Wafer probe station

• US 6,424,141 B1
• Filed: 07/13/2000
• Issued: 07/23/2002
• Est. Priority Date: 07/13/2000
• Status: Expired due to Term

• Current Assignee: The Micromanipulator Company Incorporated (FormFactor Incorporated)
• Original Assignee: The Micromanipulator Company Incorporated (FormFactor Incorporated)
• Inventors: Hollman, Kenneth F., Harrison, Daniel L.
• Primary Examiner(s): KARLSEN, ERNEST F
• Application Number:
  US09/615,454
• Time in Patent Office: 740 Days
• Field of Search: 324/158.1, 324/754, 324/760, 324/765, 324/537, 174/35.R, 174/35.MS, 438/17
• US Class Current: 324/750.19
• CPC Class Codes: G01R 1/025 concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards G01R31/31912 takes precedence
• CPC Class Codes: G01R 1/18 Screening arrangements against electric or magnetic fields, e.g. against earth's field
• CPC Class Codes: G01R 31/281 Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing G01R31/2818 takes precedence
• CPC Class Codes: G01R 31/2851 Testing of integrated circuits [IC] G01R31/317 takes precedence; testing individual devices G01R31/26; testing printed circuits G01R31/2801
• CPC Class Codes: G01R 31/2886 Features relating to contacting the IC under test, e.g. probe heads; chucks G01R31/2865 takes precedence, test connections, e.g. test sockets, or probes per se, G01R1/04 or G01R1/06
• CPC Class Codes: G01R 31/2889 Interfaces, e.g. between probe and tester G01R31/31905 and G01R1/07364 take precedence

Abstract

The invention relates to a chuck apparatus for a wafer probe station in which the central conductive surface supports a device-under-test (DUT) over a conductive lower chuck portion. An insulator positions the center conductor surface of the chuck above the lower chuck portion and also positions an electrically isolated conductor along its periphery. A laterally extending shielding element is provided for shielding electromagnetic interference (EMI) from the center conductor surface and the lower chuck portion. The electrically isolated conductor and the conductive lower chuck portion may cooperate to form a line-of-sight electrical barrier between the center conductor surface and the laterally extending shielding element The invention further relates to methods of manufacturing the chuck apparatus and using the apparatus to accomplish low current and voltage tests in a probe station.

Claims

1. A chuck apparatus for a wafer probe station, comprising:

a laterally extending electrical insulator having an upper surface;

a first conductive member disposed on the upper surface of said insulator for supporting a wafer device under test, said insulator supported on a second conductive member, the outer edge of the first conductive member being spaced from the outer edge of the insulator;

a third conductive member isolated from and spaced below said second conductive member; and

an electrically isolated fourth conductive member disposed on the upper surface of said insulator in spaced relation to the outer edge of said first conductive member.

2. The chuck apparatus recited in claim 1, wherein said second and fourth conductive members form an electrical barrier between said first conductive member and said third conductive member.

3. A chuck apparatus as recited in claim 1, wherein said second conductive member comprises one or more temperature control elements enclosed therein.

4. The chuck apparatus recited in claim 1, wherein said third conductive member has a laterally extending portion and a portion extending vertically opposite the side surface of the second conductive member.

5. A chuck apparatus as recited in claim 1, wherein the area of the upper surface of said laterally extending electrical insulator is larger than the area of the upper surface of said first conductive member disposed thereon.

6. A chuck apparatus as recited in claim 1, wherein said fourth conductive member is at the periphery of said insulator.

7. A chuck apparatus as recited in claim 6, wherein said fourth conductive member extends vertically along the sides of the insulator.

8. A chuck apparatus as recited in claim 1, wherein said first and second conductive members and said insulator each have a circular upper surface and said fourth conductive member comprises a ring concentric with said first conductive member.

9. A chuck apparatus as recited in claim 8, wherein the diameter of said insulator is larger than the diameter of said second conductive member.

10. A chuck apparatus as recited in claim 9, wherein said fourth conductive member extends vertically along the sides of the insulator and laterally along at least a portion of the bottom surface of the insulator.

11. A chuck apparatus as recited in claim 8, wherein the diameter of said insulator is the same as the diameter of said second conductive member.

12. A chuck apparatus as recited in claim 1, wherein said second, third and fourth conductive members are adapted for coupling to electric potentials.

13. A chuck apparatus as recited in claim 12, wherein said second and fourth conductive members are adapted for being coupled to a coaxial cable assembly for providing electric potentials, and said third conductive member is adapted for being coupled to an electric ground potential.

14. A chuck apparatus as recited in claim 12, wherein said second, third and fourth conductive members are adapted for being coupled to a triaxial cable assembly for providing electric potentials.

15. A chuck apparatus as recited in claim 12, wherein said second and fourth conductive members are raised to substantially the same electric potential as said first conductive member to reduce the effects of capacitance and noise at said device under test.

16. A chuck apparatus as recited in claim 1, wherein said second and fourth conductive members form a line-of-sight electrical barrier between said first conductive member and said third conductive member to reduce parasitic capacitance.

17. A chuck apparatus as recited in claim 4, wherein the vertically extending portion of said third conductive member terminates below the first conductive member.

18. A chuck apparatus as recited in claim 4, wherein the vertically extending portion of said third conductive member terminates below the insulator.

19. A chuck apparatus as recited in claim 1, wherein said second conductive element includes a central recess in its upper surface and said insulator includes a thicker central portion adapted to mate with said recess.

20. A chuck apparatus as recited in claim 1, wherein the upper surface of said first conductive member lies in a horizontal plane above the upper surface of said insulator.

21. A chuck apparatus as recited in claim 1, wherein the first conductive member is disposed in a recess in said insulator such that the upper surface of said first conductive member lies in a horizontal plane below the upper surface of said insulator.

22. A chuck apparatus as recited in claim 1, wherein said the first conductive member is disposed in a recess in said insulator such that the upper surface of said first conductive member and said upper surface of said insulator lie in the same horizontal plane.

23. A chuck apparatus as recited in claim 1, wherein the fourth conductive member is disposed in a groove in said insulator such that the upper surface of the fourth conductive member and the upper surface of the first conductive member lie in the same horizontal plane.

24. The chuck apparatus as recited in claim 1, wherein the fourth conductive member is disposed in a groove in said insulator such that the upper surface of the fourth conductive member lies in a horizontal plane below the upper surface of the first conductive member.

25. A probe station for inspecting a device under test comprising:

a frame having opposite vertically disposed supports,

a horizontally extending platen supported on said frame,

a chuck apparatus for supporting the device under test positioned within said frame, and

a holder supported on said platen for holding a probe for contacting said device under test,

said chuck apparatus further comprising;

a laterally extending electrical insulator having an upper surface;

a first conductive member disposed on the upper surface of said insulator for supporting a wafer device under test, said insulator supported on a second conductive member, the outer edge of the first conductive member being spaced from the outer edge of the insulator;

a third conductive member isolated from and spaced below said second conductive member; and

an electrically isolated fourth conductive member disposed on the upper surface of said insulator in spaced relation to the outer edge of said first conductive member.