Sensor or capacitance measuring with a microprocessor

• US 7,472,028 B2
• Filed: 06/21/2005
• Issued: 12/30/2008
• Est. Priority Date: 06/25/2004
• Status: Expired due to Fees

• Current Assignee: Kele Incorporated
• Original Assignee: Kele Incorporated
• Inventors: Foote, Steve R.
• Primary Examiner(s): Feliciano; Eliseo Ramos
• Assistant Examiner(s): O MALLEY, MARY CATHERINE
• Application Number:
  US11/158,393
• Publication Number:
  US 20060006883A1
• Time in Patent Office: 1,288 Days
• Field of Search: 702/57, 702 64- 65, 702/138, 702/141, 702/150, 702/189, 702/198, 733/350.4, 737/80, 738/622.2, 738/623.37, 324/519, 324/658, 324660-661, 324/686
• US Class Current: 702/65
• CPC Class Codes: G01D 5/24 by varying capacitance
• CPC Class Codes: G01L 9/12 by making use of variations in capacitance , i.e. electric circuits therefor
• CPC Class Codes: G01N 27/223 for determining moisture content, e.g. humidity rain detectors on vehicle windows B60S1/0825
• CPC Class Codes: G01R 27/2605 Measuring capacitance capacitive sensors G01D5/24
• CPC Class Codes: H03K 17/955 using a capacitive detector

Abstract

An apparatus, system, and method for measuring parameters, measuring or determining capacitance, producing a digital output that is dependent upon a capacitance, or converting a variable capacitance output, of a sensor capacitor for example, into a digital format. By activating and deactivating pins, a microprocessor may form various circuits, for instance, each containing a resistor and a different capacitor and, in some embodiments, without the use of intermediate switching components. The microprocessor may alternately measure the time to change the charge of each of the capacitors and then calculate the capacitance of one of the capacitors using the measured times and known capacitances of one or more reference capacitors. Certain embodiments use two reference capacitors and alternately charge and discharge the capacitors, and a simple formula may be used to calculate capacitance using times to reach a threshold voltage. A measured parameter may be humidity or pressure, for example.

Claims

1. An apparatus for measuring a parameter, the apparatus comprising:

a microprocessor having a plurality of pins;

a sensor capacitor configured to change capacitance as the parameter changes, the sensor capacitor having a first lead electrically connected to a first pin of the microprocessor, and a second lead electrically connected to a second pin of the microprocessor;

a first reference capacitor having a first lead electrically connected to a third pin of the microprocessor, and a second lead electrically connected to the second pin of the microprocessor;

a resistor having a first lead electrically connected to a fourth pin of the microprocessor, and a second lead electrically connected to the second pin of the microprocessor;

a second reference capacitor having a first lead electrically connected to a fifth pin of the microprocessor, and a second lead electrically connected to the second pin of the microprocessor

a comparator configured to detect whether a threshold voltage has been reached;

a timer, wherein the apparatus is configured to use the timer to measure how long it takes for;

the sensor capacitor to reach the threshold voltage;

the first reference capacitor to reach the threshold voltage; and

the second reference capacitor to reach the threshold voltage;

wherein the sensor capacitance is calculated using the formula;

Sensor Capacitance=[(TimerS−

Timer1)/(Timer2−

Timer1)](Ref2−

Ref1)+Ref1

wherein;

TimerS is the time for the sensor capacitor to reach the threshold voltage,

Timer1 is the time for the first reference capacitor to reach the threshold voltage,

Timer2 is the time for the second reference capacitor to reach the threshold voltage,

Ref1 is the capacitance of the first reference capacitor, and

Ref2 is the capacitance of the second reference capacitor.

2. The apparatus of claim 1 wherein the parameter is a measure of the relative presence of a substance.

3. The apparatus of claim 1 wherein the parameter comprises humidity.

4. The apparatus of claim 1 wherein the parameter comprises pressure.

5. The apparatus of claim 1 wherein the parameter comprises force.

6. The apparatus of claim 1 wherein the parameter comprises acceleration.

7. The apparatus of claim 1 wherein the parameter comprises at least one of proximity and displacement.

8. The apparatus of claim 1 further comprising software configured to control the microprocessor so that at least the first pin, the third pin, and the fifth pin are alternately activated and when not activated, are left in a high-impedance state.

9. The apparatus of claim 1 further comprising software configured to control the microprocessor so that at least the first pin, the third pin, and the fifth pin are alternately activated and when activated, are driven as outputs to one of a first voltage and a second voltage.

10. The apparatus of claim 1 further comprising software configured to control the microprocessor so that the second pin is alternately activated as an output and as an input to a comparator, and when activated as an output, is driven to one of a first voltage and a second voltage.

11. A method of measuring the capacitance of a first capacitor, the method comprising the steps of:

activating at least a first pin of a microprocessor, wherein the first pin is electrically connected to the first capacitor;

while the first pin is activated, measuring a time to change the charge of the first capacitor;

after the measuring of the time to change the charge of the first capacitor, deactivating the first pin into a high impedance state;

activating at least a second pin of the microprocessor, wherein the second pin is electrically connected to a second capacitor;

while the second pin is activated, measuring a time to change the charge of the second capacitor;

after the measuring of the time to change the charge of the second capacitor, deactivating the second pin into a high impedance state;

activating at least a third pin of the microprocessor, wherein the third pin is electrically connected to a third capacitor;

while the third pin is activated, measuring a time to change the charge of the third capacitor;

after the measuring of the time to change the charge of the third capacitor, deactivating the third pin into a high impedance state; and

using at least the time to change the charge of the first capacitor, the time to change the charge of the second capacitor, and the time to change the charge of the third capacitor to calculate the capacitance of the first capacitor;

wherein the second capacitor and third capacitor are reference capacitors having known capacitances and the step of calculating the capacitance of the first capacitor includes finding the difference in capacitance between the second capacitor and the third capacitor.

12. The method of claim 11 wherein the step of measuring of the time to change the charge of the first capacitor includes detecting when a threshold voltage is reached and measuring the time to reach the threshold voltage.

13. The method of claim 11 wherein the steps of measuring a time to change the charge of the first capacitor, measuring a time to change the charge of the second capacitor, and measuring a time to change the charge of the third capacitor are repeated, in any order, alternating between charging and discharging the first, second, and third capacitors.

14. The method of claim 11 wherein the step of calculating the capacitance of the first capacitor includes adding the capacitance of the second capacitor.

15. The method of claim 11 the step of calculating the capacitance of the first capacitor includes finding the difference between the time to change the charge of the first capacitor and the time to change the charge of the second capacitor.

16. A method of measuring the capacitance of a first capacitor, the method comprising the steps of:

activating at least a first pin of a microprocessor, wherein the first pin is electrically connected to the first capacitor;

while the first pin is activated, measuring a time to change the charge of the first capacitor;

after the measuring of the time to change the charge of the first capacitor, deactivating the first pin into a high impedance state;

activating at least a second pin of the microprocessor, wherein the second pin is electrically connected to a second capacitor;

while the second pin is activated, measuring a time to change the charge of the second capacitor;

after the measuring of the time to change the charge of the second capacitor, deactivating the second pin into a high impedance state;

activating at least a third pin of the microprocessor, wherein the third pin is electrically connected to a third capacitor;

while the third pin is activated, measuring a time to change the charge of the third capacitor;

after the measuring of the time to change the charge of the third capacitor, deactivating the third pin into a high impedance state; and

using at least the time to change the charge of the first capacitor, the time to change the charge of the second capacitor, and the time to change the charge of the third capacitor to calculate the capacitance of the first capacitor;

wherein the second capacitor and third capacitor are reference capacitors having known capacitances and the step of calculating the capacitance of the first capacitor includes adding the capacitance of the second capacitor.

17. The method of claim 16 wherein the step of measuring of the time to change the charge of the first capacitor includes detecting when a threshold voltage is reached and measuring the time to reach the threshold voltage.

18. The method of claim 16 wherein the steps of measuring a time to change the charge of the first capacitor, measuring a time to change the charge of the second capacitor, and measuring a time to change the charge of the third capacitor are repeated, in any order, alternating between charging and discharging the first, second, and third capacitors.

19. A method of measuring the capacitance of a first capacitor, the method comprising the steps of:

activating at least a first pin of a microprocessor, wherein the first pin is electrically connected to the first capacitor;

while the first pin is activated, measuring a time to change the charge of the first capacitor;

after the measuring of the time to change the charge of the first capacitor, deactivating the first pin into a high impedance state;

activating at least a second pin of the microprocessor, wherein the second pin is electrically connected to a second capacitor;

while the second pin is activated, measuring a time to change the charge of the second capacitor;

after the measuring of the time to change the charge of the second capacitor, deactivating the second pin into a high impedance state;

activating at least a third pin of the microprocessor, wherein the third pin is electrically connected to a third capacitor;

while the third pin is activated, measuring a time to change the charge of the third capacitor;

after the measuring of the time to change the charge of the third capacitor, deactivating the third pin into a high impedance state; and

using at least the time to change the charge of the first capacitor, the time to change the charge of the second capacitor, and the time to change the charge of the third capacitor to calculate the capacitance of the first capacitor;

wherein the step of calculating the capacitance of the first capacitor includes finding the difference between the time to change the charge of the first capacitor and the time to change the charge of the second capacitor.

20. The method of claim 19 wherein the step of measuring of the time to change the charge of the first capacitor includes detecting when a threshold voltage is reached and measuring the time to reach the threshold voltage.

21. The method of claim 19 wherein the steps of measuring a time to change the charge of the first capacitor, measuring a time to change the charge of the second capacitor, and measuring a time to change the charge of the third capacitor are repeated, in any order, alternating between charging and discharging the first, second, and third capacitors.

22. A method of measuring the capacitance of a first capacitor, the method comprising the steps of:

activating at least a first pin of a microprocessor, wherein the first pin is electrically connected to the first capacitor;

while the first pin is activated, measuring a time to change the charge of the first capacitor;

after the measuring of the time to change the charge of the first capacitor, deactivating the first pin into a high impedance state;

activating at least a second pin of the microprocessor, wherein the second pin is electrically connected to a second capacitor;

while the second pin is activated, measuring a time to change the charge of the second capacitor;

after the measuring of the time to change the charge of the second capacitor, deactivating the second pin into a high impedance state;

activating at least a third pin of the microprocessor, wherein the third pin is electrically connected to a third capacitor;

while the third pin is activated, measuring a time to change the charge of the third capacitor;

after the measuring of the time to change the charge of the third capacitor, deactivating the third pin into a high impedance state; and

using at least the time to change the charge of the first capacitor, the time to change the charge of the second capacitor, and the time to change the charge of the third capacitor to calculate the capacitance of the first capacitor;

wherein the step of calculating the capacitance of the first capacitor includes finding the difference between the time to change the charge of the second capacitor and the time to change the charge of the third capacitor.

23. The method of claim 22 wherein the step of measuring of the time to change the charge of the first capacitor includes detecting when a threshold voltage is reached and measuring the time to reach the threshold voltage.

24. The method of claim 22 wherein the steps of measuring a time to change the charge of the first capacitor, measuring a time to change the charge of the second capacitor, and measuring a time to change the charge of the third capacitor are repeated, in any order, alternating between charging and discharging the first, second, and third capacitors.

25. A method of measuring the capacitance of a first capacitor, the method comprising the steps of:

activating at least a first pin of a microprocessor, wherein the first pin is electrically connected to the first capacitor;

while the first pin is activated, measuring a time to change the charge of the first capacitor;

after the measuring of the time to change the charge of the first capacitor, deactivating the first pin into a high impedance state;

activating at least a second pin of the microprocessor, wherein the second pin is electrically connected to a second capacitor;

while the second pin is activated, measuring a time to change the charge of the second capacitor;

after the measuring of the time to change the charge of the second capacitor, deactivating the second pin into a high impedance state;

activating at least a third pin of the microprocessor, wherein the third pin is electrically connected to a third capacitor;

while the third pin is activated, measuring a time to change the charge of the third capacitor;

after the measuring of the time to change the charge of the third capacitor, deactivating the third pin into a high impedance state; and

using at least the time to change the charge of the first capacitor, the time to change the charge of the second capacitor, and the time to change the charge of the third capacitor to calculate the capacitance of the first capacitor;

wherein the step of calculating the capacitance of the first capacitor includes finding the difference between the time to change the charge of the first capacitor and the time to change the charge of the second capacitor, and dividing this quantity by the difference between the time to change the charge of the second capacitor and the time to change the charge of the third capacitor.

26. The method of claim 25 wherein the step of measuring of the time to change the charge of the first capacitor includes detecting when a threshold voltage is reached and measuring the time to reach the threshold voltage.

27. The method of claim 25 wherein the steps of measuring a time to change the charge of the first capacitor, measuring a time to change the charge of the second capacitor, and measuring a time to change the charge of the third capacitor are repeated, in any order, alternating between charging and discharging the first, second, and third capacitors.

28. A method of measuring the capacitance of a first capacitor, the method comprising the steps of:

activating at least a first pin of a microprocessor, wherein the first pin is electrically connected to the first capacitor;

while the first pin is activated, measuring a time to change the charge of the first capacitor;

after the measuring of the time to change the charge of the first capacitor, deactivating the first pin into a high impedance state;

activating at least a second pin of the microprocessor, wherein the second pin is electrically connected to a second capacitor;

while the second pin is activated, measuring a time to change the charge of the second capacitor;

after the measuring of the time to change the charge of the second capacitor, deactivating the second pin into a high impedance state;

activating at least a third pin of the microprocessor, wherein the third pin is electrically connected to a third capacitor;

while the third pin is activated, measuring a time to change the charge of the third capacitor;

after the measuring of the time to change the charge of the third capacitor, deactivating the third pin into a high impedance state; and

using at least the time to change the charge of the first capacitor, the time to change the charge of the second capacitor, and the time to change the charge of the third capacitor to calculate the capacitance of the first capacitor;

wherein the step of calculating the capacitance of the first capacitor comprises using the formula;

Sensor Capacitance=[(TimerS−

Timer1)/(Timer2−

Timer1)](Ref2−

Ref1)+Ref1

wherein;

TimerS is the time to change the charge of the first capacitor,

Timer1 is the time to change the charge of the second capacitor,

Timer2 is the time to change the charge of the third capacitor,

Ref1 is the capacitance of the second capacitor, and

Ref2 is the capacitance of the third capacitor.

29. The method of claim 28 wherein the step of measuring of the time to change the charge of the first capacitor includes detecting when a threshold voltage is reached and measuring the time to reach the threshold voltage.

30. The method of claim 28 wherein the steps of measuring a time to change the charge of the first capacitor, measuring a time to change the charge of the second capacitor, and measuring a time to change the charge of the third capacitor are repeated, in any order, alternating between charging and discharging the first, second, and third capacitors.

31. A method of converting the variable capacitance output of a sensor capacitor into a digital format, the method comprising the steps of:

using a microprocessor, without the use of intermediate switching components, forming a circuit to facilitate changing the charge of the sensor capacitor;

using the microprocessor, without the use of intermediate switching components, changing the charge of the sensor capacitor while measuring the time required to change the charge of the sensor capacitor;

using the microprocessor, without the use of intermediate switching components, reconfiguring the circuit to facilitate changing the charge of a first reference capacitor;

using the microprocessor, without the use of intermediate switching components, changing the charge of the first reference capacitor while measuring the time required to change the charge of the first reference capacitor;

using the microprocessor, without the use of intermediate switching components, reconfiguring the circuit to facilitate changing the charge of a second reference capacitor;

using the microprocessor, without the use of intermediate switching components, changing the charge of the second reference capacitor while measuring the time required to change the charge of the second reference capacitor; and

using the microprocessor and at least the time required to change the charge of the sensor capacitor, the time required to change the charge of the first reference capacitor, and the time required to change the charge of the second reference capacitor to calculate a digital output that is dependent upon the capacitance of the sensor capacitor; and

wherein the step of calculating a digital output comprises using the formula;

Sensor Capacitance=[(TimerS−

Timer1)/(Timer2−

Timer1)](Ref2−

Ref1)+Ref1

wherein;

TimerS is the time to change the charge of the sensor capacitor,

Timer1 is the time to change the charge of the first reference capacitor,

Timer2 is the time to change the charge of the second reference capacitor,

Ref1 is the capacitance of the first reference capacitor, and

Ref2 is the capacitance of the second reference capacitor.

32. The method of claim 31 wherein the steps of changing the charge of the sensor capacitor, changing the charge of the first reference capacitor, and changing the charge of the second reference capacitor are all accomplished by passing current through a common resistor electrically connected to the microprocessor without any intermediate switching components there between.

33. The method of claim 31 wherein the steps of changing the charge of the sensor capacitor, changing the charge of the first reference capacitor, and changing the charge of the second reference capacitor are all accomplished by changing the charge from a common first voltage to a common threshold voltage.

34. The method of claim 31 wherein the changing the charge of the sensor capacitor and the changing the charge of the first reference capacitor are repeated, alternating between changing from a lower potential to a higher potential, and changing from a higher potential to a lower potential.