×

Method of manufacture for microelectromechanical devices

  • US 7,704,772 B2
  • Filed: 11/14/2008
  • Issued: 04/27/2010
  • Est. Priority Date: 05/04/2004
  • Status: Active Grant
First Claim
Patent Images

1. A method of manufacturing an electromechanical device, the method comprising:

  • forming a first conductive layer;

    forming an isolation layer on the first conductive layer;

    forming a second conductive layer on the isolation layer such that the isolation layer is disposed between the first conductive layer and the second conductive layer, wherein the second conductive layer is configured to allow portions of the second conductive layer to deflect towards the first conductive layer and contact the first conductive layer after the isolation layer is removed;

    prior to etching the isolation layer, electrically coupling the first conductive layer to the second conductive layer;

    after the first conductive layer to the second conductive layer are electrically coupled, etching the isolation layer to form a gap between the first and second conductive layers; and

    electrically decoupling the first conductive layer from the second conductive layer after removing the isolation layer.

View all claims
  • 4 Assignments
Timeline View
Assignment View
    ×
    ×