Ratiometric stud sensing

  • US 7,116,091 B2
  • Filed: 03/04/2004
  • Issued: 10/03/2006
  • Est. Priority Date: 03/04/2004
  • Status: Active Grant
First Claim
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1. A method of finding a feature behind a surface using a sensor having first and second plates, the method comprising the acts of:

  • moving the sensor and surface adjacent one another;

    measuring a first capacitance of a first capacitor including the first plate;

    measuring a second capacitance of a second capacitor including the second plate; and

    computing a ratio of the first and second capacitances;

    providing an indication of the ratio, and wherein if the indication is approximately one, thereby locating a centerline of the feature.

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