Digitizing system and rotary table for determining 3-D geometry of an object

• US 7,054,775 B2
• Filed: 02/20/2004
• Issued: 05/30/2006
• Est. Priority Date: 08/07/1995
• Status: Expired due to Fees

• Current Assignee: Immersion Corporation
• Original Assignee: Immersion Corporation
• Inventors: Schena, Bruce M., Rosenberg, Louis B., Jackson, Bernard G.
• Primary Examiner(s): Wachsman, Hal D.
• Application Number:
  US10/781,801
• Publication Number:
  US 20040162700A1
• Time in Patent Office: 830 Days
• Field of Search: 702/95, 702 33- 36, 702 85- 88, 702/94, 702/97, 702/105, 702/113, 702/116, 702150-153, 702155-158, 702166-168, 702/170, 702/183, 700 56- 58, 700 60- 62, 700 64- 66, 700/85, 700/159, 700/160, 700/180, 700185-187, 700192-195, 700/254, 700/264, 700/275, 700/302, 700/303, 700/262, 700/247, 738/665, 738/620.41, 738/658, 73/13.7, 73/13.9, 73/14.1, 73/16.2, 73/17.3, 73/17.5, 73/17.8, 73/17.9, 73/18.1, 335/56, 335/58, 335/59, 335/61, 335/51, 33/1.M, 33/1.N, 33502-505, 33/1.MP, 33/1.PT, 33/1.CC, 335/010.7
• US Class Current: 702/95
• CPC Class Codes: B25J 9/1692 Calibration of manipulator
• CPC Class Codes: G01B 21/04 by measuring coordinates of points
• CPC Class Codes: G01B 5/008 using coordinate measuring machines
• CPC Class Codes: G05B 19/4207 in which a model is traced or scanned and corresponding data recorded
• CPC Class Codes: G05B 2219/37021 Robot controls position of touch probe
• CPC Class Codes: G05B 2219/37043 Touch probe, store position of touch point on surface
• CPC Class Codes: G05B 2219/39021 With probe, touch reference positions
• CPC Class Codes: G05B 2219/39024 Calibration of manipulator
• CPC Class Codes: G05B 2219/39048 Closed loop kinematic self calibration, grip part of robot with hand
• CPC Class Codes: G05B 2219/45055 Assembly
• CPC Class Codes: G05B 2219/45061 Measuring robot
• CPC Class Codes: G06F 3/0346 with detection of the device orientation or free movement in a 3D space, e.g. 3D mice, 6-DOF [six degrees of freedom] pointers using gyroscopes, accelerometers or tilt-sensors
• CPC Class Codes: G06F 3/038 Control and interface arrangements therefor, e.g. drivers or device-embedded control circuitry

Abstract

A digitizing system and rotary table for determining the three dimensional geometry of an object is described. An apparatus includes at least one sensor that detects information describing the three-dimensional geometry of the object and provides the information to a host computer. A rotary table includes a base and a turntable rotatable about an axis positioned perpendicularly to the turntable surface. The turntable and object on its surface rotate about the axis, during or between the sensor detecting the information describing the three-dimensional geometry of the object. A turntable sensor coupled to the base measures the rotation of the turntable, where the turntable sensor outputs turntable data indicative of the rotation to the host computer.

Claims

1. A device for measuring a three-dimensional geometry of an object, comprising:

a support base;

a turntable coupled to the support base and configured to rotate about an axis substantially perpendicular to a surface of the turntable, the turntable configured to support an object, the turntable and the object configured to rotate about the axis at least during making a measurement of the three-dimensional geometry of the object; and

a sensor coupled to the support base, the sensor configured to measure an angular rotation of the turntable, the sensor configured to send sensor data associated with the angular rotation to a processor, the processor configured to determine the three-dimensional geometry of the object based on the measurement and the angular rotation.

2. The device of claim 1, wherein the turntable further includes interface electronics configured to provide the sensor data associated with the angular rotation to the processor.

3. The device of claim 1, further comprising a probe, the probe being configured to physically trace a surface of the object to detect three-dimensional coordinates associated with the three-dimensional geometry of the object.

4. The device of claim 3, wherein the turntable includes a receptacle disposed adjacent a periphery of the turntable, the receptacle being configured to receive the probe in an initialization procedure associated with calibrating a position of the turntable relative to the probe.

5. The device of claim 4, wherein the receptacle is configured to receive the probe such that when the turntable is rotated during the initialization procedure, the probe is configured to rotate with the turntable, a plurality of positions and orientations of the probe being sampled during the rotation to calibrate the turntable with respect to the probe.

6. The device of claim 3, wherein the turntable includes a receptacle disposed adjacent a center of the turntable, the receptacle being configured to receive the probe in an initialization procedure associated with calibrating a position of the turntable relative to the probe.

7. The device of claim 3, wherein the support base is coupled to a base of the probe such that a position and an orientation of the turntable is fixed relative to the probe.

8. The device of claim 3, wherein the probe is a stylus including a tip configured to contact the object.

9. The device of claim 3, wherein the turntable is configured to be manually rotated.

10. The device of claim 1, wherein the processor is configured to output data values associated with a three-dimensional model of the object from sensor data associated with the three-dimensional geometry of the object.

11. The device of claim 1, wherein the turntable is capable of rotating about the axis between making measurements from a plurality of measurements of the three-dimensional geometry of the object.

12. A device for measuring a three-dimensional geometry of an object, comprising:

a support base;

a turntable coupled to the support base and configured to rotate about an axis substantially perpendicular to a surface of the turntable, the turntable configured to support an object, the turntable and the object configured to rotate about the axis one of during making a measurement of the three-dimensional geometry of the object and between making measurements from a plurality of measurements of the three-dimensional geometry of the object;

a sensor coupled to the support base, the sensor configured to measure an angular rotation of the turntable, the sensor configured to send sensor data associated with the angular rotation to a processor, the processor configured to determine the three-dimensional geometry of the object based on the measurement and the angular rotation;

a probe, the probe being configured to physically trace a surface of the object to detect three-dimensional coordinates associated with the three-dimensional geometry of the object,

wherein the turntable includes a first receptacle disposed adjacent a periphery of the turntable and a second receptacle disposed adjacent a center of the turntable, each of the receptacles being configured to receive the probe in an initialization procedure associated with calibrating a position of the turntable relative to the probe.

13. A system for measuring a three-dimensional geometry of an object, comprising:

(a) an apparatus including at least one sensor configured to detect information associated with the three-dimensional geometry of the object and configured to provide the information to a processor; and

(b) a rotary table including;

(i) a base;

(ii) a turntable coupled to the base and being configured to rotate about an axis perpendicular to a surface of the turntable, the turntable configured to receive on said surface the object, the turntable and the object being configured to rotate about the axis at least during detecting information associated with three-dimensional geometry of the object; and

(iii) a turntable sensor coupled to the base, the turntable sensor configured to measure a rotation of the turntable about the axis, said turntable sensor being configured to output turntable data associated with the rotation to the processor, a determination of the three-dimensional geometry being based on the turntable data.

14. The system of claim 13, wherein the turntable data is operative to locate the object on the rotary table with respect to the apparatus after the turntable is rotated.

15. The system of claim 14, wherein the apparatus is a probe configured to trace a surface of the object to generate probe data, the at least one sensor configured to generate data associated with the three-dimensional geometry of the object based on the probe data.

16. The system of claim 15, wherein the probe is a stylus having a tip configured to contact the object.

17. The system of claim 15, wherein the turntable includes a receptacle disposed adjacent a periphery of the turntable, the receptacle being configured to receive the probe in an initialization procedure associated with calibrating a position of the turntable relative to the probe.

18. The system of claim 13, wherein the turntable is capable of rotating about the axis between subsequent detections of the information associated with the three-dimensional geometry of the object.

19. A system for measuring a three-dimensional geometry of an object, comprising:

(a) an apparatus including at least one sensor configured to detect information associated with the three-dimensional geometry of the object and configured to provide the information to a processor; and

(b) a rotary table including;

(i) a base;

(ii) a turntable coupled to the base and being configured to rotate about an axis perpendicular to a surface of the turntable, the turntable configured to receive on said surface the object, the turntable and the object being configured to rotate about the axis one of during detecting information and between subsequent detections of the information associated with three-dimensional geometry of the object; and

(iii) a turntable sensor coupled to the base, the turntable sensor configured to measure a rotation of the turntable about the axis, said turntable sensor being configured to output turntable data associated with the rotation to the processor, a determination of the three-dimensional geometry being based on the turntable data,

wherein the turntable data is operative to locate the object on the rotary table with respect to the apparatus after the turntable is rotated,

wherein the apparatus is a probe including an interface microprocessor separate from the processor and coupled to the probe, the turntable sensor, and the processor, the interface microprocessor being configured to receive the information and the turntable data and to send the information and the turntable data to the processor.

20. A system for measuring a three-dimensional geometry of an object, comprising:

(a) an apparatus including at least one sensor configured to detect information associated with the three-dimensional geometry of the object and configured to provide the information to a processor; and

(b) a rotary table including;

(i) a base;

(ii) a turntable coupled to the base and being configured to rotate about an axis perpendicular to a surface of the turntable, the turntable configured to receive on said surface the object, the turntable and the object being configured to rotate about the axis one of during detecting information and between subsequent detections of the information associated with three-dimensional geometry of the object; and

(iii) a turntable sensor coupled to the base, the turntable sensor configured to measure a rotation of the turntable about the axis, said turntable sensor being configured to output turntable data associated with the rotation to the processor, a determination of the three-dimensional geometry being based on the turntable data,

wherein the turntable data is operative to locate the object on the rotary table with respect to the apparatus after the turntable is rotated,

wherein the apparatus is a probe configured to trace a surface of the object to generate probe data, the at least one sensor configured to generate data associated with the three-dimensional geometry of the object based on the probe data,

wherein the probe includes;

a first joint member;

a first linkage rotatably coupled to the first joint member;

a second joint member rigidly coupled to the first linkage;

a second linkage rigidly coupled to the second joint member; and

a third joint member rigidly coupled to the second linkage and to a probe base.