Inferential signal generator for instrumented equipment and processes

  • US 6,876,943 B2
  • Filed: 03/20/2003
  • Issued: 04/05/2005
  • Est. Priority Date: 11/22/2000
  • Status: Expired due to Term
First Claim
Patent Images

1. A system for monitoring instrumented equipment, comprising:

  • a plurality of sensors capable of being monitored from the instrumented equipment;

    an information processor;

    a data acquisition input to said information processor for receiving operational values descriptive of physical parameters of the system from said plurality of sensors;

    a memory operable for being coupled with said data acquisition input for storing a set of time-correlated sensor data representative of expected operational states, and signals observed during operation of the instrumented equipment;

    said information processor generating at least one output value descriptive of a parameter of the instrumented equipment in addition to signals observed from said plurality of sensors on the instrumented equipment; and

    wherein said information processor uses a similarity operator to obtain a similarity measure between the expected operational states and the observed signals from the instrumented equipment.

View all claims

    Thank you for your feedback