Calibration artifact and method of using the same

• US 6,704,102 B2
• Filed: 02/06/2001
• Issued: 03/09/2004
• Est. Priority Date: 02/06/2001
• Status: Expired due to Fees

• Current Assignee: HEIDENHAIN Corp. (Dr. Johannes Heidenhain GmbH)
• Original Assignee: Metronics, Inc.
• Inventors: Roelke, Richard
• Primary Examiner(s): Epps, Georgia
• Assistant Examiner(s): HASAN, MOHAMMED A
• Application Number:
  US09/777,529
• Publication Number:
  US 20020105639A1
• Time in Patent Office: 1,127 Days
• Field of Search: 356/243--24, 335/01--73, 250/252.1
• US Class Current: 356/243.1
• CPC Class Codes: G01B 11/024 by means of diode-array scanning
• CPC Class Codes: G01B 11/08 for measuring diameters
• CPC Class Codes: G01B 21/042 Calibration or calibration artifacts G01B3/30, G01B9/02072 take precedence

Abstract

A calibration artifact and a method of calibrating a machine vision measurement system. The calibration artifact includes a substrate and a number of concentric rings on one surface of the substrate. Each ring is of a different pre-defined size. The change in the size of any two adjacent rings is different than the change in size of any other two adjacent rings.

Claims

1. A calibration artifact for calibrating a machine vision measurement system, the calibration artifact comprising:

a rigid substrate; and

a plurality of concentric rings on one surface of the substrate, each ring of a different pre-defined size and wherein the change between the size of any two rings is different than the change in size of any other two adjacent rings.

2. The calibration artifact of claim 1 in which each ring has an inner edge and an outer edge.

3. A calibration artifact for a machine vision measurement system, the calibration artifact comprising:

a substrate; and

a plurality of concentric shapes on one surface of the substrate, each shape of a different pre-defined size and wherein the change between the size of any two adjacent shapes is different than the change in size between any other two adjacent shapes.

4. A calibration system comprising:

a calibration artifact including;

a substrate; and

a plurality of concentric rings on one surface of the substrate, each ring of a different pre-defined size and wherein the change between the size of any two adjacent rings is different than the change between the size of any other two adjacent rings; and

a software algorithm including a database containing the size of each ring and data reflecting the change in size between each pair of adjacent rings.