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Method and apparatus for biasing a CMOS active pixel sensor above the nominal voltage maximums for an IC process

  • US 6,246,043 B1
  • Filed: 09/22/1998
  • Issued: 06/12/2001
  • Est. Priority Date: 09/22/1998
  • Status: Expired due to Term
First Claim
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1. A method for operating an active pixel sensor having a reset transistor, a transfer transistor, and a readout transistor fabricated according to a process having a nominal operating voltage comprising the steps of:

  • applying a voltage having a value greater than the nominal operating voltage to a gate of the reset transistor during a reset period to maximize the dynamic range of the active pixel sensor;

    applying a voltage having a value greater than the nominal operating voltage to a gate of the transfer transistor during said reset period;

    continuing to apply said voltage having a value greater than the nominal operating voltage to said gate of the transfer transistor during an integration period; and

    applying a voltage to said gate of the reset transistor during said integration period that limits an electric field applied across a gate dielectric of the transfer transistor during said integration period.

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