.

31. The scanning optical apparatus according to claim 29, wherein the environmental fluctuation includes a wavelength fluctuation of said semiconductor laser and a change of the reflective index due to a temperature fluctuation.

32. The scanning optical apparatus according to claim 29, wherein said deflecting element comprises a polygon mirror.

33. The scanning optical apparatus according to claim 29, wherein said scanning optical system comprises a single lens which is composed of a plastic material.

34. The scanning optical apparatus according to claim 33, wherein a light incident surface and a light emergent surface of said single lens each respectively comprises an aspherical-shaped lens surface in the main scanning direction.

35. The scanning optical apparatus according to claim 33, wherein said single lens has a refractive power that differs between the main scanning direction and the sub-scanning direction.

36. The scanning optical apparatus according to claim 29, wherein said diffracting optical element comprises a binary optical element comprising a staircase-like diffraction grating provided on said collimator lens.

37. The scanning optical apparatus according to claim 29, wherein said diffracting optical element comprises a Fresnel optical element comprising a sawtooth-like diffraction grating provided on said collimator lens.