Semiconductor memory cell and semiconductor memory device
First Claim
1. A method of manufacturing a semiconductor memory cell comprising:
- forming a plurality of insulating films so that at least one linear concave portion is formed over a substrate having an insulating surface;
forming an amorphous semiconductor film in a region that includes the at least one linear concave portion;
melting and crystallizing the amorphous semiconductor film to form a crystalline semiconductor film;
forming a first gate insulating film that is in contact with the crystalline semiconductor film;
forming an electric charge accumulating layer on the first gate insulating film;
forming a second gate insulating film on the electric charge accumulating layer; and
forming a control gate electrode on the second gate insulating film.
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Accused Products
Abstract
An insulating film with a linear concave portion is formed and a semiconductor film is formed thereon by deposition. The semiconductor film is irradiated with laser light to melt the semiconductor film and the melted semiconductor is poured into the concave portion, where it is crystallized. This makes distortion or stress accompanying crystallization concentrate on other regions than the concave portion. A surface of this crystalline semiconductor film is etched away, thereby forming in the concave portion a crystalline semiconductor film which is covered with side walls of the concave portion from the sides and which has no other grain boundaries than twin crystal. TFTs and memory TFTs having this crystalline semiconductor film as their channel regions are highly reliable, have high field effect mobility, and are less fluctuated in characteristic. Accordingly, a highly reliable semiconductor memory device which can operate at high speed is obtained.
25 Citations
22 Claims
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1. A method of manufacturing a semiconductor memory cell comprising:
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forming a plurality of insulating films so that at least one linear concave portion is formed over a substrate having an insulating surface; forming an amorphous semiconductor film in a region that includes the at least one linear concave portion; melting and crystallizing the amorphous semiconductor film to form a crystalline semiconductor film; forming a first gate insulating film that is in contact with the crystalline semiconductor film; forming an electric charge accumulating layer on the first gate insulating film; forming a second gate insulating film on the electric charge accumulating layer; and
forming a control gate electrode on the second gate insulating film. - View Dependent Claims (2)
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3. A method of manufacturing a semiconductor memory cell comprising:
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forming a plurality of insulating films so that at least one linear concave portion is formed over a substrate having an insulating surface; forming an amorphous semiconductor film in a region that includes the at least one linear concave portion; melting and crystallizing the amorphous semiconductor film to form a crystalline semiconductor film by irradiating the amorphous semiconductor film with a laser light; forming a first gate insulating film that is in contact with the crystalline semiconductor film; forming an electric charge accumulating layer on the first gate insulating film; forming a second gate insulating film on the electric charge accumulating layer; and
forming a control gate electrode on the second gate insulating film. - View Dependent Claims (4, 5)
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6. A method of manufacturing a semiconductor memory cell comprising:
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forming a plurality of insulating films so that at least one linear concave portion is formed over a substrate having an insulating surface; forming an amorphous semiconductor film in a region that includes the at least one linear concave portion; melting and crystallizing the amorphous semiconductor film to form a crystalline semiconductor film; etching a surface of the crystalline semiconductor film so that side surfaces of the crystalline semiconductor film are covered with side walls of the at least one linear concave portion; forming a first gate insulating film that is in contact with the crystalline semiconductor film; forming an electric charge accumulating layer on the first gate insulating film; forming a second gate insulating film on the electric charge accumulating layer; and
forming a control gate electrode on the second gate insulating film. - View Dependent Claims (7)
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8. A method of manufacturing a semiconductor memory cell comprising:
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forming a plurality of insulating films so that at least one linear concave portion is formed over a substrate having an insulating surface; forming an amorphous semiconductor film in a region that includes the at least one linear concave portion; melting and crystallizing the amorphous semiconductor film to form a crystalline semiconductor film by irradiating the amorphous semiconductor film with a laser light; etching a surface of the crystalline semiconductor film so that side surfaces of the crystalline semiconductor film are covered with side walls of the at least one linear concave portion; forming a first gate insulating film that is in contact with the crystalline semiconductor film; forming an electric charge accumulating layer on the first gate insulating film; forming a second gate insulating film on the electric charge accumulating layer; and
forming a control gate electrode on the second gate insulating film. - View Dependent Claims (9, 10)
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11. A method of manufacturing a semiconductor memory cell comprising:
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forming a plurality of insulating films so that at least one linear concave portion is formed over a substrate having an insulating surface; forming an amorphous semiconductor film in a region that includes the at least one linear concave portion; crystallizing the amorphous semiconductor film to form a crystalline semiconductor film; forming a first gate insulating film that is in contact with the crystalline semiconductor film; forming an electric charge accumulating layer on the first gate insulating film; forming a second gate insulating film on the electric charge accumulating layer; and
forming a control gate electrode on the second gate insulating film. - View Dependent Claims (12)
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13. A method of manufacturing a semiconductor memory cell comprising:
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forming a plurality of insulating films so that at least one linear concave portion is formed over a substrate having an insulating surface; forming an amorphous semiconductor film in a region that includes the at least one linear concave portion; crystallizing the amorphous semiconductor film to form a crystalline semiconductor film; etching a surface of the crystalline semiconductor film so that side surfaces of the crystalline semiconductor film are covered with side walls of the at least one linear concave portion; forming a first gate insulating film that is in contact with the crystalline semiconductor film; forming an electric charge accumulating layer on the first gate insulating film; forming a second gate insulating film on the electric charge accumulating layer; and
forming a control gate electrode on the second gate insulating film. - View Dependent Claims (14)
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15. A method of manufacturing a semiconductor memory cell comprising:
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forming a plurality of stripes comprising an insulating material over a substrate having an insulating surface; forming an amorphous semiconductor film in a region between the plurality of stripes; crystallizing the amorphous semiconductor film to form a crystalline semiconductor film; forming a first gate insulating film that is in contact with the crystalline semiconductor film; forming an electric charge accumulating layer on the first gate insulating film; forming a second gate insulating film on the electric charge accumulating layer; and forming a control gate electrode on the second gate insulating film. - View Dependent Claims (16)
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17. A method of manufacturing a semiconductor memory cell comprising:
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forming a plurality of stripes comprising an insulating material over a substrate having an insulating surface; forming an amorphous semiconductor film in a region between the plurality of stripes; crystallizing the amorphous semiconductor film to form a crystalline semiconductor film; etching a surface of the crystalline semiconductor film so that side surfaces of the crystalline semiconductor film are covered with side walls of the plurality of stripes; forming a first gate insulating film that is in contact with the crystalline semiconductor film; forming an electric charge accumulating layer on the first gate insulating film; forming a second gate insulating film on the electric charge accumulating layer; and forming a control gate electrode on the second gate insulating film. - View Dependent Claims (18)
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19. A method of manufacturing a semiconductor memory cell comprising:
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forming at least two stripes comprising an insulating material over a substrate having an insulating surface; forming an amorphous semiconductor film in a region between the at least two stripes; crystallizing the amorphous semiconductor film to form a crystalline semiconductor film; forming a first gate insulating film that is in contact with the crystalline semiconductor film; forming an electric charge accumulating layer on the first gate insulating film; forming a second gate insulating film on the electric charge accumulating layer; and forming a control gate electrode on the second gate insulating film. - View Dependent Claims (20)
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21. A method of manufacturing a semiconductor memory cell comprising:
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forming at least two stripes comprising an insulating material over a substrate having an insulating surface; forming an amorphous semiconductor film in a region between the at least two stripes; crystallizing the amorphous semiconductor film to form a crystalline semiconductor film; etching a surface of the crystalline semiconductor film so that side surfaces of the crystalline semiconductor film are covered with side walls of the at least two stripes; forming a first gate insulating film that is in contact with the crystalline semiconductor film; forming an electric charge accumulating layer on the first gate insulating film; forming a second gate insulating film on the electric charge accumulating layer; and forming a control gate electrode on the second gate insulating film. - View Dependent Claims (22)
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Specification