System and method for detecting defects in a thin-film-transistor array

  • US 7,053,645 B2
  • Filed: 06/06/2003
  • Issued: 05/30/2006
  • Est. Priority Date: 06/06/2003
  • Status: Expired due to Fees
First Claim
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1. A method for detecting a defect in a transistor array including one or more gate lines arranged at least substantially parallel to one or more respective common lines, said method comprising:

  • applying a test signal to the array;

    monitoring pixel voltages at different monitoring points along a gate line of the array; and

    detecting a short defect between the gate line and a common line at a location where the gate line and the common line are arranged parallel to one another, the short defect being detected based on how the pixel voltages vary from one monitoring point to another monitoring point during said monitoring step.

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