Eddy-current flaw detector probe
First Claim
1. An eddy current flaw detector comprising:
- a pair of excitation coils which generates an alternating magnetic filed to generate an eddy current in a specimen; and
a pair of detection coils differentially connection and arranged in phase;
wherein a central portion of the pair of detection coils and a central portion of the pair of excitation coils are arranged to be located at an identical or an almost identical position in a plan view taken in a direction toward the specimen, and a flaw on the specimen is detected based on a difference between voltages generated in the pair of detection coils due to the eddy current.
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Accused Products
Abstract
The present invention relates to an eddy current testing probe, which is suitable for used in a nondestructive test. The eddy current testing probe is provided with an excitation coil (2, 2a, 2b) which generates an alternating magnetic field to generate an eddy current (12) in a specimen (10), and a pair of detection coils (1a, 1b) differentially connected and arranged in phase. A central portion (C1) of the pair of detection coils and a central portion (C2) of the excitation coil (2, 2a, 2b) are arranged to be located at an identical or an almost identical position in a plan view taken in the direction toward the specimen (10), and a flaw (11) on the specimen (10) is detected based on a difference between voltages generated in the pair of detection coils (1a, 1b) due to the eddy current (12).
37 Citations
24 Claims
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1. An eddy current flaw detector comprising:
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a pair of excitation coils which generates an alternating magnetic filed to generate an eddy current in a specimen; and
a pair of detection coils differentially connection and arranged in phase;
wherein a central portion of the pair of detection coils and a central portion of the pair of excitation coils are arranged to be located at an identical or an almost identical position in a plan view taken in a direction toward the specimen, and a flaw on the specimen is detected based on a difference between voltages generated in the pair of detection coils due to the eddy current. - View Dependent Claims (2, 3, 4, 5, 6, 23)
wherein the pair of detection coils and the pair of excitation coils are arranged so that a centerline of symmetry of the detection coils is perpendicular to a centerline of symmetry of the excitation coils in the plan view of the specimen.
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7. An eddy current flaw detector for detecting a flaw on a specimen comprising:
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a plurality of excitation coils for generating an alternating magnetic field to generate an eddy current in the specimen while the specimen is moved relatively with respect to said detector; and
a plurality of thin-film detection coil rows, said each thin-film detection coil row comprises a plurality of thin-film detection coils which are arranged in a row along the specimen, for detecting a flaw on the specimen based on said eddy current generated by said plural excitation coils;
said plural thin-film detection coil rows arranged one over another, and a centerline of each of said plural thin-film detection coil rows extending in an alignment with the centerline of any of the remaining thin-film detection coil rows in the plan view. - View Dependent Claims (8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22)
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24. An eddy current flaw detector for detecting a flaw on a specimen comprising:
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means for generating an alternating magnetic field to generate an eddy current in the specimen while the specimen is moved relatively with respect to said detector; and
a plurality of thin-film detection coil rows, said each thin-film detection coil row comprises a plurality of thin-film detection coils which are arranged in a row along the specimen, for detecting a flaw on the specimen based on said eddy current generated by said generating means;
said plural thin-film detection coil rows arranged one over another, and a centerline of each of said plural thin-film detection coil rows extending in alignment with the centerline of those of any of the remaining thin-film detection coil rows in the plan view.
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Specification