Meter for use in an improved method of reducing interferences in an electrochemical sensor using two different applied potentials

• US 7,655,119 B2
• Filed: 10/29/2004
• Issued: 02/02/2010
• Est. Priority Date: 10/31/2003
• Status: Expired due to Fees

• Current Assignee: Cilag Gmbh International (Johnson & Johnson)
• Original Assignee: LifeScan Scotland Limited (Johnson & Johnson)
• Inventors: Davies, Oliver William Hardwicke
• Primary Examiner(s): Nguyen; Nam X
• Assistant Examiner(s): BALL, JOHN C
• Application Number:
  US10/977,155
• Publication Number:
  US 20050109618A1
• Time in Patent Office: 1,922 Days
• Field of Search: 204/403.14, 205/775, 205/777.5, 205/792
• US Class Current: 204/403.14
• CPC Class Codes: C12Q 1/006 for glucose
• CPC Class Codes: G01N 27/3274 Corrective measures, e.g. error detection, compensation for temperature or hematocrit, calibration coding of calibration information G01N33/48771

Abstract

The present invention is directed to an improved meter that utilizes a method of reducing the effects of interfering compounds in the measurement of analytes and more particularly to a method of reducing the effects of interfering compounds in a system wherein the test strip utilizes two or more working electrodes. In one embodiment of the present invention, a meter is described which applies a first potential to a first working electrode and a second potential, having the same polarity but a greater magnitude than the first potential, is applied to a second working electrode. The meter then measures the generated current and utilizes a predetermined algorithm to correct the measured current to compensate for the presence of interfering compounds in the sample.

Claims

1. A meter for use with a test strip in the detection of analytes, said meter comprising:

a first connector for connecting said meter to a first working electrode on a test strip;

a second connector for connecting said meter to a second working electrode on said test strip;

a common connector for connecting said meter to a reference electrode on said test strip;

a first voltage source connected between said first connector and said common connector; and

a second voltage source connected between said second connector and said common connector;

wherein said first and second voltage sources generate the first potential at said first connector and the second potential at said second connector when said test strip is inserted into said meter and a sample is applied to said test strip, wherein said first and second voltages have the same polarity;

wherein said meter measures a first current value at said first connector and a second current value at said second connector at a predetermined time after said test strip is inserted and sample applied;

wherein the meter is configured to generate a preselected first potential at the first connector using the first voltage source, the first potential sufficient to ensure a magnitude of current at the first working electrode that is diffusion limited and insensitive to applied potential;

wherein the meter is also configured to generate a preselected second potential at the second connector using the second voltage source, the magnitude of the second potential being greater than the magnitude of the first potential; and

wherein the meter is configured to calculate a corrected value of analyte current using the following formula;

$A_1=\frac{W_2-{\mathrm{YW}}_1}{X-Y}$

where;

A₁ is said corrected analyte current;

W₁ is the current at said first connector measured at said predetermined time;

W₂ is the current measured at said second connector at said predetermined time;

X is an analyte dependent voltage effect factor; and

Y is an interfering compound dependent voltage effect factor.