System for measuring polarimetric spectrum and other properties of a sample

  • US 6,611,330 B2
  • Filed: 02/06/2001
  • Issued: 08/26/2003
  • Est. Priority Date: 02/09/1999
  • Status: Expired due to Term
First Claim
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1. A method for measuring optically detectable properties of a sample, comprising:

  • focusing a polarized sample beam of broadband radiation onto the sample, said beam having a multitude of polarization states;

    collecting radiation modified by the sample by means of an objective; and

    analyzing and dispersing the radiation modified by and collected from the sample to provide a polarimetric spectrum, wherein no substantial relative change in polarization state between the radiation and the sample beam is caused by relative motion between optical elements employed in the focusing, collecting and analyzing; and

    deriving information on optically detectable properties of the sample from said polarimetric spectrum.

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