Apparatus and method for testing socket
First Claim
1. The socket testing apparatus comprising:
- a contact unit for obtaining resistance values of respective channels of a calibration PCB and resistance values of respective channels of a socket-installed PCB;
a multiplexer for channeling the respective resistance values from the contact unit so as to output the resistance values of the respective channels in a sequential manner;
a resistance measurement part for storing the respective output resistance values of the multiplexer into a memory, and for calculating differences between the mentioned resistance values and the resistance values of the respective channels of a socket-installed PCB;
a controller for controlling operations of respective elements, and for outputting the output calculation value of the resistance measurement part to a display part; and
the display part displaying an output of the controller wherein the contact unit comprises;
a measurement table with the calibration PCB or the socket-installed PCB mounted thereupon;
a contact structure installed thereupon, for contacting to the calibration PCB or to the socket-installed PCB so as to form a closed circuit loop; and
a first moving means for moving the contact structure up and down, so as to make it contacted to pads of the calibration PCB or to contactors of the socket.
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Accused Products
Abstract
An apparatus and a method for testing a socket are disclosed. The resistance values of the contactor pins of the socket can be precisely measured, and the measurement is made automatic so as to decrease the expense and manpower. The method includes the following steps. That is, a calibration PCB is formed into a closed circuit, and all the resistance values forming a closed circuit loop for respective channels are extracted and stored (first step). A socket-installed PCB is formed into a closed circuit, and all resistance values forming a closed circuit loop for respective channels are extracted and stored (second step). Differences between the resistance values of the respective channels of the calibration PCB and the resistance values of the respective channels of the socket-installed PCB are calculated (third step). The differences thus calculated are displayed to a screen for the respective channels (fourth step).
2 Citations
8 Claims
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1. The socket testing apparatus comprising:
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a contact unit for obtaining resistance values of respective channels of a calibration PCB and resistance values of respective channels of a socket-installed PCB;
a multiplexer for channeling the respective resistance values from the contact unit so as to output the resistance values of the respective channels in a sequential manner;
a resistance measurement part for storing the respective output resistance values of the multiplexer into a memory, and for calculating differences between the mentioned resistance values and the resistance values of the respective channels of a socket-installed PCB;
a controller for controlling operations of respective elements, and for outputting the output calculation value of the resistance measurement part to a display part; and
the display part displaying an output of the controller wherein the contact unit comprises;
a measurement table with the calibration PCB or the socket-installed PCB mounted thereupon;
a contact structure installed thereupon, for contacting to the calibration PCB or to the socket-installed PCB so as to form a closed circuit loop; and
a first moving means for moving the contact structure up and down, so as to make it contacted to pads of the calibration PCB or to contactors of the socket. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A socket testing method comprising the steps of:
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forming a calibration PCB into a closed circuit, and extracting and storing all resistance values forming a closed circuit loop for respective channels (first step);
forming a socket-installed PCB into a closed circuit, and extracting and storing all resistance values forming a closed circuit loop for respective channels (second step);
calculating differences between the resistance values of the respective channels of the calibration PCB and the resistance values of the respective channels of the socket-installed PCB (third step); and
displaying the differences thus calculated to a screen for the respective channels (fourth step), wherein the screen of the fourth step displays;
frequencies of occurrences of channels within a particular resistance value range when the calibration PCB is measured, frequencies of occurrences of channels within a particular resistance value range when the socket-installed PCB is measured, and frequencies of occurrences of differences between the channels of the two PCBs, in a sequential manner at a left portion of the screen; and
differences of resistance values of the respective channels between the calibration PCB and the socket-installed PCB at a right portion of the screen.
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8. A socket testing method comprising the steps of:
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forming a calibration PCB into a closed circuit, and extracting and storing all resistance values forming a closed circuit loop for respective channels (first step);
forming a socket-installed PCB into a closed circuit, and extracting and storing all resistance values forming a closed circuit loop for respective channels (second step);
calculating differences between the resistance values of the respective channels of the calibration PCB and the resistance values of the respective channels of the socket-installed PCB (third step); and
displaying the differences thus calculated to a screen for the respective channels (fourth step) wherein the screen of the fourth step displays;
frequencies of occurrence differences between the channels of the calibration PCB and the socket-installed PCB within a particular resistance value range at a left upper portion of the screen;
a statistical window for measured data at a left lower portion of the screen;
numerical resistance values of the respective channels at a right upper portion of the screen; and
magnitudes of resistance values of the respective channels graphically and visually at a right lower portion of the screen.
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Specification