Temperature detector
First Claim
1. An integrated circuit comprising a temperature sensor, the temperature sensor comprising:
- a first diode-connected PNP-type bipolar transistor connected between a first terminal and a second terminal of the sensor, the second terminal configured to be connected to a reference supply rail;
a resistive element and a second diode-connected PNP-type bipolar transistor, connected in series between a third terminal of the sensor and the second terminal, the second bipolar transistor being larger than the first bipolar transistor;
a current-to-voltage conversion element connected between a fourth terminal and the second terminal, the first and third terminals being configured to be connected by a voltage-copying element and the first, third, and fourth terminals being configured to receive identical currents; and
means for supplying power to the first, third and fourth terminals in response to an enable control signal so that the temperature sensor does not consume power when power is being supplied to the integrated circuit and the enable control signal is inactive.
1 Assignment
0 Petitions
Accused Products
Abstract
An integrated temperature sensor having a first PNP-type bipolar transistor diode-connected between a first terminal and a second terminal of the sensor intended to be connected to a reference supply rail; a resistive element and a second diode-connected PNP-type bipolar transistor, connected in series between a third terminal of the sensor and the second terminal, the second bipolar transistor being larger than the first one; a current-to-voltage conversion element connected between a fourth terminal and the second terminal, the first and third terminals being intended to be connected by a voltage-copying element and the first, second, and fourth terminals being intended to each receive an identical current.
42 Citations
16 Claims
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1. An integrated circuit comprising a temperature sensor, the temperature sensor comprising:
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a first diode-connected PNP-type bipolar transistor connected between a first terminal and a second terminal of the sensor, the second terminal configured to be connected to a reference supply rail; a resistive element and a second diode-connected PNP-type bipolar transistor, connected in series between a third terminal of the sensor and the second terminal, the second bipolar transistor being larger than the first bipolar transistor; a current-to-voltage conversion element connected between a fourth terminal and the second terminal, the first and third terminals being configured to be connected by a voltage-copying element and the first, third, and fourth terminals being configured to receive identical currents; and means for supplying power to the first, third and fourth terminals in response to an enable control signal so that the temperature sensor does not consume power when power is being supplied to the integrated circuit and the enable control signal is inactive. - View Dependent Claims (2, 3, 4, 5, 6, 8, 9, 10)
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7. An integrated circuit comprising a temperature sensor for testing an operating temperature range of said circuit, said sensor comprising:
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a first diode-connected PNP-type bipolar transistor connected between a first terminal and a second terminal of the sensor, the second terminal intended to be connected to a reference supply rail; a resistive element and a second diode-connected PNP-type bipolar transistor, connected in series between a third terminal of the sensor and the second terminal, the second bipolar transistor being larger than the first one; a current-to-voltage conversion element connected between a fourth terminal and the second terminal, the first and third terminals being intended to be connected by a voltage-copying element and the first, third, and fourth terminals being intended to each receive an identical current; and control elements to supply power to the first, third and fourth terminals in response to an enable control signal so that the temperature sensor does not consume power when power is being supplied to the integrated circuit and the enable control signal is inactive.
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11. An integrated circuit including a temperature sensor comprising:
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a first diode-connected PNP-type bipolar transistor connected between a first terminal and a second terminal of the sensor, the second terminal configured to be connected to a reference supply rail; a resistive element and a second diode-connected PNP-type bipolar transistor, connected in series between a third terminal of the sensor and the second terminal, the second bipolar transistor being larger than the first bipolar transistor; and a current-to-voltage conversion element connected between a fourth terminal and the second terminal; a voltage-copying element connected between the first and third terminals; mirror-connected current sources connected to provide identical currents to the first, third, and fourth terminals; and control elements to supply power to the current sources in response to an enable control signal so that the temperature sensor does not consume power when power is being supplied to the integrated circuit and the enable control signal is inactive. - View Dependent Claims (12, 13)
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14. A method for testing an operating temperature range of an integrated circuit comprising a temperature sensor comprising:
- a first diode-connected PNP-type bipolar transistor connected between a first terminal and a second terminal of the sensor, the second terminal intended to be connected to a reference supply rail;
a resistive element and a second diode-connected PNP-type bipolar transistor, connected in series between a third terminal of the sensor and the second terminal, the second bipolar transistor being larger than the first one;
a current-to-voltage conversion element connected between a fourth terminal and the second terminal, the first and third terminals being intended to be connected by a voltage-copying element and the first, third, and fourth terminals being intended to each receive an identical current, the method comprising;testing an operating range of the integrated circuit, including operating the integrated circuit at a plurality of temperature ranges and measuring a voltage across the current-to-voltage conversion element for each of the plurality of temperature ranges; and controlling the power consumed by the temperature sensor in response to an enable control signal so that the temperature sensor does not consume power when power is being supplied to the integrated circuit and the enable control signal is inactive.
- a first diode-connected PNP-type bipolar transistor connected between a first terminal and a second terminal of the sensor, the second terminal intended to be connected to a reference supply rail;
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15. A method of determining a temperature of an integrated circuit during a testing phase, the method comprising:
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providing the integrated circuit with a temperature sensor comprising; a first diode-connected PNP-type bipolar transistor connected between a first terminal and a second terminal of the sensor, the second terminal configured to be connected to a reference supply rail; a resistive element and a second diode-connected PNP-type bipolar transistor, connected in series between a third terminal of the sensor and the second terminal, the second bipolar transistor being larger than the first bipolar transistor; a current-to-voltage conversion element connected between a fourth terminal and the second terminal, the first and third terminals being connected by a voltage-copying element and the first, third, and fourth terminals receiving identical currents, wherein a voltage at the fourth terminal represents temperature; testing an operating range of the integrated circuit, including operating the integrated circuit at a plurality of temperatures; and
measuring the voltage at the fourth terminal for each of the plurality of temperatures; andcontrolling the power consumed by the temperature sensor in response to an enable control signal so that the temperature sensor does not consume power when power is being supplied to the integrated circuit and the enable control signal is inactive. - View Dependent Claims (16)
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Specification