Increasing readout speed in CMOS APS sensors through block readout

• US 7,671,914 B2
• Filed: 11/08/2004
• Issued: 03/02/2010
• Est. Priority Date: 03/23/1998
• Status: Expired due to Fees

• Current Assignee: Round Rock Research LLC
• Original Assignee: Micron Technology, Inc.
• Inventors: Ang, Lin-Ping
• Primary Examiner(s): Ometz; David L
• Assistant Examiner(s): Spinks; Antoinette T
• Application Number:
  US10/983,083
• Publication Number:
  US 20050151058A1
• Time in Patent Office: 1,940 Days
• Field of Search: 348/308
• US Class Current: 348/308
• CPC Class Codes: H04N 25/70 SSIS architectures; Circuits associated therewith
• CPC Class Codes: H04N 25/75 Circuitry for providing, modifying or processing image signals from the pixel array

Abstract

A method and associated architecture for dividing column readout circuitry in an active pixel sensor in a manner which reduces the parasitic capacitance on the readout line. In a preferred implementation, column readout circuits are grouped in blocks and provided with block signaling. Accordingly, only column output circuits in a selected block significantly impart a parasitic capacitance effect on shared column readout lines. Block signaling allows increasing pixel readout rate while maintaining a constant frame rate for utility in large format high-speed imaging applications.

Claims

1. A CMOS active-pixel image sensor, comprising:

a pixel array arranged in rows and columns comprising a plurality of pixels having photosensors and in-pixel buffer transistors;

column output circuits for reading out signals corresponding to pixel values sampled from a selected row of pixels in the array, the column output circuits organized in a plurality of blocks, wherein all of the column output circuits in each of the blocks are connected to a respective one of a plurality of block output lines, and each of the blocks comprises a same number of greater than two column output circuits; and

greater than two block select switches, each of the block select switches connected between a respective one of the block output lines and a master output bus and configured to actively couple a single one of the block output lines to the master output bus at a time.

2. The CMOS active-pixel image sensor of claim 1, wherein the block select switches are configured to be activated successively and the column output circuits within each of the blocks are configured to be activated successively.

3. The CMOS active-pixel image sensor of claim 1, wherein each of the column output circuits is configured to provide at least two respective signals corresponding to a respective pixel value sampled from the selected row of pixels in the array.

4. The CMOS active-pixel image sensor of claim 3, wherein each of the column output circuits comprises at least two respective storage circuits configured to store the at least two respective signals corresponding to the respective pixel value during a same period of time.

5. The CMOS active-pixel image sensor of claim 4, wherein the at least two respective signals corresponding to the respective pixel value are generated at two different times during a single readout of the selected row.

6. The CMOS active-pixel image sensor of claim 5, wherein a difference between the two respective signals corresponding to the respective pixel value indicates the respective pixel value sampled from the selected row of pixels in the array.

7. The CMOS active-pixel image sensor of claim 1, wherein all of the column output circuits in each of the blocks are connected to a respective one of a plurality of second block output lines, and further comprising second block select switches, each of the second block select switches connected between a respective one of the second block output lines and the master output bus and configured to actively couple a single one of the second block output lines to the master output bus at a time.

8. A method of reading out pixel signals from a CMOS pixel array having pixels arranged in rows and columns, the method comprising:

activating a first block switch connecting a master output bus to a first plurality of greater than two output circuits respectively connected to a first plurality of the columns;

reading out pixel signals one-at-a-time from the first plurality of output circuits via the master output bus;

deactivating the first block switch;

activating a second block switch connecting the master output bus to a second plurality of greater than two output circuits respectively connected to a second plurality of the columns;

reading out pixel signals one-at-a-time from the second plurality of output circuits via the master output bus while the first block switch remains deactivated;

deactivating the second block switch;

activating a third block switch connecting the master output bus to a third plurality of greater than two output circuits respectively connected to a third plurality of the columns; and

reading out pixel signals one-at-a-time from the third plurality of output circuits via the master output bus while the first and second block switches remain deactivated.

9. The method of claim 8, wherein reading out pixel signals comprises reading out each of at least two separate signals corresponding to a single respective pixel signal.

10. The method of claim 9, wherein reading out the each of the at least two separate signals is done via two separate lines of the master output bus.

11. The method of claim 9, wherein at least one of the two separate signals is an analog value.

12. A CMOS device, comprising:

an array of pixels comprising column output lines, each of the column output lines coupled to at least one respective column of pixels of the array;

column output circuits configured to provide a first set of signals associated with at least a first row of pixels of the array, each of the column output circuits coupled to at least a respective one of the column output lines;

an array readout bus; and

at least eight block select switches connected to the array readout bus, each of the block select switches connected to a respective one of a plurality of groups of the column output circuits and configured to provide the first set of signals to the array readout bus, wherein the block select switches are configured to allow only a single one of the plurality of groups of column output circuits to provide signals to the array readout bus at a time.

13. The device of claim 12, wherein the column output circuits are further configured to provide a second set of signals associated with the at least first row of pixels of the array, and further comprising second block select switches, each of the second block select switches connected to a respective one of the plurality of groups of the column output circuits and configured to provide the second set of signals to the array readout bus.

14. The device of claim 13, wherein the array readout bus comprises a first array readout line connected to the block select switches and a second array readout line connected to the second block select switches.

15. The device of claim 13, wherein the second block select switches are configured to allow only a single one of the plurality of groups of column output circuits to provide signals to the array readout bus at a time.

16. The device of claim 15, wherein the block select switches and the second block select switches are configured to allow the same one of the plurality of groups of column output circuits to provide signals to the array readout bus during the same time.

17. The device of claim 13, wherein the first set of signals and the second set of signals are stored in the column output circuits during a same period of time.

18. The device of claim 13, wherein each signal of the first set of signals together with a respective signal of the second set of signals correspond to a respective pixel value of a respective pixel of the at least first row of pixels of the array.

19. The device of claim 13, wherein each one of the plurality of groups of the column output circuits comprises more than two of the column output circuits.

20. The device of claim 12, further comprising first column output buffers to provide the first set of signals, wherein each of the column output circuits comprises a respective one of the first column output buffers, and the first column output buffers comprise transistors having gate electrodes coupled to receive the first set of signals and source/drain electrodes coupled to provide the first set of signals.

21. The device of claim 12, wherein the block select switches comprise transistors having first source/drain electrodes coupled to receive the first set of signals from the column output circuits and second source/drain electrodes coupled to provide the first set of signals to the array readout bus.

22. The device of claim 12, wherein the block select switches are configured to be activated successively.

23. The device of claim 12, wherein each of the column output circuits is configured to produce at least two respective signals to indicate a respective amount of charge collected by a respective pixel in the at least first row of pixels of the array during a readout of the at least first row of pixels.

24. The device of claim 23, wherein the at least two respective signals are provided to the array readout bus during the same period of time.

25. The device of claim 24, wherein the two respective signals indicate the respective amount of charge in the respective pixel in the at least first row of pixels of the array at two different times during a single sampling of the at least first row of pixels.

26. The device of claim 23, wherein the at least two respective signals are stored in each of the column output circuits during a same period of time.

27. The device of claim 23, wherein each one of the plurality of groups of the column output circuits comprises the same number of more than two of the column output circuits.

28. The device of claim 12, wherein each one of the plurality of groups of the column output circuits comprises the same number of more than two of the column output circuits.

29. A method of reading a row of pixels in a frame readout of a pixel array, comprising:

activating a first group of block select switches to enable first column output signals in a first circuit block to be driven to an array readout bus, wherein the first column output signals in the first circuit block correspond to a first pixel of a first block of pixels in the row;

activating a second group of block select switches to enable first column output signals and second column output signals in a second circuit block to be driven to the array readout bus, wherein the first column output signals and the second column output signals in the second circuit block correspond to first and second pixels, respectively, of a second block of pixels in the row, and the first pixel of the second block of pixels is adjacent to the first pixel of the first block of pixels; and

activating a third group of block select switches to enable first column output signals in a third circuit block to be driven to the array readout bus, wherein the first column output signals in the third circuit block correspond to a first pixel of a third block of pixels in the row, and the first pixel of the third block of pixels is adjacent to the second pixel of the second block of pixels;

wherein the first, second, and third blocks of pixels each contain the same number of pixels, and only one of the first, second, and third groups of block select switches are activated at a time.

30. The method of claim 29, wherein the first, second, and third block select switches are activated successively.

31. The method of claim 29, further comprising generating the first column output signals in the first circuit block at different times during the frame readout.

32. The method of claim 29, further comprising storing the first column output signals in the first circuit block during a same period of time during the frame readout.

33. The method of claim 29, further comprising driving the first column output signals in the first circuit block to the array readout bus during a first same time period, and driving second column output signals in the first circuit block to the array readout bus during a second same time period, wherein a length of the first and second time periods are different, and the second column output signals in the first circuit block correspond to a second pixel of the first block of pixels in the row.

34. The method of claim 33, further comprising driving third column output signals in the first circuit block to the array readout bus during a third same time period, wherein a length of the first, second, and third time periods are different, and the third column output signals in the first circuit block correspond to a third pixel of the first block of pixels in the row.

35. The method of claim 29, wherein the first column output signals comprise two signals.

36. The method of claim 35, further comprising determining a difference between the first column output signals.

37. The method of claim 29, wherein activating the first block select switches comprises turning on at least two MOS transistors, each configured to receive a respective one of the first column output signals in the first circuit block at a respective first source/drain electrode and to provide the respective one of the first column output signals to the array readout bus from a respective second source/drain electrode.