System and method for power testing a chassis

• US 6,507,210 B1
• Filed: 11/22/2000
• Issued: 01/14/2003
• Est. Priority Date: 11/22/2000
• Status: Expired due to Term

• Current Assignee: ServStor Technologies, LLC (IP Investments Group LLC)
• Original Assignee: Ulysses ESD, Inc.
• Inventors: Olson, Philip D.
• Primary Examiner(s): Sherry, Michael
• Assistant Examiner(s): TANG, MINH NHUT
• Application Number:
  US09/721,346
• Time in Patent Office: 783 Days
• Field of Search: 324/771, 324/772, 324/158.1, 324/765, 324/427, 324/761, 324/763, 324/117.R, 361/600, 361/720, 361/731, 361/736, 361/788, 710/300, 710/301, 702/119, 702/122, 702/123, 702/126, 340/653, 340/660, 714/22
• US Class Current: 324/764.01
• CPC Class Codes: G01R 31/2806 Apparatus therefor, e.g. test stations, drivers, analysers, conveyors G01R31/2805, G01R31/281, G01R31/2818 take precedence
• CPC Class Codes: G06F 11/24 Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests

Abstract

A load test board is configured for plugging into a backplane of a chassis. The load test board has a CPU, a variable load controlled by the CPU, a voltage sensor to detect voltage across the variable load, and a current sensor to detect current through the variable load. To test the chassis, one or more of the load text boards are plugged into the backplane of the chassis. Each load test board provides a variable load, using circuitry on the test board to control the variable load, and measures current through the variable load and voltage across the variable load. Information corresponding to the measurements is conveyed to a host computer.

Claims

1. Test apparatus comprising:

a load test board configured for plugging into a backplane of a chassis;

the load test board including;

a CPU;

a variable load controlled by the CPU;

a voltage sensor to detect voltage across the variable load; and

a current sensor to detect current through the variable load.

2. The test apparatus of claim 1 further including a control program, executed by the CPU, for setting the variable load in response to commands from a host computer.

3. The test apparatus of claim 1 further including a communication interface for receiving commands from a host computer and for sending testing information to the host computer.

4. The test apparatus of claim 3 wherein the CPU includes an analog to digital converter coupled to the voltage and current sensors for converting input analog signals into digital signals.

5. The test apparatus of claim 4 wherein

the analog to digital converter converts input analog signals from the voltage and current sensors into digital signals representing voltage and current measurements; and

the CPU executes a control program that responds to the received commands by setting the variable load in response to the received commands and that generates messages including information corresponding to the digital signals representing voltage and current measurements and sending the generated messages to the host computer via the communication interface.

6. A chassis comprising:

a backplane;

a load test board plugged into the backplane, comprising;

a CPU;

a variable load controlled by the CPU

a voltage sensor to detect voltage across the variable load; and

a current sensor to detect current through the variable load.

7. The chassis of claim 6, wherein the backplane is coupled to a host computer.

8. The chassis of claim 6, wherein the load test board further includes a control program, executed by the CPU, for setting the variable load in response to commands from a host computer.

9. The chassis of claim 8, wherein the load test board further includes a communication interface for receiving commands from the host computer and for sending testing information to the host computer.

10. The chassis of claim 9, wherein the CPU of the load test board includes an analog to digital converter coupled to the voltage and current sensors for converting input analog signals into digital signals.

11. The chassis of claim 10 wherein

the analog to digital converter converts input analog signals from the voltage and current sensors into digital signals representing voltage and current measurements; and

the control program executed by the CPU generates messages including information corresponding to the digital signals representing voltage and current measurements and sending the generated messages to the host computer via the communication interface.

12. The chassis of claim 10, wherein the load test board comprises a plurality of load test boards, each load test board of the plurality of load test boards comprising:

a CPU;

a variable load controlled by the CPU;

a voltage sensor to detect voltage across the variable load; and

a current sensor to detect current through the variable.

13. The chassis of claim 12, wherein each load test board of a subset of the plurality of load test boards further includes a control program, executed by the CPU of the load test board, for setting the variable load in response to commands from a host computer.

14. The chassis of claim 13, wherein each load test board of the subset of the plurality of load test boards further includes a communication interface for receiving commands from the host computer and for sending testing information to the host computer.

15. The chassis of claim 14, wherein the CPU of each load test board of the subset of the plurality of load test boards includes an analog to digital converter coupled to the voltage and current sensors for converting input analog signals into digital signals.

16. The chassis of claim 13 wherein

the analog to digital converter of each load test board of the subset of the plurality of load test boards converts input analog signals from the voltage and current sensors into digital signals representing voltage and current measurements;

and

the control program executed by the CPU of each load test board generates messages including information corresponding to the digital signals representing voltage and current measurements and sending the generated messages to the host computer via the communication interface.

17. The chassis of claim 16, further including a temperature sensor operatively coupled to the host computer to enable the host computer to correlate absorbed power with temperature in the chassis.

18. The chassis of claim 13, further including a temperature sensor operatively coupled to the host computer to enable the host computer to correlate absorbed power with temperature in the chassis.

19. The chassis of claim 7, further including a temperature sensor operatively coupled to the host computer to enable the host computer to correlate absorbed power with temperature in the chassis.

20. A method of testing a chassis comprising the steps of:

inserting a test board into a backplane of the chassis;

providing a variable load on the test board;

using circuitry on the test board to control the variable load; and

measuring current through the variable load and voltage across the variable load.

21. The method of claim 20 wherein the using step includes executing a control program, using a CPU on the test board, to set the variable load in response to commands from a host computer.

22. The method claim 20 further including the step of receiving commands from a host computer and sending testing information to the host computer corresponding to measurements generated by the measuring step.

23. The method claim 20 further including converting voltage and current measurements generated by the measuring step into digital values, and sending information to a host computer corresponding to the digital values.