Rule set for root cause diagnostics

• US 7,623,932 B2
• Filed: 12/20/2005
• Issued: 11/24/2009
• Est. Priority Date: 03/28/1996
• Status: Expired due to Fees

• Current Assignee: Fisher-Rosemount Systems Incorporated (Emerson Electric Company)
• Original Assignee: Fisher-Rosemount Systems Incorporated (Emerson Electric Company)
• Inventors: Miller, John P., Eryurek, Evren
• Primary Examiner(s): Bahta; Kidest
• Application Number:
  US11/312,103
• Publication Number:
  US 20060095394A1
• Time in Patent Office: 1,435 Days
• Field of Search: 700/276, 700108-112, 700/245, 700/21, 700/29, 700/51, 700 32- 33, 700/48, 700/50, 621/72, 702/183, 702/188, 702/140, 702/33, 702/59, 705/1
• US Class Current: 700/29
• CPC Class Codes: G05B 13/0275 using fuzzy logic only
• CPC Class Codes: G05B 21/02 electric
• CPC Class Codes: G05B 23/0213 Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
• CPC Class Codes: G05B 23/0278 Qualitative, e.g. if-then rules; Fuzzy logic; Lookup tables; Symptomatic search; FMEA
• CPC Class Codes: G06N 5/025 Extracting rules from data

Abstract

A reduced rule set for identifying a root cause of an aberration in an industrial process is generated from a complete rule base. The rule base includes plurality of rules for the industrial process, and each rule comprises a condition of at least one process signal of the industrial process and a fault which corresponds to the condition of at least one process signal. Available process signals are identified. Rules are selectively removed from the rule base to produce the reduced rule set.

Claims

1. A method for generating a reduced rule set for identifying a root cause of an aberration in an industrial process for use in an industrial process field device, comprising:

(a) obtaining a rule base comprising a plurality of rules for the industrial process, each rule comprising a condition of at least one process signal of the industrial process and a fault which corresponds to a condition of at least one process signal;

(b) identifying which process signals of the industrial process are available to the field device;

(c) selectively removing a rule from the plurality of rules of the rule base to produce the reduced rule set, wherein the step of selectively removing a rule is based upon the step of identifying which process signals of the industrial are available; and

(d) storing the reduced rule set in a memory of the field device;

(e) performing diagnostics in the field device based upon the reduced rule set and the identification process signals.

2. The method of claim 1 including identifying rules within the reduced rule set having identical process signal conditions.

3. The method of claim 2 including combining rules in the reduced rule set which have identical process signal conditions.

4. The method of claim 3 including creating a new fault for a combined rule.

5. The method of claim 1 wherein the process signals comprise process variables.

6. The method of claim 1 including automating steps (a) through (c).

7. The method of claim 6 and including performing (a) through (c) in a computer.

8. The method of claim 3 including repeating the step of combining until only unique rules are left in the reduced rule set.

9. The method of claim 1 wherein the condition of at least one of the process signals comprises the group of conditions consisting of less than a constant, greater than a constant, trending up, trending down, no change and blank.

10. A computer system configured to implement the method of claim 1.

11. An apparatus for determining a reduced rule set for identifying a root cause of an aberration in an industrial process for use in an industrial process field device, comprising;

means for obtaining a rule base comprising a plurality of rules for the industrial process, each rule comprising a condition of at least one process signal of the industrial process and a fault which corresponds to a condition of at least one process signal;

means for identifying which process signals of the industrial process are available to the field device;

means for selectively removing a rule from the plurality of rules of the rule base to produce the reduced rule set, wherein the step of selectively removing a rule is based upon the step of identifying which process signals of the industrial are available; and

means for storing the reduced rule set in a memory of the field device;

means for performing diagnostics in the field device based upon the reduced rule set and the identification process signals.

12. The apparatus of claim 11 including means for identifying rules within the reduced rule set having identical process signal conditions.

13. The apparatus of claim 12 including means for combining rules in the reduced rule set which have identical process signal conditions.

14. The apparatus of claim 13 including means for creating a new fault for a combined rule.

15. The apparatus of claim 11 wherein the process signals comprise process variables.

16. The apparatus of claim 11 wherein the condition of at least one of the process signals comprises the group of conditions consisting of less than a constant, greater than a constant, trending up, trending down, no change and blank.

17. An industrial process diagnostic apparatus for identifying a root cause of an aberration in an industrial process, comprising:

a rule base comprising a plurality of rules for the industrial process, each rule comprising a condition of at least one process signal of the industrial process and a fault which corresponds to a condition of at least one process signal;

a processor configured to identify which process signals of the industrial process are available and responsively selectively remove a rule from the plurality of rules of the rule base to produce the reduced rule set, based upon the identified process signals.

18. The apparatus of claim 17 wherein the processor is further configured to identify rules within the reduced rule set having identical process signal conditions.

19. The apparatus of claim 18 wherein the process is further configured to combine rules in the reduced rule set which have identical process signal conditions.

20. The apparatus of claim 19 wherein the process is further configured to create a new fault for a combined rule.

21. The apparatus of claim 17 wherein the process signals comprise process variables.

22. The apparatus of claim 17 wherein the condition of at least one of the process signals comprises the group of conditions consisting of less than a constant, greater than a constant, trending up, trending down, no change and blank.