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Electro-optical measurement of hysteresis in interferometric modulators

  • US 7,359,066 B2
  • Filed: 03/04/2005
  • Issued: 04/15/2008
  • Est. Priority Date: 09/27/2004
  • Status: Expired due to Fees
First Claim
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1. A method of testing a plurality of interferometric modulators, comprising:

  • applying a triangular voltage waveform to the interferometric modulators; and

    detecting reflectivity of light from the interferometric modulators, wherein the detecting includes measuring reflectivity through a diffuser positioned between a light detector and the interferometric modulators.

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