Method of manufacturing and testing an electronic device, and an electronic device

  • US 6,167,614 B1
  • Filed: 09/08/1999
  • Issued: 01/02/2001
  • Est. Priority Date: 10/20/1997
  • Status: Expired due to Term
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First Claim
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1. A method of manufacturing and testing an electronic circuit, the method comprising:

  • forming a plurality of conductive traces on a substrate and providing a gap in one of the conductive traces;

    attaching a circuit component to the substrate and coupling the circuit component to at least one of the conductive traces;

    supporting a battery on the substrate, and coupling the battery to at least one of the conductive traces, wherein a completed circuit would be defined, including the traces, circuit component, and battery, but for the gap;

    verifying electrical connections by performing an in circuit test, after the circuit component is attached and the battery is supported; and

    employing a jumper to electrically close the gap, and complete the circuit, after verifying electrical connections.

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