Method and device for the subjective determination of aberrations of higher order

• US 7,338,173 B2
• Filed: 01/28/2002
• Issued: 03/04/2008
• Est. Priority Date: 01/27/2001
• Status: Expired due to Fees

• Current Assignee: Carl Zeiss Meditec AG (Carl-Zeiss-Stiftung)
• Original Assignee: Carl Zeiss Meditec AG (Carl-Zeiss-Stiftung)
• Inventors: Dick, Manfred, Maeusezahl, Holger, Schroeder, Eckhard
• Primary Examiner(s): Dang; Hung Xuan
• Application Number:
  US10/470,149
• Publication Number:
  US 20050225750A1
• Time in Patent Office: 2,227 Days
• Field of Search: 351/200, 351/205, 351/206, 351/211, 351/212, 351/215, 351/246, 351/247
• US Class Current: 351/246
• CPC Class Codes: A61B 3/028 for testing visual acuity; for determination of refraction, e.g. phoropters

Abstract

A device for the subjective determination of aberrations of higher orders Xi in an optical system, in particular in an eye includes at least one observation channel into which defined plates can be introduced, the individual plates having optically active structures which correspond to a defined Zernike polynomial and to a defined amplitude, at least one order Xi of the Zemike polynomial being greater than two.

Claims

1. A method for the subjective determination of an aberration of a special higher order X in an optical system, comprising:

in a first step, introducing a first plate into an observation channel of the optical system, the plate having optically active structures corresponding to a defined Zernike polynomial having an order X and to a defined amplitude of the defined Zernike polynomial, the order X being greater than 2;

in a second step, subjectively assessing a current wave deformation of the order X; and

in a third step repeating the first step with a second plate of different amplitude correction of the defined Zernike polynomial and repeating the second step of the subjective determination so as to select one of the first and second plates that subjectively best compensates the aberration of the special higher order X.

2. The method as recited in claim 1, wherein the optical system includes an eye.

3. A method for the subjective determination of aberrations of special higher orders X1 to Xn in an optical system, comprising:

in a first step, introducing a first plate into an observation channel of the optical system, the plate having optically active structures corresponding to a defined Zernike polynomial having an order X1 and to a defined amplitude of the defined Zernike polynomial, the order X1 being greater than 2;

in a second step, subjectively assessing a current wave deformation of the order X1; and

in a third step repeating the first step with a second plate of different amplitude correction of the defined Zernike polynomial arid repeating the second step of the subjective determination so as to select one of the first and second plates that subjectively best compensates the aberration of the special higher order X1

in a fourth step, successively repeating the first and second steps for each defined Zernike polynomial having an order Xn, wherein Xn is greater than X1.

4. The method as recited in claim 3, wherein the optical system includes an eye.