Method of fabricating a light emitting device
First Claim
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1. A method of fabricating a light emitting device, comprising the steps of:
- forming a semiconductor film on an insulator;
forming a gate insulating film covering the semiconductor film;
forming a first conductive film and a second conductive film on the gate insulating film;
forming an electrode made of the second conductive film by etching the second conductive film;
adding an n-type impurity element to the semiconductor film by self-alignment using the electrode made of the second conductive film as a mask;
forming an electrode made of the first conductive film by etching the first conductive film by self-alignment using the electrode made of the second conductive film as a mask after forming the electrode made of the second conductive film;
forming a second gate electrode by narrowing a line width of the electrode made of the second conductive film by etching;
adding an n-type impurity element to the semiconductor film by self-alignment using the second gate electrode as a mask; and
forming a first gate electrode by narrowing a line width of the electrode made of the first conductive film by etching.
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Abstract
There is provided an inexpensive light emitting device and an electronic instrument using the same. In this invention, photolithography steps relating to manufacture of a transistor are reduced, so that the yield of the light emitting device is improved and the manufacturing period thereof is shortened. A feature is that a gate electrode is formed of conductive films of plural layers, and by using the selection ratio of those at the time of etching, the concentration of an impurity region formed in an active layer is adjusted.
108 Citations
32 Claims
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1. A method of fabricating a light emitting device, comprising the steps of:
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forming a semiconductor film on an insulator;
forming a gate insulating film covering the semiconductor film;
forming a first conductive film and a second conductive film on the gate insulating film;
forming an electrode made of the second conductive film by etching the second conductive film;
adding an n-type impurity element to the semiconductor film by self-alignment using the electrode made of the second conductive film as a mask;
forming an electrode made of the first conductive film by etching the first conductive film by self-alignment using the electrode made of the second conductive film as a mask after forming the electrode made of the second conductive film;
forming a second gate electrode by narrowing a line width of the electrode made of the second conductive film by etching;
adding an n-type impurity element to the semiconductor film by self-alignment using the second gate electrode as a mask; and
forming a first gate electrode by narrowing a line width of the electrode made of the first conductive film by etching. - View Dependent Claims (7, 13, 19, 25)
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2. A method of fabricating a light emitting device, comprising the steps of:
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forming a semiconductor film on an insulator;
forming a gate insulating film covering the semiconductor film;
forming a first conductive film and a second conductive film on the gate insulating film;
forming an electrode made of the second conductive film by etching the second conductive film;
adding an n-type impurity element to the semiconductor film by using the electrode made of the second conductive film as a mask and by making the n-type impurity element pass through the first conductive film;
forming an electrode made of the first conductive film by etching the first conductive film by self-alignment using the electrode made of the second conductive film as a mask;
forming a second gate electrode by narrowing a line width of the electrode made of the second conductive film by etching;
adding an n-type impurity element to the semiconductor film by using the second gate electrode as a mask and by making the n-type impurity element pass through the electrode made of the first conductive film; and
forming a first gate electrode by narrowing a line width of the electrode made of the first conductive film by etching. - View Dependent Claims (8, 14, 20, 26)
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3. A method of fabricating an electrical appliance having a light emitting device, comprising the steps of:
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forming a semiconductor film on an insulator;
forming a gate insulating film covering the semiconductor film;
forming a first conductive film and a second conductive film on the gate insulating film;
forming an electrode made of the second conductive film by etching the second conductive film;
adding an impurity element to the semiconductor film by self-alignment using the electrode made of the second conductive film as a mask;
forming an electrode made of the first conductive film by etching the first conductive film by self-alignment using the electrode made of the second conductive film as a mask after forming the electrode made of the second conductive film;
forming a second gate electrode by narrowing a line width of the electrode made of the second conductive film by etching;
adding an impurity element to the semiconductor film by self-alignment using the second gate electrode; and
forming a first gate electrode by narrowing a line width of the electrode made of the first conductive film by etching. - View Dependent Claims (9, 15, 21, 27, 31)
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4. A method of fabricating an electrical appliance having a light emitting device, comprising the steps of:
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forming a semiconductor film on an insulator;
forming a gate insulating film covering the semiconductor film;
forming a first conductive film and a second conductive film on the gate insulating film;
forming an electrode made of the second conductive film by etching the second conductive film;
adding an n-type impurity element to the semiconductor film by using the electrode made of the second conductive film as a mask and by making the n-type impurity element pass through the first conductive film;
forming an electrode made of the first conductive film by etching the first conductive film by self-alignment using the electrode made of the second conductive film as a mask;
forming a second gate electrode by narrowing a line width of the electrode made of the second conductive film by etching;
adding an n-type impurity element to the semiconductor film by using the second gate electrode as a mask and by making the n-type impurity element pass through the electrode made of the first conductive film; and
forming a first gate electrode by narrowing a line width of the electrode made of the first conductive film by etching. - View Dependent Claims (10, 16, 22, 28, 32)
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5. A method of fabricating a light emitting device having at least one thin film transistor in a pixel portion, comprising the steps of:
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forming a semiconductor film on an insulator;
forming a gate insulating film covering the semiconductor film;
forming a first conductive film and a second conductive film on the gate insulating film;
forming an electrode made of the second conductive film by etching the second conductive film;
adding a p-type impurity element to the semiconductor film by self-alignment using the electrode made of the second conductive film;
forming an electrode made of the first conductive film by etching the first conductive film by self-alignment using the electrode made of the second conductive film as a mask after forming the electrode made of the second conductive film;
forming a second gate electrode by narrowing a line width of the electrode made of the second conductive film by etching;
adding a p-type impurity element to the semiconductor film by self-alignment using the second gate electrode as a mask; and
forming a first gate electrode by narrowing a line width of the electrode made of the first conductive film by etching. - View Dependent Claims (11, 17, 23, 29)
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6. A method of fabricating a light emitting device comprising the steps of:
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forming a semiconductor film on an insulator;
forming a gate insulating film covering the semiconductor film;
forming a first conductive film and a second conductive film on the gate insulating film;
etching the second conductive film to form a patterned second conductive film;
adding an n-type impurity element to the semiconductor film by self-alignment using the patterned second conductive film as a mask;
etching the first conductive film to form a patterned first conductive film by self-alignment using the patterned second conductive film as a mask after etching the second conductive film;
forming a second gate electrode by narrowing a line width of the patterned second conductive film by etching;
adding an n-type impurity element to the semiconductor film by self-alignment using the second gate electrode as a mask; and
forming a first gate electrode by narrowing a line width of the patterned first conductive film by etching. - View Dependent Claims (12, 18, 24, 30)
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Specification