Image sensor with a gated storage node linked to transfer gate

• US 7,443,437 B2
• Filed: 11/26/2003
• Issued: 10/28/2008
• Est. Priority Date: 11/26/2003
• Status: Active Grant

• Current Assignee: Samsung Electronics Co. Ltd.
• Original Assignee: Micron Technology, Inc.
• Inventors: McKee, Jeffrey A., Altice, Peter P. Jr.
• Primary Examiner(s): Ometz; David
• Assistant Examiner(s): Bemben; Richard M
• Application Number:
  US10/721,191
• Publication Number:
  US 20050110885A1
• Time in Patent Office: 1,798 Days
• Field of Search: 348/296, 348/302, 348/308, 348/294, 348/310
• US Class Current: 348/296
• CPC Class Codes: H01L 27/148 Charge coupled imagers individual charge coupled devices H01L29/765
• CPC Class Codes: H04N 25/65 applied to reset noise, e.g. KTC noise related to CMOS structures by techniques other than CDS
• CPC Class Codes: H04N 25/778 comprising amplifiers shared between a plurality of pixels, i.e. at least one part of the amplifier must be on the sensor array itself

Abstract

A CMOS imaging system with increased charge storage of pixels yet decreased physical size, kTC noise and active area. A storage node is connected to the transfer gate and provides a storage node for a pixel, allowing for kTC noise reduction prior to readout. The pixel may be operated with the shutter gate on during the integration period to increase the amount of time for charge storage by a pixel.

Claims

1. A method of operating a plurality of pixels of an image sensor comprising:

accumulating a first charge in a first photosensor;

transferring said first charge from said first photosensor to a first storage node within a first pixel;

transferring said first charge from said first storage node to a floating diffusion node;

reading out the first charge from said floating diffusion node as an output signal of said first pixel;

accumulating a second charge in a second photosensor;

transferring said second charge from said second photosensor to a second storage node within a second pixel;

transferring said second charge from said second storage node to said floating diffusion node; and

reading out the second charge from said floating diffusion node as an output signal of said second pixels,

wherein said transferring steps occur on half clock cycles.

2. The method of claim 1 further comprising:

resetting said floating diffusion node;

accumulating a third charge in a third photosensor;

transferring said third charge from said third photosensor to a third storage node within a third pixel;

transferring said third charge from said third storage node to said floating diffusion node;

reading out the third charge from said floating diffusion node as an output signal of said third pixel;

resetting said floating diffusion node

accumulating a fourth charge in a fourth photosensor;

transferring said fourth charge from said fourth photosensor to a fourth storage node within a fourth pixel;

transferring said fourth charge from said fourth storage node to said floating diffusion node; and

reading out the fourth charge from said floating diffusion node as an output signal of said fourth pixel.

3. The method of claim 1, wherein a readout circuit outputs the first and second charges by:

turning on a first transfer gate of the first pixel to transfer the first charge to the floating diffusion node, providing an output signal based on charge at the floating diffusion node with an output transistor and turning on a row select transistor to output a signal provided by said output transistor; and

turning on a second transfer gate of the second pixel after the readout of said first pixel to transfer the second charge to said floating diffusion node providing an output signal based on charge at the floating diffusion node with an output transistor, and turning on said row select transistor.

4. A method of reading charge from pixels of an image sensor comprising:

turning on a first transfer gate transistor associated with a first pixel to transfer a first charge from a storage node within said first pixel to a floating diffusion node;

providing an output signal of said first pixel with an output transistor coupled to said floating diffusion node;

turning on a row select transistor connected to the output transistor to output the first charge from said floating diffusion node;

while the row select transistor remains on, turning on a second transfer gate transistor associated with a second pixel to transfer a second charge from a storage node within said second pixel to said floating diffusion node; and

providing an output signal of said second output transistor which is output by said row select transistor.

5. The method of claim 4, wherein the transfer of said first and second charges occur on respective half clock cycles.

6. The method of claim 4, wherein said first transfer gate remains on during an integration period.

7. A method of reading charge from pixels of an image sensor comprising:

turning on a first transfer gate transistor associated with a first pixel to transfer a first charge from a storage node within a substrate of said first pixel to a floating diffusion node;

providing an output signal of said first pixel from said first charge stored in said floating diffusion node;

turning on a row select transistor to output said first pixel output signal;

turning on a second transfer gate transistor associated with a second pixel to transfer a second charge from a storage node within said second pixel to said floating diffusion node;

providing an output signal of said second pixel from said second charge stored in said floating diffusion node; and

turning on a row select transistor connected to the floating diffusion node to output said second pixel output signal,

wherein the transfer of said first and second charges occur on respective half clock cycles.

8. A pixel circuit comprising:

a plurality of photosensors for accumulating charge;

a plurality of first transistors for transferring charge from a respective one of said photosensors to a respective first storage node;

a plurality of second transistors for transferring charge from said respective first storage node to a respective second storage node; and

a readout circuit for providing a pixel output signal based on charges transferred to said respective second storage nodes,

wherein a plurality of barrier regions are controlled by a respective one of said first transistors, said barrier region separating said respective photosensor from said respective first storage node.

9. The circuit of claim 8, wherein said readout circuit further comprises a reset transistor connected to said second storage node for resetting the voltage on the second storage node prior to receiving charge from a respective one said plurality of transfer gates.

10. The circuit of claim 8, wherein said first storage nodes are formed within said pixel.

11. The circuit of claim 8, wherein said first transistors operate as electronic shutters for said pixel circuit.

12. The circuit of claim 8, wherein said first transistors remain on during the integration period.

13. The circuit of claim 8, wherein said barrier regions are comprised of boron.

14. The circuit of claim 8, wherein said pixel circuit is a CMOS pixel.

15. The circuit of claim 8, wherein said pixel circuit is a five transistor pixel.

16. A pixel circuit for use in an imaging device, said pixel circuit comprising:

a plurality of photosensors for generating charge during an integration period;

a plurality of shutter transistors, each shutter transistor connected to and transferring charge from a respective photosensor;

a plurality of storage nodes, each node connected to a respective shutter transistor and storing charge transferred by a respective one of said plurality of photosensors;

a plurality of transfer gates, each transfer gate connected to and transferring charge from a respective storage node;

a floating diffusion node connected to said plurality of transfer gates for receiving charge from said storage nodes; and

a readout circuit connected to said floating diffusion node to output charge accumulated at the floating diffusion node,

wherein a plurality of barrier regions are controlled by a respective one of said shutter transistors, said barrier region separating said respective photosensor from said respective storage node.

17. The circuit of claim 16, wherein a plurality of pixel circuits share said floating diffusion node, reset transistor, source follower transistor, and row select transistor.

18. The circuit of claim 16, wherein said pixel circuit is a CMOS pixel.

19. An imaging system comprising:

a processor; and

an imaging device comprising an array of pixels, coupled to said imaging system said array comprising;

a plurality of photosensors for generating charge during an integration period;

a plurality of shutter transistors, each shutter transistor connected to and transferring charge from a respective photosensor;

a plurality of storage nodes, each storage node connected to a respective shutter transistor and storing charge transferred by a respective one of said plurality of photosensors;

a plurality of barrier regions, each barrier region separating a respective photosensor from its respective storage node;

a plurality of transfer gates, each transfer gate connected to and transferring charge from a respective storage node;

a floating diffusion node connected to said plurality of transfer gates for receiving charge from said transfer gates; and

a readout circuit connected to said floating diffusion node to output charge accumulated at the floating diffusion nodes,

wherein a barrier region is controlled by one of said shutter transistors, said barrier region separating said photosensor from said respective storage node.

20. An imaging system comprising:

a processor; and

an imaging device comprising an array of pixels, coupled to said imaging system said array comprising;

a plurality of photosensors for accumulating charge;

a plurality of first transistors for transferring charge from a respective one of said photosensors to a respective first storage node;

a plurality of second transistors for transferring charge from said respective first storage node to a respective second storage node; and

a readout circuit for providing a pixel output signal based on charges transferred to said respective second storage nodes,

wherein a barrier region is controlled by one of said first transistors, said barrier region separating said photosensor from said respective first storage node.

21. The system of claim 20, wherein a number of said plurality of photosensors is two photosensors.

22. The system of claim 20, wherein a number of said plurality of photosensors is four photosensors.

23. The system of claim 20, wherein said first transistor is an electronic shutter.

24. The system of claim 20, wherein said first transistor remains on during the integration period.

25. The system of claim 20, wherein said imaging system is a CMOS imaging system.