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Substrates, systems and methods for analyzing materials

  • US 7,838,847 B2
  • Filed: 10/31/2007
  • Issued: 11/23/2010
  • Est. Priority Date: 09/01/2006
  • Status: Active Grant
First Claim
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1. A system for analyzing an analyte, comprising:

  • a substrate comprising a first surface and at least a first optical waveguide disposed upon the first surface;

    at least a first light source optically coupled to the at least first waveguide to direct light into the first waveguide; and

    an optical detection system positioned to receive and detect an optical signal from an individual analyte disposed sufficiently proximal to the first surface and external to the waveguide to be illuminated by an evanescent field emanating from the waveguide when light from the light source is passed through the waveguide, wherein the individual analyte is immobilized on the first surface such that a signal from the individual analyte is optically resolvable from any other signal from any other analyte immobilized on the first surface and illuminated by the evanescent field.

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