Proximity detector for hard-to-detect materials

• US 6,446,012 B1
• Filed: 06/23/1999
• Issued: 09/03/2002
• Est. Priority Date: 06/23/1999
• Status: Expired due to Term

• Current Assignee: BECS Technology, Inc.
• Original Assignee: BFCS Technology Incorporated
• Inventors: Livingston, Richard A., Macke, David C. Sr., Metcalf, Jon G., Chamberlain, Roger D.
• Primary Examiner(s): Hoff, Marc S.
• Assistant Examiner(s): TSAI, CAROL S W
• Application Number:
  US09/338,366
• Time in Patent Office: 1,168 Days
• Field of Search: 702/33, 702/45, 702/47, 702/50, 702/52, 702/53, 702/55, 702/57, 702/65, 702/64, 702/100, 702/108, 702/113, 702/114, 702/127, 702/150, 702/152, 702/155-158, 702/166, 702/183, 702/184, 702/188, 702/189, 702/FOR-103, 702/FOR-105, 702/FOR-123, 702/FOR-127, 702/FOR-134, 702/FOR.141, 702/FOR.144, 700/281, 324/681, 324/682, 324/674, 324/675, 331/65, 331/182, 331/117, 331/183, 331/175, 331/176, 340/507, 340/620
• US Class Current: 702/22
• CPC Class Codes: G08B 13/26 by proximity of an intruder causing variation in capacitance or inductance of a circuit
• CPC Class Codes: H03K 17/955 using a capacitive detector
• CPC Class Codes: H03K 2017/9602 characterised by the type or shape of the sensing electrodes

Abstract

A proximity detection system for detecting the proximity of conventionally hard-to-detect materials having a complex permittivity and/or a complex permeability is disclosed. The system includes an oscillator for producing an output signal, the oscillator having a transistor with an open and a closed loop gain and a base-emitter junction that rectifies resonant signals at the collector to produce the output signal. The oscillator includes negative feedback including a resistive element coupled to the emitter for reducing the sensitivity of the closed loop gain to variations in the transistor'"'"'s open loop gain and a capacitive element coupling the resistive element to the collector for stabilizing the frequency of the oscillator. The detection system further includes a sensor coupled to the oscillator for varying the level of the oscillator output signal in response to certain electrical properties of the material. Control means are also included operatively coupled to the oscillator to receive the oscillator output signal and respond to variations of predetermined magnitudes of the amplitudes of the oscillator output signal for detecting the presence or level of the material. The sensor is designed to reposition the polarization orientation of the electric field lines extending therefrom such that the field lines extend a greater distance outwardly from the surface of the sensor.

Claims

1. A proximity detection system for detecting the presence or level of material comprising:

an oscillator that produces an output signal, the oscillator comprising a transistor having a base, an emitter and a collector, the transistor having an open and a closed loop gain and a base-emitter junction that rectifies resonant signals at the collector to produce the output signal, the oscillator further comprising negative feedback for reducing the sensitivity of the closed loop gain to variations in the transistor'"'"'s open loop gain and for stabilizing the frequency of the oscillator;

a sensor operatively coupled to the oscillator for varying the level of the oscillator output signal in response to electrical properties of the material; and

a controller operatively coupled to the oscillator to receive the oscillator output signal and being responsive to variations of predetermined magnitudes of the amplitudes of the oscillator output signal for detecting the presence or level of the material,

wherein the oscillator and the sensor have a merit factor Q, the merit factor Q decreasing as the sensor is placed in proximity to the material and wherein the amplitude of the oscillations of the oscillator will correspondingly diminish as the merit factor Q decreases, and wherein the oscillator output signal indicates the amplitude of the diminished oscillations.

2. The proximity detection system of claim 1 wherein the negative feedback comprises a feedback resistive element having a first node connected to the emitter and a second node connected to a ground potential through a first capacitive element, the second node further connected to the ground potential through a first inductive element in series with a first and second resistive elements, and a feedback capacitive element connected to the second node of the feedback resistive clement and the collector, and wherein

the oscillator further comprises:

second and third inductive elements connected in series between a power source and the collector;

a second capacitive element connected between the second and third inductive elements and the ground potential; and

a fourth inductive element connecting the base to the ground potential.

3. The proximity detection system of claim 1 wherein the material to be detected has a low permittivity.

4. A proximity detection system for detecting the presence or level of material comprising:

an oscillator that produces an output signal, the oscillator comprising a transistor having a base, an emitter and a collector, the transistor having an open and a closed loop gain and a base-emitter junction that rectifies resonant signals at the collector to produce the output signal, the oscillator further comprising negative feedback for reducing the sensitivity of the closed loop gain to variations in the transistor'"'"'s open loop gain and for stabilizing the frequency of the oscillator;

a sensor operatively coupled to the oscillator for varying the level of the oscillator output signal in response to electrical properties of the material, wherein the sensor has electrical field lines extending outwardly therefrom, and wherein the sensor is adapted to reposition the polarization orientation of the field lines so that the lines extend substantially normal to the surface of the sensor; and

a controller operatively coupled to the oscillator to receive the oscillator output signal and being responsive to variations of predetermined magnitudes of the amplitudes of the oscillator output signal for detecting the presence or level of the material.

5. The proximity detection system of claim 4 wherein the sensor comprises two substantially flat co-planar plates having a lateral separation region therebetween, the sensor having electric field lines extending between the two plates with a polarization orientation normal to the surface of the sensor.

6. The proximity detection system of claim 5 wherein the lateral separation region is sized to control and position the electric field lines extending from the sensor to allow the sensor to respond to material properties in a larger or smaller spatial region in proximity to the sensor.

7. The proximity detection system of claim 5 wherein each plate has a proximal and a distal surface in relation to the material to be detected, and wherein the sensor comprises a film of dielectric material tapered across the proximal surfaces of the plates for repositioning the polarization orientation of the field lines.

8. The proximity detection system of claim 4 wherein the sensor comprises a flat signal plate having a proximal surface oriented in a direction toward the material to be detected and a distal surface, and a ground potential return plate, the ground potential return plate positioned substantially perpendicular and adjacent to the distal surface, for repositioning the polarization orientation of the field lines.

9. The proximity detection system of claim 8 wherein the sensor further comprises a film of dielectric material tapered -across the proximal surface of the signal plate for repositioning the polarization orientation of the field lines further.

10. A sensor for use with a proximity detector adapted to detect the presence of material, the detector comprising an oscillation circuit, the sensor being electrically coupled to the oscillation circuit and having electrical field lines extending outwardly from a surface of the sensor, the sensor adapted to reposition the polarization orientation of the field lines so that the lines extend substantially normal to the surface of the sensor.

11. The sensor of claim 10 further comprising two substantially flat co-planar plates having a lateral separation region therebetween, the sensor having electric field lines extending between the two plates with a polarization orientation normal to the surface of the sensor.

12. The sensor of claim 11 wherein the lateral separation region is sized to control and position the electric field lines extending from the sensor to allow the sensor to respond to material properties in a larger or smaller spatial region in proximity to the sensor.

13. The sensor of claim 12 wherein each plate has a proximal and a distal surface in relation to the material to be detected, and wherein the sensor comprises a film of dielectric material tapered across the proximal surfaces of the plates to reposition the polarization orientation of the field lines.

14. The sensor of claim 10 further comprising a flat signal plate having a proximal surface oriented in a direction toward the material to be detected and a distal surface, and a ground potential return plate, the ground potential return plate positioned substantially perpendicular and adjacent to the distal surface, to reposition the polarization orientation of the field lines.

15. The sensor of claim 14 further comprising a film of dielectric material tapered across the proximal surface of the signal plate to reposition the polarization orientation of the field lines.

16. A sensor for use with a proximity detector adapted to detect the presence of material and having electrical field lines extending outwardly from a surface of the sensor, the sensor adapted to reposition the polarization orientation of the field lines so that the lines extend substantially normal to the surface of the sensor.

17. The sensor of claim 16 further comprising two substantially flat co-planar plates having a lateral separation region therebetween, the sensor having electric field lines extending between the two plates with a polarization orientation normal to the surface of the sensor.

18. The sensor of claim 16 wherein the lateral separation region is sized to control and position the electric field lines extending from the sensor to allow the sensor to respond to material properties in a larger or smaller spatial region in proximity to the sensor.

19. The sensor of claim 18 wherein each plate has a proximal and a distal surface in relation to the material to be detected, and wherein the sensor comprises a film of dielectric material tapered across the proximal surfaces of the plates to reposition the polarization orientation of the field lines.

20. The sensor of claim 16 further comprising a flat signal plate having a proximal surface oriented in a direction toward the material to be detected and a distal surface, and a ground potential return plate, the ground potential return plate positioned substantially perpendicular and adjacent to the distal surface, to reposition the polarization orientation of the field lines.

21. The sensor of claim 20 further comprising a film of dielectric material tapered across the proximal surface of the signal plate to reposition the polarization orientation of the field lines.