Method and apparatus for analyzing cuts

  • US 6,192,289 B1
  • Filed: 02/13/1998
  • Issued: 02/20/2001
  • Est. Priority Date: 04/13/1997
  • Status: Expired due to Term
First Claim
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1. A system for analyzing the quality of the sawing of a material, the system comprising:

  • scanning means which scans along cuts of said material and which views at least a portion of a cut;

    a cut parameter identifier which identifies and stores parameters of said viewed cut portion, said cut parameter identifier comprising;

    a kerf identifier which identifies upper and lower kerfs of said viewed cut portion; and

    a chip parameter identifier which identifies sawing chips along said upper and lower kerfs and determines parameters thereof; and

    a cut analyzer which analyzes said parameters of a multiplicity of viewed cut portions and which determines the quality of said cuts therefrom.

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