Arrangement for temperature monitoring and regulation

• US 7,674,038 B2
• Filed: 10/24/2001
• Issued: 03/09/2010
• Est. Priority Date: 12/29/2000
• Status: Expired due to Fees

• Current Assignee: Tesat Spacecom GmbH & Company KG (Airbus SE)
• Original Assignee: Tesat Spacecom GmbH & Company KG (Airbus SE)
• Inventors: Heine, Frank, Smutny, Berry, Bartelt-Berger, Lars
• Primary Examiner(s): VERBITSKY, GAIL KAPLAN
• Application Number:
  US10/220,387
• Publication Number:
  US 20030152130A1
• Time in Patent Office: 3,058 Days
• Field of Search: 374/1, 374/208, 374/164, 374/163, 374183-185, 374/100, 374/103, 374 29- 39, 374117-119, 374/135, 338/22.R, 338/28, 338/308, 338/5, 338 7- 10, 338279-280, 338/283, 338/287, 219/539, 219/542, 219/548, 219/552, 219/201, 219/200, 219546-547, 219/536, 219/535
• US Class Current: 374/141
• CPC Class Codes: G05D 23/1919 characterised by the type of controller
• CPC Class Codes: G05D 23/24 the sensing element having a resistance varying with temperature, e.g. a thermistor
• CPC Class Codes: H01L 21/67248 Temperature monitoring

Abstract

To measure and regulate temperature, a temperature measuring resistor and a control element are accommodated in one layer as metallization on a substrate. The printed or otherwise manufactured conductors of the temperature measuring resistor and of the control element are arranged in close proximity to one another.

Claims

1. A method of using a system for measuring and regulating temperature, the system including a substrate, a temperature measuring resistor including conductors, and a control element including conductors, the temperature measuring resistor and the control element being applied to the substrate to be in a single layer, and the conductors of the temperature measuring resistor and the conductors of the control element running next to one another in a side by side manner, along a substantial entirety of the lengths of the conductors of the temperature measuring resistor and the control element, the method comprising:

placing the system proximate to one of an optical resonator and an electrical resonator to utilize the system to perform a temperature regulation of the one of the optical resonator and the electrical resonator.

2. The method as recited in claim 1, wherein:

the single layer is applied as a metal plating.

3. A system for measuring and regulating temperature, comprising:

a substrate;

a temperature measuring resistor including conductors;

a control element including conductors, the temperature measuring resistor and the control element being applied to the substrate to be in a single layer, wherein the conductors of the temperature measuring resistor and the conductors of the control element run next to one another in a side by side manner, along a substantial entirety of the lengths of the conductors of the temperature measuring resistor and the control element;

an insulating layer covering the conductors of the temperature measuring resistor and the conductors of the control element; and

a component, whose temperature is to be measured and regulated, directly mounted on the insulating layer at a side of the insulating layer facing away from the substrate, wherein the component includes one of an optical resonator and an electrical resonator.

4. A system for measuring temperature and regulating temperature based on the measurements, comprising:

a substrate;

a temperature measuring resistor including conductors; and

a control element resistor including conductors, the temperature measuring resistor and the control element resistor being applied to the substrate to be in a single layer, wherein;

the conductors of the temperature measuring resistor and the conductors of the control element resistor run next to one another in a side by side manner, along a substantial entirety of the lengths of the conductors of the temperature measuring resistor and the control element resistor,

the temperature measuring resistor is configured to output a measurement of a temperature of the control element resistor,

the system is configured to regulate the temperature of the control element resistor based on the measurement,

the temperature measuring resistor and the control element resistor differ from each other only (a) in their respective positions on the substrate, (b) in that at least one of a current and a voltage is selectively applied to the control element resistor without application to the temperature measuring resistor, and (c) in that different resistances are used for the temperature measuring resistor and the control element resistor, a material of the temperature measuring resistor and a material of the control element resistor being the same.

5. The system as recited in claim 4, wherein a resistance of 10 to 100Ω

is used for the control element and a resistance of 1000Ω

is used for the temperature measuring resistor.