CMOS sensor camera with on-chip image compression

• US 6,417,882 B1
• Filed: 05/05/1998
• Issued: 07/09/2002
• Est. Priority Date: 05/06/1997
• Status: Expired due to Term

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Mahant-Shetti, Shivaling S.
• Primary Examiner(s): Garber, Wendy R.
• Assistant Examiner(s): NGUYEN, LUONG TRUNG
• Application Number:
  US09/073,370
• Time in Patent Office: 1,526 Days
• Field of Search: 348/301, 348/302, 348/308, 348/312, 348/294, 708/820, 708/821, 341/155, 257/222
• US Class Current: 348/302
• CPC Class Codes: H04N 25/51 Control of the gain
• CPC Class Codes: H04N 25/74 Circuitry for scanning or addressing the pixel array
• CPC Class Codes: H04N 25/779 Circuitry for scanning or addressing the pixel array
• CPC Class Codes: H04N 3/155 Control of the image-sensor operation, e.g. image processing within the image-sensor

Abstract

A digital camera (10) that has an array (11) of CMOS sensor elements (11a). The array (11) is read in a manner that performs spatial-to-frequency transforms for image compression on the analog output signals of the sensor elements. More specifically, wordlines (12) and bitlines (13) are pulsewidth modulated so that the coincidence of their “on” times corresponds to a desired coefficient of the basis function of the transform (FIGS. 3 and 4). Additional comparator circuitry (15), quantizers (16), and encoding circuitry (19) can be part of the same integrated circuit as the array (11).

Claims

1. A method of using a CMOS sensor array to perform a spatial to frequency transform of analog signals from sensor elements of said array, said transform being characterized by a basis function, comprising the steps of:

applying a pulsewidth modulated wordline signal to at least one sensor element of said array;

applying a pulsewidth modulated bitline signal to said at least one sensor element;

wherein the coincidence of said pulsewidths has a duration corresponding to a product of coefficients of said basis function;

accumulating a current from said at least one sensor element during said coincidence; and

repeating said applying and accumulating steps as required by said transform.

2. The method of claim 1, wherein said basis function corresponds to a discrete cosine transform.

3. The method of claim 1, wherein said step of accumulating a current is performed for a positive and negative output of said sensor element.

4. The method of claim 1, wherein said transform is performed on blocks of sensor elements and said steps of applying pulses are performed for all wordlines of a block and all bitlines of said array simultaneously.

5. The method of claim 1, wherein said applying steps are performed with pulsewidths that correspond to separable coefficients of said basis function.

6. The method of claim 1, wherein said step of applying a pulsewidth modulated bitline signal is performed with repeated pulses of said bitline signal.

7. An integrated circuit for acquiring images and performing a spatial to frequency transform of analog signals representing said image, said transform being characterized by a basis function, comprising:

a CMOS sensor array, having rows and columns of sensor elements, each row of sensor elements having an associated wordline and each column of sensor elements having an associated bitline;

wordline driver circuitry operable to provide wordline activation signals on said wordlines;

bitline driver circuitry operable to provide bitline activation signals on said bitlines;

column circuitry operable to accumulate current from said columns; and

a pulsewidth timing unit for controlling pulse widths of said wordline activation signals and said bitline activation signals wherein said pulse widths of said wordline activation signals and said bitline activation signals correspond to a product of coefficients of said basis function for corresponding sensor elements.

8. The circuit of claim 7, wherein each said bitline is bifurcated having a positive bitline providing a positive output and a negative bitline providing a negative output, said column circuitry accumulating current from a selected on of said positive bitline on said negative bitline depending on a sign of a corresponding base function.

9. The circuit of claim 7, further comprising comparators operable to determine whether said current exceeds a predetermined fixed threshold.

10. The circuit of claim 7, further comprising analog-to-digital converters operable to convert said current to a digital value.

11. The circuit of claim 8 further comprising first comparators connected to positive bitlines operable to determine whether a current exceeds a first predetermined fixed threshold and second comparators connected to negative bitlines operable to determine whether a current is less than a second predetermined fixed threshold.

12. The circuit of claim 11 wherein said first predetermined fixed threshold and said second predetermined fixed threshold are zero.

13. The circuit of claim 9 wherein said predetermined fixed threshold is zero.