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Apparatus, system, and method for detecting temperature threshold events in an aftertreatment device

  • US 7,815,370 B2
  • Filed: 10/11/2007
  • Issued: 10/19/2010
  • Est. Priority Date: 10/11/2007
  • Status: Active Grant
First Claim
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1. An apparatus for detecting temperature threshold events in an aftertreatment device, the apparatus comprising:

  • at least one temperature responder disposed within a region of interest of the aftertreatment device, the temperature responder comprising a structure formed of a material configured to melt at a threshold temperature; and

    an observation module configured to detect the melting of the temperature responder;

    wherein the region of interest is defined within an emissions-reducing core of the aftertreatment device.

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