Electro-optical measurement of hysteresis in interferometric modulators
First Claim
Patent Images
1. A method of testing a plurality of interferometric modulators, comprising:
- applying a triangular voltage waveform to the interferometric modulators; and
detecting reflectivity of light from the interferometric modulators, wherein the detecting includes measuring reflectivity through a diffuser positioned between a light detector and the interferometric modulators.
3 Assignments
0 Petitions
Accused Products
Abstract
Disclosed herein are methods and apparatus for testing interferometric modulators. The interferometric modulators may be tested by applying a time-varying voltage stimulus and measuring the resulting reflectivity from the modulators.
325 Citations
10 Claims
-
1. A method of testing a plurality of interferometric modulators, comprising:
-
applying a triangular voltage waveform to the interferometric modulators; and detecting reflectivity of light from the interferometric modulators, wherein the detecting includes measuring reflectivity through a diffuser positioned between a light detector and the interferometric modulators. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
-
Specification