Device and method for determining at least one variable associated with the electromagnetic radiation of an object being tested

• US 7,443,170 B2
• Filed: 08/13/2004
• Issued: 10/28/2008
• Est. Priority Date: 08/14/2003
• Status: Active Grant

• Current Assignee: Microwave Vision SA
• Original Assignee: Ste D'Applications Technologiques De L'Imagerie Micro-Onde
• Inventors: Garreau, Philippe, Duchesne, Luc, Gandois, Arnaud, Iversen, Per Olav
• Primary Examiner(s): Dole; Timothy J
• Application Number:
  US10/568,378
• Publication Number:
  US 20070018654A1
• Time in Patent Office: 1,537 Days
• Field of Search: 324/501, 324/96
• US Class Current: 324/501
• CPC Class Codes: G01R 29/0821 rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells for testing antennas G01R29/105

Abstract

A device determines at least one characteristic of electromagnetic radiation emitted from a test object. A support receives the object. A network of probes is distributed along a substantially circular arc, and the support is disposed in a plane formed by the network of probes or in a plane parallel to the plane formed by the network of probes. The network of probes or the support is pivoted in the plane formed by the network of probes or in the plane parallel to the plane formed by the network of probes about a point located in that plane to vary an angle formed between a given one of the network of probes and the support, and thereby allow measurements to be taken at plural angular positions of the network of probes relative to the test object.

Claims

1. A device for determining at least one characteristic of electromagnetic radiation emitted from a test object, said device comprising:

a support for receiving the object;

a network of probes distributed at a given pitch along a substantially circular arc, a main axis of the support being disposed in a plane formed by the network of probes or in a plane parallel to the plane formed by the network of probes; and

means for providing a plurality of measurements using the network of probes, the plurality of measurements corresponding to a plurality of angular positions of a given one of the network of probes relative to the test object, and including;

means for pivoting the network of probes about a point located in the plane formed by the network of probes or about a point located in the plane parallel to the plane formed by the network of probes to vary an angle formed between the given one of the network of probes and the main axis of the support in a manner that provides a total number of measurements in the plurality of measurements that is greater than a total number of probes in the network of probes.

2. A device according to claim 1, wherein said means for providing a plurality of measurements includes means for moving the support in relation to the ground.

3. A device according to claim 1, wherein said means for pivoting the network of probes includes means for moving the network of probes in relation to the ground.

4. A device according to claim 1, wherein the given pitch of the network of probes is defined as an angular pitch, and said means for pivoting the network of probes allows the angle formed between the given one of the network of probes and the main axis of the support to vary between successive ones of the plurality of measurements by less than the angular pitch of the network of probes.

5. A device according to claim 4, wherein said means for pivoting the network of probes allows the angle formed between the given one of the network of probes and the main axis of the support to vary between successive ones of the plurality of measurements by a fraction of the angular pitch of the network of probes.

6. A device according to claim 1, wherein the given pitch of the network of probes is defined as an angular pitch, and said means for pivoting the network of probes allows the angle formed between the given one of the network of probes and the main axis of the support to vary between successive ones of the plurality of measurements by more than the angular pitch of the network of probes.

7. A device according to claim 1, further comprising:

means for driving one of the support and the network of probes to rotate about an axis formed of a diameter of the substantially circular arc.

8. A method for determining at least one characteristic of electromagnetic radiation emitted from a test object using a device according to claim 7, said method comprising:

positioning the test object on the support;

rotating at least one of the network of probes and the support about the axis formed of the diameter of the substantially circular arc to place the network of probes and the support at a plurality of relative positions of rotation, and for each one of the plurality of relative positions of rotation, pivoting one of the network of probes and the support about the point located in the plane formed by the network of probes or about the point located in the plane parallel to the plane formed by the network of probes to enable acquisition of data at a respective plurality of angular positions associated with that relative position of rotation; and

carrying out the plurality of measurements by taking, at each one of the plurality of relative positions of rotation, measurements at each one of the associated plurality of angular positions.

9. A device according to claim 1, further comprising:

means for displacing the test object relative to the network of probes in a direction perpendicular to the plane formed by the network of probes.

10. A method for determining at least one characteristic of electromagnetic radiation emitted from a test object using a device according to claim 9, said method comprising:

positioning the test object on the support;

moving the arc or the support in the direction perpendicular to the plane formed by the network of probes to place the network of probes and the support at a plurality of relative positions, and for each one of the plurality of relative positions, pivoting one of the network of probes and the support about the point located in the plane formed by the network of probes or about the point located in the plane parallel to the plane formed by the network of probes to enable acquisition of data at a respective plurality of angular positions associated with that relative position; and

carrying out the plurality of measurements by taking, at each one of the plurality of relative positions, measurements at each one of the associated plurality of angular positions.

11. A method for determining at least one characteristic of electromagnetic radiation emitted from a test object using a device according to claim 1, said method comprising:

positioning the test object on the support;

pivoting the network of probes about the point located in the plane formed by the network of probes or about the point located in the plane parallel to the plane formed by the network of probes to enable acquisition of data at each one of the plurality of angular positions of the network of probes relative to the test object in a manner that provides a total number of angular positions in the plurality of angular positions that is greater than a total number of probes in the network of probes; and

carrying out the plurality of measurements by taking measurements at each one of the plurality of angular positions.

12. A device for determining at least one characteristic of electromagnetic radiation emitted from a test object, said device comprising:

a support for receiving the object;

a network of probes distributed at a given pitch along a substantially circular arc, a main axis of the support being disposed in a plane formed by the network of probes or in a plane parallel to the plane formed by the network of probes; and

means for providing a plurality of measurements using the network of probes, the plurality of measurements corresponding to a plurality of angular positions of a given one of the network of probes relative to the test object, and including;

means for pivoting one or more of the network of probes and the support about a point located in the plane formed by the network of probes or about a point located in the plane parallel to the plane formed by the network of probes to vary, between successive ones of the plurality of measurements, an angle formed between the given one of the network of probes and the main axis of the support by a fraction of the angular pitch of the network of probes so that a total number of measurements in the plurality of measurements is greater than a total number of probes in the network of probes.

13. A device for determining at least one characteristic of electromagnetic radiation emitted from a test object, said device comprising:

a support for receiving the object;

a network of probes distributed at a given pitch along a substantially circular arc, a main axis of the support being disposed in a plane formed by the network of probes or in a plane parallel to the plane formed by the network of probes; and

means for providing a plurality of measurements using the network of probes, the plurality of measurements corresponding to a plurality of angular positions of a given one of the network of probes relative to the test object, and including;

means for moving the network of probes relative to the ground such that the network of probes is pivoted about a point located in the plane formed by the network of probes or about a point located in the plane parallel to the plane formed by the network of probes to vary an angle formed between the given one of the network of probes and the main axis of the support in a manner that provides a total number of measurements in the plurality of measurements that is greater than a total number of probes in the network of probes.