System for optimizing the testing and repair time of a defective integrated circuit

• US 6,128,756 A
• Filed: 09/09/1998
• Issued: 10/03/2000
• Est. Priority Date: 08/07/1996
• Status: Expired due to Term

• Current Assignee: Micron Technology, Inc.
• Original Assignee: Micron Technology, Inc.
• Inventors: Beffa, Ray
• Primary Examiner(s): Nguyen, Hoa T.
• Application Number:
  US09/150,289
• Time in Patent Office: 755 Days
• Field of Search: 714/718, 714/723, 714/719, 714/724, 365/201, 324/73.1, 324/158.1
• US Class Current: 714/718
• CPC Class Codes: G01R 31/318371 Methodologies therefor, e.g. algorithms, procedures
• CPC Class Codes: G01R 31/319 Tester hardware, i.e. output processing circuits
• CPC Class Codes: G06F 11/006 Identification G06F11/2289 takes precedence
• CPC Class Codes: G11C 29/08 Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
• CPC Class Codes: G11C 29/10 Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns
• CPC Class Codes: G11C 29/26 Accessing multiple arrays G11C29/24 takes precedence
• CPC Class Codes: G11C 29/44 Indication or identification of errors, e.g. for repair

Abstract

A method and apparatus for testing semiconductor memory chips, such as DRAMs, having a plurality of memory cells or bits. Each memory chip has a unique identifier stored in a database. Tests are performed on the memory chips and when a memory chip fails a test, the memory chip is placed in a repair bin and a test identifier is stored in the database in association with the memory chip identifier. In order to repair the memory chip, failed tests are read out of the database and such tests are again performed on the failed memory chip in order to determine which memory cell in the memory chip is faulty. The failed memory cells are then repaired.

Claims

1. An apparatus for testing a plurality of integrated circuits, said apparatus comprising:

a testing device for performing a plurality of tests on said plurality of integrated circuits, each of said plurality of integrated circuits having a unique circuit identifier; and

a processor to control said testing device, said processor identifying each of said plurality of integrated circuits that failed at least one of said plurality of tests and identifying tests failed by each of said plurality of integrated circuits,

wherein said testing device repeats at least one identified failed test on each integrated circuits that failed at least one of said plurality of tests.

2. The apparatus for testing according to claim 1, wherein said unique circuit identifier is a fuse identifier having a series of selectively blown fuses corresponding to a unique binary number.

3. The apparatus for testing according to claim 1, wherein each of said plurality of tests has an associated test identifier.

4. The apparatus for testing according to claim 3, further comprising:

a memory, said memory storing said unique circuit identifier for each of said plurality of integrated circuits that failed at least one test in association with said test identifier for said failed at least one test.

5. The apparatus for testing according to claim 4, wherein said processor selects tests to be repeated by said testing device by retrieving at least one of said stored test identifiers for a failed test from said memory.

6. The apparatus for testing according to claim 5, wherein each failed integrated circuit has a set of associated failed test identifiers stored in said memory, and wherein said processor compares sets of failed test identifiers for each of said failed integrated circuits and selects a subset of tests that includes at least one test from each set of failed test identifiers.

7. The apparatus for testing according to claim 6, wherein said testing device repeats said subset of tests selected by said processor on each failed integrated circuit.

8. The apparatus for testing according to claim 7, wherein said processor determines an amount of time each test requires, sums the determined amounts of time for a plurality of combinations of tests, and selects a combination of tests that requires a minimal amount of time.

9. The apparatus for testing according to claim 8, wherein said processor ranks said identified failed tests in order of the highest number of integrated circuits failing each test, and selects the highest ranked test to be in said subset of tests.

10. The apparatus for testing according to claim 9, wherein said processor ranks said identified failed tests for each of said failed integrated circuits that remain that did not fail said highest ranked test in order of the highest number of integrated circuits that failed each of said failed tests that remain, and selects the highest ranked test of said identified failed tests for each of said remaining integrated circuits to be in said subset of tests.

11. The apparatus for testing according to claim 10, wherein said processor repeatedly ranks said identified failed tests and selects tests to be in said subset of tests until there are no identified integrated circuits that did not fail at least one test in said subset of tests.

12. The apparatus for testing according to claim 1, wherein said integrated circuits each include an array of memory cells and wherein said processor identifies at least one failed memory cell in said array of memory cells for each identified integrated circuit.

13. An apparatus for testing in accordance with claim 12, further comprising:

a repair device for repairing said identified at least one failed memory cell in each identified integrated circuit.