Memory subsystem voltage control and method that reprograms a preferred operating voltage
First Claim
1. A method for testing an operational range of a memory module, comprising:
- storing a first memory device voltage configuration within a nonvolatile memory on the memory module, the first memory device voltage configuration identifying a first testing voltage of at least one memory device resident on the memory module;
reading the first memory device voltage configuration from the nonvolatile memory;
generating, in response to the first memory device voltage configuration, a power bias to adjust voltage provided to the at least one memory device of the memory module to the first testing voltage; and
reprogramming the nonvolatile memory with a preferred memory device voltage configuration identifying a preferred operating voltage of the at least one memory device.
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Accused Products
Abstract
A method and apparatus for providing a preferred operating voltage to a memory device as specified by a stored configuration parameter. The apparatus includes a nonvolatile memory configured to store a preferred memory device voltage configuration corresponding to a preferred operating voltage of the memory device. The preferred memory device voltage configuration is readable by a host and the circuit is responsive to a command to modify the voltage to the memory device in accordance with the preferred memory device configuration. The voltage to the memory device is modified for improved performance and compatibility of the memory device with a host system.
50 Citations
5 Claims
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1. A method for testing an operational range of a memory module, comprising:
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storing a first memory device voltage configuration within a nonvolatile memory on the memory module, the first memory device voltage configuration identifying a first testing voltage of at least one memory device resident on the memory module; reading the first memory device voltage configuration from the nonvolatile memory; generating, in response to the first memory device voltage configuration, a power bias to adjust voltage provided to the at least one memory device of the memory module to the first testing voltage; and reprogramming the nonvolatile memory with a preferred memory device voltage configuration identifying a preferred operating voltage of the at least one memory device. - View Dependent Claims (2, 3, 4)
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5. A method for testing an operational range of a memory module, comprising:
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storing a first memory device voltage configuration within a nonvolatile memory on the memory module, the first memory device voltage configuration identifying a first testing voltage of at least one memory device resident on the memory module; generating, in response to the first memory device voltage configuration, a power bias to adjust voltage provided to the at least one memory device of the memory module to the first testing voltage; and reprogramming the nonvolatile memory with a preferred memory device voltage configuration identifying a preferred operating voltage of the at least one memory device when the preferred memory device voltage configuration enables preferred performance of the at least one memory device over the first memory device voltage configuration.
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Specification