Method and apparatus for quantifying and minimizing skew between signals

• US 7,671,579 B1
• Filed: 09/07/2006
• Issued: 03/02/2010
• Est. Priority Date: 03/09/2006
• Status: Expired due to Fees

• Current Assignee: Altera Corporation (Intel Corporation)
• Original Assignee: Altera Corporation (Intel Corporation)
• Inventors: Boyle, Peter, Chong, Yan, Wright, Adam J., Chang, Eric Choong-Yin, Sung, Chiakang, Huang, Joseph
• Primary Examiner(s): NATALINI, JEFF WILLIAM
• Application Number:
  US11/470,898
• Time in Patent Office: 1,272 Days
• Field of Search: 324/76.54
• US Class Current: 324/76.54
• CPC Class Codes: G01R 31/3016 Delay or race condition test, e.g. race hazard test
• CPC Class Codes: G01R 31/31725 Timing aspects, e.g. clock distribution, skew, propagation delay for tester hardware G01R31/31937
• CPC Class Codes: G01R 31/318516 Test of programmable logic devices [PLDs]
• CPC Class Codes: H03K 5/135 by the use of time reference signals, e.g. clock signals
• CPC Class Codes: H03K 5/14 by the use of delay lines H03K5/133 takes precedence
• CPC Class Codes: H03K 5/1504 using a chain of active delay devices H03K5/15053 takes precedence

Abstract

Delay associated with each of two signals along respective transmission paths is accurately measured using a delay measurement circuit that is fabricated in situ on the actual device where the circuitry for propagating the two signals is fabricated. Thus, the measured delay associated with each of the two signals is subject to the same fabrication-dependent attributes that affect the actual circuitry through which the two signals will be propagated during operation of the device. The skew between the two signals is quantified as the difference in the measured delays. Coarse and fine delay modules are defined within the transmission path of each of the two signals. Based on the measured skew between the two signals, the coarse and fine delay modules are appropriately set to compensate for the skew. The appropriately settings for the coarse and fine delay modules can be stored in non-volatile memory elements.

Claims

1. A signal delay measurement circuit, comprising:

an input register defined to receive a test data signal and output the test data signal in accordance with a test clock signal;

an output register defined to receive a delayed version of the test data signal and output the delayed version of the test data signal in accordance with a delayed version of the test clock signal;

an emulation module connected between the input register and the output register, the emulation module defined to emulate an actual signal transmission path for which signal delay is to be measured, the emulation module defined to introduce signal delay in the test data signal as the test data signal is transmitted from the input register to arrive at the output register as the delayed version of the test data signal; and

a delay chain defined to introduce a controllable amount of signal delay in the test clock signal to generate the delayed version of the test clock signal, wherein a measured delay of the emulated signal path is calculated from the delayed version of the test clock signal when the delayed version of the test data signal is clocked through the output register.

2. A signal delay measurement circuit as recited in claim 1, wherein each of the input and output registers is defined as a flip-flop.

3. A signal delay measurement circuit as recited in claim 1, wherein the actual signal transmission path for which the emulation module is defined is either a data signal path of a memory controller interface or a data strobe signal path of the memory controller interface.

4. A signal delay measurement circuit as recited in claim 1, wherein a total amount of signal delay to be introduced by the delay chain represents a signal delay between arrival of the test clock signal at the input register and arrival of the delayed version of the test clock signal at the output register.

5. A signal delay measurement circuit as recited in claim 1, wherein the delay chain includes a number of serially connected delay elements, an output node of each serially connected delay element connected to a respective input of a multiplexer, the multiplexer defined to pass through one of its inputs as the delayed version of the test clock signal in accordance with a delay select signal.

6. A signal delay measurement circuit as recited in claim 5, wherein the delay select signal is controllable such that the delayed version of the test clock signal can be set to correspond to a signal present at the output node of a particular delay element within the delay chain.

7. A signal delay measurement circuit as recited in claim 5, wherein the serially connected delay elements include a first coarse delay element followed by a number of fine delay elements.

8. A signal delay measurement circuit as recited in claim 1, wherein the signal delay measurement circuit is configured as a fine delay element calibration circuit having the emulation module defined as a coarse delay element and the delay chain defined to include a number of serially connected fine delay elements, an output node of each serially connected fine delay element connected to a respective input of a multiplexer, the multiplexer defined to pass through one of its inputs as the delayed version of the test clock signal in accordance with a delay select signal.

9. A delay element calibration circuit, comprising:

an input register defined to receive a test data signal and output the test data signal in accordance with a test clock signal, wherein a period of the test clock signal is adjustable;

an output register defined to receive a delayed version of the test data signal and output the delayed version of the test data signal in accordance with the test clock signal, the output register is directly coupled to the test clock signal; and

a chain of delay elements connected between an output of the input register and an input of the output register, the chain of delay elements defined to introduce signal delay in the test data signal as the test data signal is transmitted from the input register to arrive at the output register as the delayed version of the test data signal.

10. A delay element calibration circuit as recited in claim 9, wherein each of the input and output registers is defined as a flip-flop.

11. A delay element calibration circuit as recited in claim 9, wherein a total amount of signal delay to be introduced by the chain of delay elements represents a total amount of signal delay from an output port of the input register to an input port of the output register.

12. A delay element calibration circuit as recited in claim 9, wherein the chain of delay elements is defined to provide a total signal delay that is larger than a minimum achievable period of the test clock signal.

13. A delay element calibration circuit as recited in claim 9, wherein the chain of delay elements includes a number of serially connected delay elements, each of the number of serially connected delay elements defined to provide a substantially equivalent amount of signal delay.

14. A delay element calibration circuit as recited in claim 9, further comprising:

a phase lock loop circuit defined to generate the test clock signal, the phase lock loop circuit defined to enable discrete adjustment of the period of the test clock signal.

15. A delay element calibration circuit as recited in claim 9, wherein the period of the test clock signal is adjusted until the delayed version of the test data signal can be clocked into the output register.

16. A delay element calibration circuit as recited in claim 9, wherein a signal delay of each delay element is calculated using a count of delay elements and the period of the test clock signal in which the delayed version of the test data signal can be clocked through the output register.

17. A method of measuring a signal delay, comprising:

receiving a test data signal and a test clock signal at an input register;

emulating a signal delay of an actual signal transmission path to be measured using an emulation module; and

adjusting a signal delay in the test clock signal using a delay chain, wherein the signal delay of the emulated actual signal transmission path is calculated from the signal delay in the test clock signal when the delayed version of the test data signal from the input register is clocked through an output register.

18. The method of measuring a signal delay as recited in claim 17, further comprising:

increasing the signal delay of the test clock signal until the delayed version of the test data signal is clocked through an output register.

19. The method of measuring a signal delay as recited in claim 17, wherein the signal delay of the emulated actual signal path corresponds to the signal delay of either a data signal path or a data strobe signal path resulting in a delayed version of the test data signal.

20. The method of measuring a signal delay as recited in claim 17, further comprising:

transmitting a pair of reset pulses in the test clock signal; and

maintaining a low state on the test data signal, thereby clearing the contents of the input register and the output register.