×

Dynamic test pattern composition for image-analysis based automatic machine diagnostics

  • US 7,773,774 B2
  • Filed: 06/28/2004
  • Issued: 08/10/2010
  • Est. Priority Date: 06/28/2004
  • Status: Expired due to Fees
First Claim
Patent Images

1. A method for dynamic test pattern generation, for use with a document processing system, including:

  • automatically selecting a set of test targets, from memory in the document processing system, as a function of the probability of possible defects and machine performance data and to maximize an optimization criteria, wherein automatically selecting a text test target is a constrained optimization process and where the optimization criteria is to maximize the discriminating power between the defects detectable by the test targets; and

    placing the set of test targets on a digital test pattern.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×