System and method for estimating reliability of components for testing and quality optimization

  • US 7,194,366 B2
  • Filed: 10/18/2002
  • Issued: 03/20/2007
  • Est. Priority Date: 10/19/2001
  • Status: Expired due to Fees
First Claim
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1. A method of the post-production reliability of a repairable integrated circuit die component, said method comprising:

  • performing an initial post-production test on the component to identify repairable defects in the component; and

    classifying the component into a classification of a plurality of reliability probability classifications based on the number of repairable defects identified by the initial test; and

    estimating the reliability of the component based on the classification.

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