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Apparatus for measuring optical characteristics of a substrate and pigments applied thereto

  • US 6,373,573 B1
  • Filed: 03/13/2000
  • Issued: 04/16/2002
  • Est. Priority Date: 03/13/2000
  • Status: Expired due to Term
First Claim
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1. A system for applying pigment to a substrate, comprising:

  • a spectophotometer integral to the system supplying light to the substrate and receiving light from the substrate, wherein the light received from the substrate is spectrally analyzed by a spectrometer, one or more pigment dischargers integral to the system, wherein the one or more pigment dischargers apply one or more pigments to the substrate;

    wherein, the spectrometer spectrally analyzes the one or more pigments applied to the substrate or spectrally analyzes the substrate at one or more points on the substrate, wherein the one or more points on the substrate do not have the one or more pigments applied thereto;

    wherein the spectrometer comprises;

    an optical sensing circuit having thereon a plurality of optical sensors and one or more processing elements;

    a plurality of filter elements fixedly positioned over at least a first group of the optical sensors, wherein each of the plurality of filter elements have spectral transmission characteristics over predetermined wavelengths;

    an optical manifold fixedly positioned over at least certain of the plurality of filter elements, wherein the optical manifold has a plurality of exit windows and at least one entrance port, wherein light entering the entrance port is transmitted to an intenor portion of the optical manifold, wherein at least a portion of the light is transmitted from the exit ports through at least certain of the filter elements for sensing by at least certain of the optical sensors;

    wherein light may be coupled from the substrate to the entrance port, wherein spectral data corresponding to the light is generated by the one or more processing elements, wherein the spectrometer is fabricated in a unitary manner.

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